scholarly journals Hexagonal Boron Nitride Passivation Layer for Improving the Performance and Reliability of InGaN/GaN Light-Emitting Diodes

2021 ◽  
Vol 11 (19) ◽  
pp. 9321
Author(s):  
Gun Hee Lee ◽  
Tran Viet Cuong ◽  
Dong Kyu Yeo ◽  
Hyunjin Cho ◽  
Beo Deul Ryu ◽  
...  

We introduce a low temperature process for coating InGaN/GaN light-emitting diodes (LEDs) with h-BN as a passivation layer. The effect of h-BN on device performance and reliability is investigated. At −5 V, the leakage current of the h-BN passivated LED was -1.15 x 10−9 A, which was one order lower than the reference LED’s leakage current of −1.09 × 10−8 A. The h-BN layer minimizes the leakage current characteristics and operating temperature by acting as a passivation and heat dispersion layer. With a reduced working temperature of 33 from 45 °C, the LED lifetime was extended 2.5 times following h-BN passivation. According to our findings, h-BN passivation significantly improves LED reliability.

Nanomaterials ◽  
2018 ◽  
Vol 8 (7) ◽  
pp. 543 ◽  
Author(s):  
Moonsang Lee ◽  
Hyunkyu Lee ◽  
Keun Song ◽  
Jaekyun Kim

We report forward tunneling characteristics of InGaN/GaN blue light emitting diodes (LEDs) on freestanding GaN detached from a Si substrate using temperature-dependent current–voltage (T-I-V) measurements. T-I-V analysis revealed that the conduction mechanism of InGaN/GaN LEDs using the homoepitaxial substrate can be distinguished by tunneling, diffusion and recombination current, and series resistance regimes. Their improved crystal quality, inherited from the nature of homoepitaxy, resulted in suppression of forward leakage current. It was also found that the tunneling via heavy holes in InGaN/GaN LEDs using the homoepitaxial substrate can be the main transport mechanism under low forward bias, consequentially leading to the improved forward leakage current characteristics.


AIP Advances ◽  
2015 ◽  
Vol 5 (8) ◽  
pp. 087151 ◽  
Author(s):  
Ting Zhi ◽  
Tao Tao ◽  
Bin Liu ◽  
Yi Li ◽  
Zhe Zhuang ◽  
...  

2015 ◽  
Vol 62 (10) ◽  
pp. 3322-3325 ◽  
Author(s):  
Eunjin Jung ◽  
June Key Lee ◽  
Min Soo Kim ◽  
Hyunsoo Kim

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