Low Voltage, Low Current AFP Characterization of Non-Visible Soft Transistor Defects

Author(s):  
Randal Mulder ◽  
Sam Subramanian ◽  
Tony Chrastecky

Abstract This paper presents case studies that examine low voltage, low current electrical characterization and analysis of data that could help identify root cause failure mechanisms for soft transistor failures, providing a review of Vt shifts and blocked LDD implants review. The case studies demonstrate the importance of getting the most information possible out of all aspects of the nanoprobe electrical characterization results for failing transistors. Technology computer aided design (TCAD) modeling of transistor defects will be a useful tool for the nanoprobe analyst to identify the subtle defects that can only be identified through careful electrical characterization in conjunction with process analysis and experiments by the manufacturing facility. However, modeling at the transistor level has its difficulties. The key will be to build a library of electrical signatures with corresponding defects as they are discovered.

Author(s):  
Randal Mulder ◽  
Sam Subramanian ◽  
Tony Chrastecky

Abstract The use of atomic force probe (AFP) analysis in the analysis of semiconductor devices is expanding from its initial purpose of solely characterizing CMOS transistors at the contact level with a parametric analyzer. Other uses found for the AFP include the full electrical characterization of failing SRAM bit cells, current contrast imaging of SOI transistors, measuring surface roughness, the probing of metallization layers to measure leakages, and use with other tools, such as light emission, to quickly localize and identify defects in logic circuits. This paper presents several case studies in regards to these activities and their results. These case studies demonstrate the versatility of the AFP. The needs and demands of the failure analysis environment have quickly expanded its use. These expanded capabilities make the AFP more valuable for the failure analysis community.


Author(s):  
Hui Peng Ng ◽  
Ghim Boon Ang ◽  
Chang Qing Chen ◽  
Alfred Quah ◽  
Angela Teo ◽  
...  

Abstract With the evolution of advanced process technology, failure analysis is becoming much more challenging and difficult particularly with an increase in more erratic defect types arising from non-visual failure mechanisms. Conventional FA techniques work well in failure analysis on defectively related issue. However, for soft defect localization such as S/D leakage or short due to design related, it may not be simple to identify it. AFP and its applications have been successfully engaged to overcome such shortcoming, In this paper, two case studies on systematic issues due to soft failures were discussed to illustrate the AFP critical role in current failure analysis field on these areas. In other words, these two case studies will demonstrate how Atomic Force Probing combined with Scanning Capacitance Microscopy were used to characterize failing transistors in non-volatile memory, identify possible failure mechanisms and enable device/ process engineers to make adjustment on process based on the electrical characterization result. [1]


Author(s):  
Vlatko Stoilkov ◽  
Milan Čundev ◽  
Lidija Petkovska ◽  
Krste Najdenkoski

Author(s):  
Sean Peel ◽  
Satyajeet Bhatia ◽  
Dominic Eggbeer ◽  
Daniel S Morris ◽  
Caroline Hayhurst

Previously published evidence has established major clinical benefits from using computer-aided design, computer-aided manufacturing, and additive manufacturing to produce patient-specific devices. These include cutting guides, drilling guides, positioning guides, and implants. However, custom devices produced using these methods are still not in routine use, particularly by the UK National Health Service. Oft-cited reasons for this slow uptake include the following: a higher up-front cost than conventionally fabricated devices, material-choice uncertainty, and a lack of long-term follow-up due to their relatively recent introduction. This article identifies a further gap in current knowledge – that of design rules, or key specification considerations for complex computer-aided design/computer-aided manufacturing/additive manufacturing devices. This research begins to address the gap by combining a detailed review of the literature with first-hand experience of interdisciplinary collaboration on five craniofacial patient case studies. In each patient case, bony lesions in the orbito-temporal region were segmented, excised, and reconstructed in the virtual environment. Three cases translated these digital plans into theatre via polymer surgical guides. Four cases utilised additive manufacturing to fabricate titanium implants. One implant was machined from polyether ether ketone. From the literature, articles with relevant abstracts were analysed to extract design considerations. In all, 19 frequently recurring design considerations were extracted from previous publications. Nine new design considerations were extracted from the case studies – on the basis of subjective clinical evaluation. These were synthesised to produce a design considerations framework to assist clinicians with prescribing and design engineers with modelling. Promising avenues for further research are proposed.


Symmetry ◽  
2018 ◽  
Vol 10 (8) ◽  
pp. 306 ◽  
Author(s):  
Francisco Cavas-Martínez ◽  
Daniel Fernández-Pacheco ◽  
Francisco Cañavate ◽  
Jose Velázquez-Blázquez ◽  
Jose Bolarín ◽  
...  

The validation of new methods for the diagnosis of incipient cases of Keratoconus (KC) with mild visual limitation is of great interest in the field of ophthalmology. During the asymmetric progression of the disease, the current diagnostic indexes do not record the geometric decompensation of the corneal curvature nor the variation of the spatial profile that occurs in singular points of the cornea. The purpose of this work is to determine the structural characterization of the asymmetry of the disease by using morpho-geometric parameters in KC eyes with mild visual limitation including using an analysis of a patient-specific virtual model with the aid of computer-aided design (CAD) tools. This comparative study included 80 eyes of patients classified as mild KC according to the degree of visual limitation and a control group of 122 eyes of normal patients. The metric with the highest area under the receiver operating characteristic (ROC) curve was the posterior apex deviation. The most prominent correlation was found between the anterior and posterior deviations of the thinnest point for the mild keratoconic cases. This new custom computational approach provides the clinician with a three-dimensional view of the corneal architecture when the visual loss starts to impair.


1998 ◽  
Vol 120 (09) ◽  
pp. 70-72
Author(s):  
Michael Henry

Walter Lorenz Surgical Inc., Jacksonville, FL, specializes in the medical devices known as rigid fixation implants. Lorenz Surgical was purchased by Biomet Inc. of Warsaw, Indiana in the year 1992, which resulted in Lorenzo owning two computer-aided design (CAD) systems. In 1996, with the completion of Lorenz Surgical's new manufacturing facility in Jacksonville, all Lorenz operations were transferred back to Florida, including all the manufacturing equipment and its three seats of Unigraphics, which by then were running on Windows NT workstations. The company's management feels it could have stayed with Unigraphics and accomplished its goals, but that adding Solid Edge was a good move. It gave Lorenz flexibility in hiring, allowed it to buy more CAD seats than it could have if it had stayed with Unigraphics alone, and provided a very productive tool. Lorenz's surgical instruments are currently designed exclusively in Solid Edge. Instruments can be modeled in either CAD system, but the job goes faster in Solid Edge. The creators of Solid Edge put a lot of effort into usability, and this shows in how few mouse clicks are needed for common operations. Products that have many standard features, such as a screwdriver consisting of m any cylinders, are very quickly modeled in Solid Edge.


Sign in / Sign up

Export Citation Format

Share Document