scholarly journals Reliability of NAND Flash Memories: Planar Cells and Emerging Issues in 3D Devices

Computers ◽  
2017 ◽  
Vol 6 (2) ◽  
pp. 16 ◽  
Author(s):  
Alessandro Spinelli ◽  
Christian Compagnoni ◽  
Andrea Lacaita
Keyword(s):  
Nand Flash ◽  
Flash Memories ◽  
Planar Cells ◽  
Emerging Issues

A Heavy-ion Beam Monitor Based on 3D NAND Flash Memories

2021 ◽  
pp. 1-1
Author(s):  
S. Gerardin ◽  
M. Bagatin ◽  
A. Paccagnella ◽  
S. Beltrami ◽  
A. Costantino ◽  
...  
Keyword(s):  
Ion Beam ◽  
Heavy Ion ◽  
Nand Flash ◽  
Flash Memories ◽  
Beam Monitor ◽  
Heavy Ion Beam

Improving Read Disturb Characteristics by Self-Boosting Read Scheme for Multilevel NAND Flash Memories

2009 ◽  
Vol 48 (4) ◽  
pp. 04C062 ◽  
Author(s):  
Myounggon Kang ◽  
Ki-Tae Park ◽  
Youngsun Song ◽  
Soonwook Hwang ◽  
Byung Yong Choi ◽  
...  
Keyword(s):  
Nand Flash ◽  
Flash Memories

Triple-Level-Cell/Single-Level-Cell Mix-Mode Operation Induced Data Retention Degradation in 3-D NAND Flash Memories

2021 ◽  
pp. 1-1
Author(s):  
Yu-Heng Liu ◽  
Yu-Siang Yang ◽  
Chih-Yuan Tseng ◽  
Wei Lin ◽  
An-Chang Liu ◽  
...  
Keyword(s):  
Nand Flash ◽  
Data Retention ◽  
Flash Memories ◽  
Single Level ◽  
Mode Operation

Total Ionizing Dose Effects in 3-D NAND Flash Memories

2019 ◽  
Vol 66 (1) ◽  
pp. 48-53 ◽  
Author(s):  
Marta Bagatin ◽  
Simone Gerardin ◽  
Alessandro Paccagnella ◽  
Silvia Beltrami ◽  
Alessandra Costantino ◽  
...  
Keyword(s):  
Nand Flash ◽  
Total Ionizing Dose ◽  
Flash Memories ◽  
Dose Effects ◽  
Total Ionizing Dose Effects

Investigation of the programming accuracy of a double-verify ISPP algorithm for nanoscale NAND Flash memories

2011 ◽  
Author(s):  
Carmine Miccoli ◽  
Christian Monzio Compagnoni ◽  
Alessandro S. Spinelli ◽  
Andrea L. Lacaita
Keyword(s):  
Nand Flash ◽  
Flash Memories
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