Device for Characterization of the Diffraction Pattern of Computer-Generated Holograms in a Wide Angular Range

2018 ◽  
Vol 54 (2) ◽  
pp. 139-145 ◽  
Author(s):  
D. A. Belousov ◽  
A. G. Poleshchuk ◽  
V. N. Khomutov
Keyword(s):  
Diffraction Pattern ◽  
Angular Range ◽  
Computer Generated Holograms

scholarly journals High-resolution characterization of the forbidden Si 200 and Si 222 reflections

2015 ◽  
Vol 48 (2) ◽  
pp. 528-532 ◽  
Author(s):  
Peter Zaumseil
Keyword(s):  
High Resolution ◽  
Angular Range ◽  
Angular Divergence ◽  
X Ray Diffraction ◽  
Multiple Diffraction ◽  
Diffraction Plane ◽  
X Ray ◽  
Sample Orientation ◽  
Plane Sample

The occurrence of the basis-forbidden Si 200 and Si 222 reflections in specular X-ray diffraction ω–2Θ scans is investigated in detail as a function of the in-plane sample orientation Φ. This is done for two different diffractometer types with low and high angular divergence perpendicular to the diffraction plane. It is shown that the reflections appear for well defined conditions as a result of multiple diffraction, and not only do the obtained peaks vary in intensity but additional features like shoulders or even subpeaks may occur within a 2Θ range of about ±2.5°. This has important consequences for the detection and verification of layer peaks in the corresponding angular range.

Characterization of chitin preparations using powder and film X-ray diffraction methods

2013 ◽  
Vol 28 (1) ◽  
pp. 44-48 ◽  
Author(s):  
Jeffrey R. Deschamps
Keyword(s):  
Diffraction Pattern ◽  
Purification Procedure ◽  
Limited Extent ◽  
X Ray Diffraction ◽  
X Ray ◽  
Naturally Occurring ◽  
Natural Polysaccharide ◽  
Different Sources

Chitin is a natural polysaccharide found in many diverse phyla and almost always occurs in association with protein. In this study the chitin polymer is characterized by X-ray diffraction from its naturally occurring unprocessed state through various steps used in the purification procedure. In addition, the effect of different treatments on the final product is examined. These studies show that native chitin has a characteristic diffraction pattern that is not altered by the mild treatments used to isolate relatively pure chitin. Chitins prepared from different sources exhibit the same characteristic diffraction pattern. In addition, chitin films prepared using non-degrading solvents retain most of the characteristic patterns. De-acylation of chitin to produce chitosan results in large changes to the diffraction pattern. To a very limited extent features present in the diffraction pattern of native chitin can be recovered by re-acylation of chitosan.

Automation in electron diffraction analysis

1995 ◽  
Vol 53 ◽  
pp. 170-171
Author(s):  
J. M. Zuo
Keyword(s):  
Electron Diffraction ◽  
Diffraction Analysis ◽  
Diffraction Pattern ◽  
Ccd Camera ◽  
Lattice Parameter ◽  
Electron Diffraction Analysis ◽  
Full Automation ◽  
Imaging Plates ◽  
Complex Crystal

Automated lattice parameter measurement and orientation analysis are often needed in the characterization of microstructures using electron diffraction, and is made possible with increasingly popular use of slow scan CCD camera and imaging plates. Both of these two detectors are largely linear and digital. Typical electron diffraction analysis has three steps: 1) diffraction pattern measurement, 2) diffraction pattern indexing and 3) solution. Full automation in all these three steps is desired, however, may be hard to achieve especially for complex crystal structures. The importance of automation in each of these steps depends on the type of analysis and the number of analysis needed. Full automation is necessary in the type of applications where the same analysis is repeated many times, such as in texture analysis. In table 1, various applications of electron diffraction and automation needed are listed.There are two types of approach to the automatic indexing. The commonly used method is to matching a calculated list of g's with the measured ones.

Characterization of Mycelium-Like Material Formed During Drying of Salt Stock Prunes

1994 ◽  
Vol 57 (9) ◽  
pp. 817-819
Author(s):  
ROBIN Y.-Y. CHIOU ◽  
WEN-CHING TZENG ◽  
KUO-FONG HUANG
Keyword(s):  
Organic Matter ◽  
Sodium Chloride ◽  
Citric Acid ◽  
Diffraction Analysis ◽  
Diffraction Pattern ◽  
X Ray Diffraction ◽  
X Ray

Material with the appearance of mold mycelium was formed on salt stock prunes during drying. The moisture-free mycelium-like material consisted of 98.5 to 98.7% sodium chloride (NaCl), 1.67% organic matter and 0.165% acidity expressed as citric acid. X-ray diffraction analysis of the material revealed a diffraction pattern similar to that of NaCl. Formation of the material was dependent upon the efficiency and extent of drying. However, the material was not observed on deskinned salt stock prunes subjected to drying.

Optical characterization of Erioglaucine using z-scan technique, beam radius variations and diffraction pattern in far-field

2009 ◽  
Vol 9 (5) ◽  
pp. 885-889 ◽  
Author(s):  
M.H. Majles Ara ◽  
S. Salmani ◽  
M. Esmaeilzadeh ◽  
S.H. Mousavi ◽  
E. Koushki ◽  
...  
Keyword(s):  
Diffraction Pattern ◽  
Optical Characterization ◽  
Beam Radius ◽  
Far Field

Structural Characterization of Nickel(II) Tetraphenylporphyrin

1996 ◽  
Vol 49 (12) ◽  
pp. 1273 ◽  
Author(s):  
AL Maclean ◽  
GJ Foran ◽  
BJ Kennedy ◽  
P Turner ◽  
TW Hambley
Keyword(s):  
Synchrotron Radiation ◽  
Single Crystal ◽  
Bond Length ◽  
Diffraction Pattern ◽  
Structural Characterization ◽  
X Ray Diffraction ◽  
X Ray ◽  
Bond Lengths ◽  
Single Crystal Analysis

The structure of 5,10,15,20-tetraphenylporphinatonickel(II) ([Ni( tpp )]) has been studied by both X-ray diffraction (powder and single-crystal methods) and EXAFS. The bond lengths obtained from analysis of the EXAFS agree, within standard deviations, with those obtained from the X-ray diffraction studies. The Ni-N bond length of 1.93(1) Ǻ agrees especially well with the value of 1.931(2) Ǻ obtained from the single-crystal analysis. The powder X-ray diffraction pattern, collected by using synchrotron radiation, is presented.

Sign in / Sign up

Export Citation Format

Share Document