Successful failure analysis using fault diagnosis tool and product characterization board in BiCMOS technology low yield investigation

Author(s):  
Renee Liu ◽  
Aaron Chin ◽  
Seah Pei Hong ◽  
Lee Wenfeng
Author(s):  
Dan Bodoh ◽  
Anthony Blakely ◽  
Terry Garyet

Abstract Since failure analysis (FA) tools originated in the design-for-test (DFT) realm, most have abstractions that reflect a designer's viewpoint. These abstractions prevent easy application of diagnosis results in the physical world of the FA lab. This article presents a fault diagnosis system, DFS/FA, which bridges the DFT and FA worlds. First, it describes the motivation for building DFS/FA and how it is an improvement over off-the-shelf tools and explains the DFS/FA building blocks on which the diagnosis tool depends. The article then discusses the diagnosis algorithm in detail and provides an overview of some of the supporting tools that make DFS/FA a complete solution for FA. It also presents a FA example where DFS/FA has been applied. The example demonstrates how the consideration of physical proximity improves the accuracy without sacrificing precision.


2012 ◽  
Vol 152-154 ◽  
pp. 1601-1606 ◽  
Author(s):  
Yan Su

For the shortcomings of existing SDG modeling methods in fault diagnosis, a data-driven semi-quantitative SDG automatic graphical modeling approach and a direct manual SDG graphical modeling approach are investigated. Function failure analysis procedures and data modeling process based on system principle are introduced in detail, and relevant graphical modeling tool are developed. A fault diagnosis modeling for the air supply system of certain type of aircraft is taken as an illustration to verify the validity of proposed modeling method.


2012 ◽  
Vol 22 ◽  
pp. 203-211 ◽  
Author(s):  
Haitao Wang ◽  
Youming Chen ◽  
Cary W.H. Chan ◽  
Jianying Qin

2014 ◽  
Vol 1049-1050 ◽  
pp. 871-874
Author(s):  
Ya Wei Pan ◽  
Quan Yu Yu ◽  
Fei Wang

The paper analyzes a variety of reasons differential fault automobile differential and establishes the corresponding fault tree by using Fault Tree Analysis of reliability theory. The failure spectrum of automobile differential is constructed through qualitative analysis of the fault tree. Meanwhile the study gives the theoretical methods about the solving of top event’s probability and bottom event’s importance for design, fault diagnosis and repair of automobile differential.


2001 ◽  
Vol 18 (1) ◽  
pp. 19-30 ◽  
Author(s):  
S. Venkataraman ◽  
S.B. Drummonds

Author(s):  
Kevin Gearhardt ◽  
Chris Schuermyer ◽  
Ruifeng Guo

Abstract This paper presents an iterative diagnosis test generation framework to improve logic fault diagnosis resolution. Industrial examples are presented in this paper on how additional targeted pattern generation can be used to improve defect localization before physical failure analysis of a die. This enables failure analysts to be more effective by reducing the dependence on the more expensive physical fault isolation techniques.


Author(s):  
Srikanth Venkataraman ◽  
Scott B. Drummonds

Abstract Logic fault diagnosis or fault isolation is the process of analyzing failing random logic portions of a chip to isolate the cause of failure. Fault diagnosis or fault isolation (FI) plays an important role in multiple applications at different stages of design and manufacturing. Most currently deployed FI techniques for random logic fault isolation include physical techniques with limited automated diagnosis followed by e-beam and/or laser voltage probing (LVP) on packaged parts. This paper will present the methodology and FI results obtained by executing automated scan based diagnosis on a chipset product (440BX). The logic diagnosis techniques used are presented along with simulation and Failure Analysis (FA) results


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