scholarly journals Customer Journey Clue-based Service Failure Prevention

2019 ◽  
Vol 25 (25) ◽  
pp. 21-34
Author(s):  
Ruth April A. Labajan ◽  
Pisut Koomsap
Keyword(s):  
Failure Analysis ◽  
Service Failure ◽  
Customer Journey ◽  
Service Employees ◽  
Failure Prevention ◽  
Service Failures ◽  
Customer Perspective ◽  
The Voice ◽  
Voice Of Customers

Abstract Customers and their perception towards service are considered as a determinant of service failure, and so, service failure and its prevention must be looked into from the perspective of the customers. This paper presents a customer-centric service failure prevention framework, which aims to provide a holistic way of service failure prevention by integrating service delivery assessment and failure analysis from a customer perspective, encompassing failure identification, assessment and prioritization of failures as a basis for corrective actions. Customer journey, service clues, and customer oriented-FMEA are employed to develop the proposed framework. The approach was applied to an enrolment process showing that using customer journey assists in determining customer processes, needs, wants and touch points in the service, and when used together with service clues further facilitates systematic and effective unveiling of potential failures that are important to customers. Assessment of failures and its prioritization with customer perspective leads to better prioritization that is reflective of the voice of customers. The case study shows that higher risk is imposed by actions emanating from the employees, reinforcing further that service failures not only concern functionality of the service but equally important also are the encounter of customers with service employees and the environment.

Developing House of Quality by integrating top roof and side roof matrices and service TRIZ with a case study in banking services

2016 ◽  
Vol 28 (4) ◽  
pp. 597-612 ◽  
Author(s):  
Arash Shahin ◽  
Elham Bagheri Iraj ◽  
Hossein Vaez Shahrestani
Keyword(s):  
House Of Quality ◽  
Customer Requirements ◽  
Correlation Matrices ◽  
Banking Services ◽  
New Approach ◽  
Content Type ◽  
Innovative Solution ◽  
The Voice ◽  
Voice Of Customers

Purpose – The purpose of this paper is to propose an innovative solution for prioritizing “Whats” and “Hows” and resolving contradictions among “Whats” in House of Quality (HoQ). Design/methodology/approach – Prioritization of the influence of the weights in correlation matrices of “Whats” and “Hows” (i.e. top roof and side roof) of HoQ and integration with TRIZ contradiction matrix have been studied. Explained through a case example of banking services, initially, contradictions among requirements of 180 customers have been identified by side roof matrix and then, the 12 by 12 non-technical contradictions matrix of service TRIZ have been used to suggest principles for resolving contradictions. Findings – Findings imply that the use of roof and side roof weights can influence the priorities of “Whats” and “Hows.” Research limitations/implications – Findings may assist researchers and practitioners in resolving ambiguity of the voice of customers, which in turn make the results of HoQ more accurate. Originality/value – A new approach has been proposed in this paper for resolving contradictions of customer requirements by service TRIZ and adjusting priorities of “Whats” and “Hows” in HoQ.

Exploring service failure in a business-to-business context

2015 ◽  
Vol 29 (5) ◽  
pp. 367-379 ◽  
Author(s):  
Xia Zhu ◽  
Judy Zolkiewski
Keyword(s):  
Case Studies ◽  
Manufacturing Sector ◽  
Service Failure ◽  
Negative Influence ◽  
Careful Consideration ◽  
Business Service ◽  
Content Type ◽  
Service Failures ◽  
Business To Business

Purpose – This study aims to explore how business-to-business service failures manifest in a manufacturing context. Design/methodology/approach – The empirical research involved two case studies: case study one included 20 interviews in the metal finishing industry; case study two included 20 interviews in the paint and coatings industry. In both case studies, suppliers and customers’ perceptions were obtained to facilitate a dyadic understanding of the phenomena. Findings – Business-to-business service failure is a complex, dynamic and interactive process. It varies according to type of service, services supporting the products and services supporting the customers, service quality dimensions and the source of the failure. It can have a more profound impact than service failure in a consumer context because it may cause disruption to customers’ production and have a negative influence of failure on their clients in the network. Research limitations/implications – Business customers may play a role in value co-destruction rather than value co-creation by causing service failures due to errors on their part. The consequences of the domino effects revealed in this study need to be given careful consideration by managers. The research is exploratory, and the findings may be influenced by the manufacturing sector in which the case study firms are based. Originality/value – Business-to-business service failure has its own distinct characteristics, as it may impact widely in the business-to-business network. Domino effects implicitly dominate business-to-business service failure episodes where negative outcomes cascade downstream and affect service recipients’ customers.

