Comparative Failure Analysis of Photovoltaic Devices

2009 ◽  
Author(s):  
Jim Colvin
Keyword(s):  
Solar Cells ◽  
Failure Analysis ◽  
Light Beam ◽  
Thermal Imaging ◽  
Induced Current ◽  
Photovoltaic Devices ◽  
Thermal Methods ◽  
Current Voltage ◽  
Glass Panels

Abstract Photovoltaic devices (PV) or more commonly “solar cells” are analyzed using LBIC/LBIV (Light Beam Induced Current/Voltage) PL (Photoluminescence) and EL (Electroluminescence) as well as INSB thermal Methods. This paper will show the advantages and pitfalls of the techniques as well as a novel way to perform EL imaging without a dark box and thermal imaging through glass panels.

An applied light-beam induced current study of dye-sensitised solar cells: Photocurrent uniformity mapping and true photoactive area evaluation

2014 ◽  
Vol 116 (4) ◽  
pp. 043104 ◽  
Author(s):  
Timothy W. Jones ◽  
Krishna Feron ◽  
Kenrick F. Anderson ◽  
Benjamin C. Duck ◽  
Gregory J. Wilson
Keyword(s):  
Solar Cells ◽  
Light Beam ◽  
Induced Current

scholarly journals Ionic polarization-induced current–voltage hysteresis in CH3NH3PbX3 perovskite solar cells

2016 ◽  
Vol 7 (1) ◽  
Author(s):  
Simone Meloni ◽  
Thomas Moehl ◽  
Wolfgang Tress ◽  
Marius Franckevičius ◽  
Michael Saliba ◽  
...  
Keyword(s):  
Solar Cells ◽  
Perovskite Solar Cells ◽  
Induced Current ◽  
Current Voltage ◽  
Voltage Hysteresis ◽  
Ionic Polarization

High-resolution x-ray and light beam induced current (LBIC) measurements of multcrystalline silicon solar cells

2010 ◽  
Author(s):  
G. E. Jellison ◽  
J. D. Budai ◽  
C. J. C. Bennett ◽  
J. Z. Tischler ◽  
C. E. Duty ◽  
...  
Keyword(s):  
Solar Cells ◽  
High Resolution ◽  
Light Beam ◽  
Silicon Solar Cells ◽  
Induced Current ◽  
X Ray

High saturation solar light beam induced current scanning of solar cells

2007 ◽  
Vol 78 (1) ◽  
pp. 013904 ◽  
Author(s):  
F. J. Vorster ◽  
E. E. van Dyk
Keyword(s):  
Solar Cells ◽  
Light Beam ◽  
Solar Light ◽  
Induced Current ◽  
High Saturation

Challenges for Parametric Analysis of the Solar Cells Using Failure Analysis Technique Developed for the Microelectronics

2012 ◽  
Author(s):  
M. Boostandoost ◽  
X. Ycaza ◽  
R. Leihkauf ◽  
U. Kerst ◽  
C. Boit
Keyword(s):  
Solar Cells ◽  
Data Processing ◽  
Failure Analysis ◽  
Photon Emission ◽  
Research Capacity ◽  
Operating Regime ◽  
Laser Wavelength ◽  
Infrared Light ◽  
Analysis Tool ◽  
Induced Current

Abstract In this study, the challenges to transfer the microelectronics failure analysis techniques to the photovoltaic industry have been discussed. The main focus of this study was the PHEMOS as a tool with strong technological research capacity developed for microelectronics failure analysis, and OBIC (Optical Beam Induced Current) as a non-destructive technique for detecting and localizing various defects in semiconductor devices. This failure analysis tool was a high resolution optical infrared photon emission microscope used mainly in microelectronics for qualitative analysis and localization of semiconductor defects. Such failure analysis equipment was designed to meet requirements for modern microelectronic devices. Characterization of current photovoltaic device often requires quantitative analysis and should provide information about the electrical and material properties of the solar cell. Therefore, in addition to the demand for further data processing of the obtained results we had to study the corresponding operating regime of solar cells to allow for a correct interpretation of measurement results. In this paper, some of the related problems we faced during this study, e.g. large amount of data processing, the spatial misalignment of the images obtained as EL (Electroluminescence) and IR-LBIC (Infrared Light Beam Induced Current), the implemented laser wavelength, its profile and power density for IR-LBIC measurement. These topics have been discussed in detailed to facilitate a reliable transfer of these techniques from microelectronics to the photovoltaic world.

Analysis of Surface Passivation and Laser Firing on Thin-Film Silicon Solar Cells Via Light-Beam Induced Current

2020 ◽  
Vol 10 (5) ◽  
pp. 1246-1253 ◽  
Author(s):  
Siddhartha Garud ◽  
Matevz Bokalic ◽  
Cham thi Trinh ◽  
Bernd Rech ◽  
Daniel Amkreutz ◽  
...  
Keyword(s):  
Thin Film ◽  
Solar Cells ◽  
Light Beam ◽  
Surface Passivation ◽  
Silicon Solar Cells ◽  
Induced Current ◽  
Thin Film Silicon ◽  
Laser Firing

scholarly journals The interface degradation of planar organic–inorganic perovskite solar cell traced by light beam induced current (LBIC)

RSC Advances ◽  
2017 ◽  
Vol 7 (68) ◽  
pp. 42973-42978 ◽  
Author(s):  
Yanqing Yao ◽  
Gang Wang ◽  
Fei Wu ◽  
Debei Liu ◽  
Chunyan Lin ◽  
...  
Keyword(s):  
Solar Cells ◽  
Solar Cell ◽  
Light Beam ◽  
Perovskite Solar Cells ◽  
Perovskite Solar Cell ◽  
Induced Current ◽  
Inorganic Hybrid ◽  
Inorganic Perovskite ◽  
Hybrid Perovskite

The light beam induced current (LBIC) method was adopted to nondestructively map the photoresponse of real planar organic–inorganic hybrid perovskite solar cells (PSCs).

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