Diagnostic Fault Simulation for the Failure Analyst

Author(s):  
Dan Bodoh ◽  
Anthony Blakely ◽  
Terry Garyet

Abstract Since failure analysis (FA) tools originated in the design-for-test (DFT) realm, most have abstractions that reflect a designer's viewpoint. These abstractions prevent easy application of diagnosis results in the physical world of the FA lab. This article presents a fault diagnosis system, DFS/FA, which bridges the DFT and FA worlds. First, it describes the motivation for building DFS/FA and how it is an improvement over off-the-shelf tools and explains the DFS/FA building blocks on which the diagnosis tool depends. The article then discusses the diagnosis algorithm in detail and provides an overview of some of the supporting tools that make DFS/FA a complete solution for FA. It also presents a FA example where DFS/FA has been applied. The example demonstrates how the consideration of physical proximity improves the accuracy without sacrificing precision.

2018 ◽  
Vol 2018 ◽  
pp. 1-10 ◽  
Author(s):  
YanZhu Hu ◽  
Yu Hu ◽  
XinBo Ai ◽  
HuiYang Zhao ◽  
Zhen Meng ◽  
...  

The performance evaluation of fault diagnosis algorithm is an indispensable link in the development and acceptance of the fault diagnosis system. Aiming at the stability evaluation of the fault diagnosis model based on the characteristic clustering, an image edge detection method based on the Elliptic Fourier Descriptor (EFDSE) is proposed to evaluate the stability of the fault diagnosis model, which applies similarity measurement of image to effective evaluation of faulty diagnosis algorithm. The quantitative evaluation index of the diagnostic capability of characterization based cluster fault diagnosis model is used to provide reference for the acceptance and reliability of the diagnosis results. Finally, the effectiveness of the stability evaluation is verified by the fault data of the motor bearings.


2012 ◽  
Vol 232 ◽  
pp. 305-309
Author(s):  
Yan Jun Li ◽  
Xiao Hui Peng ◽  
Yu Qiang Cheng ◽  
Jian Jun Wu

The applications of healthy monitoring and fault diagnosis's system can enhance the reliability and safety of the whole vehicle, which has significance to detect and isolate fault as early as possible and that tragedy can be avoided. In this paper, pipeline fault simulation analysis and fault diagnosis for LRE is studied as direct-inverse problem. Firstly, the failure model was constituted for pipeline to analysis the necessary condition for fault isolation. Then the conclusion that strategy of fault diagnosis was build by analysis the simulation result based on AMESim. Finally, the fault diagnosis algorithm was validated by test data. The results indicate that the fault diagnosis algorithm can detect fault exactly and effectively. There are no false alarm to normal test data and no false alarm to other components fault. Consequently the fault isolation result could be reached.


2014 ◽  
Vol 971-973 ◽  
pp. 1296-1299
Author(s):  
Li Xia Gong ◽  
Jin Chen ◽  
Chang Mou Tang ◽  
Li Kou ◽  
Yi Long Wei

In order to diagnosis the fault in a a comprehensive, real-time and simple way, a multi-input predictive fault diagnosis system was promoted based on acceleration mainly include the sensor, Signal processing,display and stepper motors.Sensor was used to acquisition the inputs such as grain loss, clogging and engine vibration.Then,the inputs was processed by the fault diagnosis algorithm promoted in this thesis to obtain diagnostic results and display the rusults in button display module. When a fault occured, stepper motor would start to work controled by a control signal to minimized the failure harm.Furtherly,the effectiveness was improved by an example. The experimental results show that the prediction method can achieve the predictive fault diagnosis and effectively simplify the computational complexity with good practicality and reality.


Author(s):  
Alan Kennen ◽  
John F. Guravage ◽  
Lauren Foster ◽  
John Kornblum

Abstract Rapidly changing technology highlights the necessity of developing new failure analysis methodologies. This paper will discuss the combination of two techniques, Design for Test (DFT) and Focused Ion Beam (FIB) analysis, as a means for successfully isolating and identifying a series of high impedance failure sites in a 0.35 μm CMOS design. Although DFT was designed for production testing, the failure mechanism discussed in this paper may not have been isolated without this technique. The device of interest is a mixed signal integrated circuit that provides a digital up-convert function and quadrature modulation. The majority of the circuit functions are digital and as such the majority of the die area is digital. For this analysis, Built In Self Test (BIST) circuitry, an evaluation board for bench testing and FIB techniques were used to successfully identify an unusual failure mechanism. Samples were subjected to Highly Accelerated Stress Test (HAST) as part of the device qualification effort. Post-HAST electrical testing at 200MHz indicated that two units were non-functional. Several different functional blocks on the chip failed electrical testing. One part of the circuitry that failed was the serial interface. The failure analysis team decided to look at the serial interface failure mode first because of the simplicity of the test. After thorough analysis the FA team discovered increasing the data setup time at the serial port input allowed the device to work properly. SEM and FIB techniques were performed which identified a high impedance connection between a metal layer and the underlying via layer. The circuit was modified using a FIB edit, after which all vectors were read back correctly, without the additional set-up time.


2009 ◽  
Vol 20 (9) ◽  
pp. 2520-2530
Author(s):  
Ling-Wei CHU ◽  
Shi-Hong ZOU ◽  
Shi-Duan CHENG ◽  
Chun-Qi TIAN ◽  
Wen-Dong WANG

2020 ◽  
Vol 14 (16) ◽  
pp. 2310-2318
Author(s):  
Ziyun Wang ◽  
Guixiang Xu ◽  
Yan Wang ◽  
Ju H. Park ◽  
Zhicheng Ji

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