Beyond the Embodied Digital Service Encounter

2018 ◽  
pp. 1-18
Author(s):  
Jannick Kirk Sørensen
Keyword(s):  
Human Service ◽  
Service Failure ◽  
Digital Design ◽  
Service Encounter ◽  
Service Encounters ◽  
Digital Service ◽  
Service Failures ◽  
Knowledge Intensive ◽  
Micro Analysis

When a digital service encounter develops differently than anticipated, the client becomes a user. This transformation reveals the ambiguous nature of digital service encounter being neither well-functioning tools, nor having the same sensitivity to and tolerance for service failures as in human service encounters. Through the case-study of a service failure and subsequent co-creation of the service recovery, this chapter introduces and unfolds the concept of ‘cognitively dominated service encounters'. This category is suggested to supplement and criticize Paul Dourish's (2001) concept of Embodied Interaction. With a micro analysis of the interaction in this service journey, we identify the need for a category of knowledge intensive service encounters that acknowledge both the complexity of the service provided, but also the constraints and possibilities in the digital design material.

Possessing the Iconic Book

2012 ◽  
Vol 6 (1-3) ◽  
pp. 309-329
Author(s):  
Claudia V. Camp
Keyword(s):  
Second Century ◽  
Religious Literature ◽  
Ben Sira ◽  
The Core ◽  
The Bible ◽  
Iconic Status ◽  
The Voice ◽  
Woman Wisdom ◽  
Martin Marty

I propose that the notion of possession adds an important ideological nuance to the analyses of iconic books set forth by Martin Marty (1980) and, more recently, by James Watts (2006). Using the early second century BCE book of Sirach as a case study, I tease out some of the symbolic dynamics through which the Bible achieved iconic status in the first place, that is, the conditions in which significance was attached to its material, finite shape. For Ben Sira, this symbolism was deeply tied to his honor-shame ethos in which women posed a threat to the honor of his eternal name, a threat resolved through his possession of Torah figured as the Woman Wisdom. What my analysis suggests is that the conflicted perceptions of gender in Ben Sira’s text is fundamental to his appropriation of, and attempt to produce, authoritative religious literature, and thus essential for understanding his relationship to this emerging canon. Torah, conceived as female, was the core of this canon, but Ben Sira adds his own literary production to this female “body” (or feminized corpus, if you will), becoming the voice of both through the experience of perfect possession.

Failure Analysis Case Study of a 1.5 Meter Space Flex Harness

2017 ◽  
Author(s):  
Erick Kim ◽  
Kamjou Mansour ◽  
Gil Garteiz ◽  
Javeck Verdugo ◽  
Ryan Ross ◽  
...  
Keyword(s):  
Failure Analysis ◽  
Failure Modes ◽  
Field Of View ◽  
Area Of Interest ◽  
Air Stream ◽  
Novel Method ◽  
Temperature Controlled ◽  
Non Destructive ◽  
Failure Site

Abstract This paper presents the failure analysis on a 1.5m flex harness for a space flight instrument that exhibited two failure modes: global isolation resistances between all adjacent traces measured tens of milliohm and lower resistance on the order of 1 kiloohm was observed on several pins. It shows a novel method using a temperature controlled air stream while monitoring isolation resistance to identify a general area of interest of a low isolation resistance failure. The paper explains how isolation resistance measurements were taken and details the steps taken in both destructive and non-destructive analyses. In theory, infrared hotspot could have been completed along the length of the flex harness to locate the failure site. However, with a field of view of approximately 5 x 5 cm, this technique would have been time prohibitive.

Failure Analysis of CDM-ESD Damage in a GaAs RFIC

2000 ◽  
Author(s):  
Amy Poe ◽  
Steve Brockett ◽  
Tony Rubalcava
Keyword(s):  
Radio Frequency ◽  
Failure Analysis ◽  
Integrated Circuit ◽  
Production Test ◽  
Analysis Techniques ◽  
Device Model ◽  
Charged Device ◽  
Subsequent Failure

Abstract The intent of this work is to demonstrate the importance of charged device model (CDM) ESD testing and characterization by presenting a case study of a situation in which CDM testing proved invaluable in establishing the reliability of a GaAs radio frequency integrated circuit (RFIC). The problem originated when a sample of passing devices was retested to the final production test. Nine of the 200 sampled devices failed the retest, thus placing the reliability of all of the devices in question. The subsequent failure analysis indicated that the devices failed due to a short on one of two capacitors, bringing into question the reliability of the dielectric. Previous ESD characterization of the part had shown that a certain resistor was likely to fail at thresholds well below the level at which any capacitors were damaged. This paper will discuss the failure analysis techniques which were used and the testing performed to verify the failures were actually due to ESD, and not caused by weak capacitors.

