scholarly journals Oxygen Hole Character and Lateral Homogeneity in PrNiO2+δ Thin Films

2022 ◽  
Vol 9 ◽  
Author(s):  
K. Fürsich ◽  
R. Pons ◽  
M. Bluschke ◽  
R. A. Ortiz ◽  
S. Wintz ◽  
...  

Using x-ray absorption spectroscopy with lateral resolution from the submillimeter to submicrometer range, we investigate the homogeneity, the chemical composition, and the nickel 3d- oxygen 2p charge transfer in topotactically reduced epitaxial PrNiO2+δ thin films. To this end, we use x-ray absorption spectroscopy in a standard experimental setup and in a soft x-ray microscope to probe the element and spatially resolved electronic structure modifications through changes of the nickel-2p and oxygen-1s absorption spectrum upon soft-chemistry reduction. We find that the reduction process is laterally homogeneous across a partially reduced PrNiO2+δ thin film sample for length scales down to 50 nm.

2014 ◽  
Vol 104 (24) ◽  
pp. 242113 ◽  
Author(s):  
Sin Cheng Siah ◽  
Sang Woon Lee ◽  
Yun Seog Lee ◽  
Jaeyeong Heo ◽  
Tomohiro Shibata ◽  
...  

2015 ◽  
Vol 119 (8) ◽  
pp. 4362-4370 ◽  
Author(s):  
D. Carta ◽  
G. Mountjoy ◽  
A. Regoutz ◽  
A. Khiat ◽  
A. Serb ◽  
...  

2021 ◽  
Vol 28 (6) ◽  
Author(s):  
Noritake Isomura ◽  
Keiichiro Oh-ishi ◽  
Naoko Takahashi ◽  
Satoru Kosaka

Thin films formed on surfaces have a large impact on the properties of materials and devices. In this study, a method is proposed using X-ray absorption spectroscopy to derive the film thickness of a thin film formed on a substrate using the spectral separation and logarithmic equation, which is a modified version of the formula used in electron spectroscopy. In the equation, the decay length in X-ray absorption spectroscopy is longer than in electron spectroscopy due to a cascade of inelastic scattering of electrons generated in a solid. The modification factor, representing a multiple of the decay length, was experimentally determined using oxidized Si and Cu with films of thickness 19 nm and 39 nm, respectively. The validity of the proposed method was verified, and the results indicated that the method can be used in the analysis of various materials with thin films.


1999 ◽  
Vol 353 (1-2) ◽  
pp. 113-123 ◽  
Author(s):  
V.M. Jiménez ◽  
J.P. Espinós ◽  
A. Caballero ◽  
L. Contreras ◽  
A. Fernández ◽  
...  

Sign in / Sign up

Export Citation Format

Share Document