Advanced IR-OBIRCH Analysis Technique for High Isb Failure Analysis

2010 ◽  
Author(s):  
Kuo Hsiung Chen ◽  
Wen Sheng Wu ◽  
Yu Hsiang Shu ◽  
Jian Chan Lin
Keyword(s):  
Failure Analysis ◽  
Failure Mechanisms ◽  
Fault Localization ◽  
Resistance Change ◽  
The Real ◽  
Analysis Techniques ◽  
Analysis Technique ◽  
Leakage Failure ◽  
Failure Site

Abstract IR-OBIRCH (Infrared Ray – Optical Beam Induced Resistance Change) is one of the main failure analysis techniques [1] [2] [3] [4]. It is a useful tool to do fault localization on leakage failure cases such as poor Via or contact connection, FEoL or BEoL pattern bridge, and etc. But the real failure sites associated with the above failure mechanisms are not always found at the OBIRCH spot locations. Sometimes the real failure site is far away from the OBIRCH spot and it will result in inconclusive PFA Analysis. Finding the real failure site is what matters the most for fault localization detection. In this paper, we will introduce one case using deep sub-micron process generation which suffers serious high Isb current at wafer donut region. In this case study a BEoL Via poor connection is found far away from the OBIRCH spots. This implies that layout tracing skill and relation investigation among OBIRCH spots are needed for successful failure analysis.

The Electrical Characterization and Physical Failure Analysis for Transistor Gate Leakage

2006 ◽  
Author(s):  
Tsung-Te Li ◽  
Chao-Chi Wu ◽  
Jung-Hsiang Chuang ◽  
Jon C. Lee
Keyword(s):  
Failure Analysis ◽  
Electrical Characterization ◽  
Physical Analysis ◽  
Gate Leakage ◽  
Force Microscopy ◽  
Atomic Force ◽  
Transmission Electron ◽  
Voltage Stress ◽  
Leakage Site

Abstract This article describes the electrical and physical analysis of gate leakage in nanometer transistors using conducting atomic force microscopy (C-AFM), nano-probing, transmission electron microscopy (TEM), and chemical decoration on simulated overstressed devices. A failure analysis case study involving a soft single bit failure is detailed. Following the nano-probing analysis, TEM cross sectioning of this failing device was performed. A voltage bias was applied to exaggerate the gate leakage site. Following this deliberate voltage overstress, a solution of boiling 10%wt KOH was used to etch decorate the gate leakage site followed by SEM inspection. Different transistor leakage behaviors can be identified with nano-probing measurements and then compared with simulation data for increased confidence in the failure analysis result. Nano-probing can be used to apply voltage stress on a transistor or a leakage path to worsen the weak point and then observe the leakage site easier.

Case Study in Fault Isolation of a Metal Short for Yield Enhancement

2010 ◽  
Author(s):  
Sarven Ipek ◽  
David Grosjean
Keyword(s):  
Failure Analysis ◽  
Failure Mechanism ◽  
Photon Emission ◽  
Fault Isolation ◽  
Yield Enhancement ◽  
Analysis Technique ◽  
Laser Signal ◽  
Signal Injection ◽  
Microscopy Techniques

Abstract The application of an individual failure analysis technique rarely provides the failure mechanism. More typically, the results of numerous techniques need to be combined and considered to locate and verify the correct failure mechanism. This paper describes a particular case in which different microscopy techniques (photon emission, laser signal injection, and current imaging) gave clues to the problem, which then needed to be combined with manual probing and a thorough understanding of the circuit to locate the defect. By combining probing of that circuit block with the mapping and emission results, the authors were able to understand the photon emission spots and the laser signal injection microscopy (LSIM) signatures to be effects of the defect. It also helped them narrow down the search for the defect so that LSIM on a small part of the circuit could lead to the actual defect.

Die-Level Scanning Capacitance Microscopy Fault Isolation on SOI Fin-FET Devices for Advanced Semiconductor Nodes

2018 ◽  
Author(s):  
Lucile C. Teague Sheridan ◽  
Tanya Schaeffer ◽  
Yuting Wei ◽  
Satish Kodali ◽  
Chong Khiam Oh
Keyword(s):  
Atomic Force Microscopy ◽  
Failure Analysis ◽  
Fault Isolation ◽  
Scanning Capacitance Microscopy ◽  
Force Microscopy ◽  
Atomic Force

Abstract It is widely acknowledged that Atomic force microscopy (AFM) methods such as conductive probe AFM (CAFM) and Scanning Capacitance Microscopy (SCM) are valuable tools for semiconductor failure analysis. One of the main advantages of these techniques is the ability to provide localized, die-level fault isolation over an area of several microns much faster than conventional nanoprobing methods. SCM, has advantages over CAFM in that it is not limited to bulk technologies and can be utilized for fault isolation on SOI-based technologies. Herein, we present a case-study of SCM die-level fault isolation on SOI-based FinFET technology at the 14nm node.

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