scholarly journals Titanium Corrosion in Peri-Implantitis

Materials ◽  
2020 ◽  
Vol 13 (23) ◽  
pp. 5488
Author(s):  
Mailis D. Soler ◽  
Shu-Min Hsu ◽  
Chaker Fares ◽  
Fan Ren ◽  
Renita J. Jenkins ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Region Of Interest ◽  
Weight Percent ◽  
Sem Analysis ◽  
True Rate ◽  
X Ray ◽  
Ti Particles ◽  
Surface Morphologies ◽  
Scanning Electron

Titanium (Ti) corrodes clinically in the presence of bacteria. We investigated this phenomenon as a function of Ti particles found in biopsied tissues around peri-implantitis sites and surface roughness of failed Ti implants. Tissue biopsies were surgically collected from peri-implantitis sites, processed, and embedded in resin. The resin-embedded samples were hand trimmed to the region of interest and semi-thick (500 nm) sections were collected onto coverslips. One section was toluidine blue post-stained as a reference. The remainder sections were left unstained for energy-dispersive X-ray spectroscopy (EDX) analysis. Processed samples were examined under scanning electron microscopy (SEM) and EDX. Corresponding failed implants were also removed and examined under SEM and EDX. Five out of eight biopsied samples demonstrated the presence of Ti particles in the soft tissue, suggesting the true rate among all failures was between 24.5% and 91.5% (the lower bound of a 95% confidence interval for the true rate of Ti presence). SEM analysis of failed implant bodies also indicated changes in surface morphology and appeared less detailed with decreased weight percent of Ti on the surface of the failed implants. In conclusion, Ti particles were noted in 5/8 biopsied samples. Surface morphologies were smoother in failed implants compared with the reference implant.

scholarly journals VARIASI KONSENTRASI ION Ni2+ TERHADAP DISPERSI Si3N4 PADA LAPISAN NANOKOMPOSIT Ni-SILIKON NITRIT

2016 ◽  
Vol 11 (1) ◽  
Author(s):  
Ridwan Ridwan
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Energy Dispersive ◽  
Dispersed Phase ◽  
X Ray ◽  
Nano Silicon ◽  
Surface Morphologies ◽  
Scanning Electron

Pelapisan nanokomposit Ni/Si3N4 pada substrat Cu telah dilakukan dengan proses elektroplating pada berbagai konsentrasi ion Ni2+ pada 0,26; 0,56; 0,86; 1,16; dan 1,46 M. Nano silicon nitrit dicampur pada larutan sebagai dispersed phase. Pengaruh konsentrasi ion Ni2+ dalam larutan plating dikaji terhadap dispersi partikel pada lapisan nanokomposit Nikel-Silikon Nitrit. Untuk mengetahui struktur, sifat-sifat fisik dan kimia dari bahan sintesis, beberapa prosedur karakterisasi telah dilakukan. Dari hasil analisis komposisi lapisan nanokomposit menggunakan energy dispersive X-ray analysis (EDX), diperoleh penurunan konsentrasi ion Ni2+ pada elektrolit menyebabkan peningkatan kandungan Si pada lapisan nanokomposit Ni/S3N4 dari 0,62 at.% menjadi 3,01 at.%. Sedangkan dari Scanning Electron Microscopy (SEM) surface morphologies lapisan nanokomposit Ni/Si3N4 terlihat struktur dari lapisan nano komposit compact (padat) dan ukuran butir semakin kecil dengan penurunan konsentrasi ion Ni2+. Secara umum dispersi dari partikel penguat Si pada lapisan nanokomposit Ni/Si3N4 merata pada permukaan lapisan. semakin kecil konsentrasi ion Ni2+ dalam larutan plating semakin tinggi efisiensinya.Kata kunci: Elektroplating, Nanokristal, Nanokomposit, Ni, Si3N4

Study on the Surface Morphologies of Nickel-Phosphorus Ultra-Black Films

2014 ◽  
Vol 924 ◽  
pp. 166-169 ◽  
Author(s):  
Pan Pan Yue ◽  
Yong Zhong Jin ◽  
Xu Dong Hu ◽  
Hong Yang Yan ◽  
Guo Qing Zeng
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Phase Composition ◽  
Chemical Etching ◽  
Etching Time ◽  
X Ray Diffraction ◽  
X Ray ◽  
Black Films ◽  
Surface Morphologies ◽  
Scanning Electron

Ni-P ultra-black films having conical pores with the diameter of ~ 10-30 μm and the depth of ~ 15-30 μm were prepared by chemical etching of electroless plated Ni-P films using 8 mol/L nitric acid at 40 °C for 60 s. The phase composition and microstructure of the film samples were investigated by X-ray diffraction (XRD) and scanning electron microscopy (SEM), respectively. The results show that the diameter and depth of the etching pores become larger and the flat top regions bounded by etching pores become smaller by the coalescence of adjacent pores with the increase of etching time. The surface morphologies of the etched Ni-P films are characterized by the distribution of conical pores.

Direct Electrochemical Reduction of Solid TiO2 in [BMIM]BF4-CaCl2 Ionic Liquid

2014 ◽  
Vol 492 ◽  
pp. 248-252
Author(s):  
Jie Chen Mu ◽  
Xu Dong Zhang ◽  
Li Peng Zhang
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Ionic Liquid ◽  
Electrochemical Reduction ◽  
X Ray ◽  
Solid Titanium ◽  
Electrolysis Potential ◽  
Surface Morphologies ◽  
Graphite Rod ◽  
Scanning Electron

The direct electrochemical reduction of solid titanium dioxide (TiO2) is conducted in [BMIM]BF4-CaCl2 ionic liquid (IL) at 100 °C using sintered TiO2 as cathode and graphite rod as anode at an electrolysis potential of 3.2 V. Cyclic voltammetry is used to investigate the mechanism and feasibility of the direct electrochemical reduction of solid TiO2 in [BMIM]BF4-CaCl2 IL at 100 °C. The surface morphologies of the cathode are examined by scanning electron microscopy（SEM）. The crystal phase structure of the cathode is examined using a D8 Advance X-ray diffractometer(XRD). The results indicate that the direct electrochemical reduction of solid TiO2 in [BMIM]BF4-CaCl2 IL is feasible. A significant increase in conductivity is obtained by doping graphite into the cathode, thereby enhancing deoxidation. TiO2 reduction is conducted step by step, from outside to inside, and from high to low valence variation.

Effects of Milling Time and Annealing Schedule on Mechanical Activation Synthesis of Brownmillerite Structural Ca2Fe2O5

2011 ◽  
Vol 295-297 ◽  
pp. 1099-1102
Author(s):  
Fen Wang ◽  
Chun Zhao ◽  
Jian Feng Zhu
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Powder Diffraction ◽  
Milling Time ◽  
High Energy ◽  
Sem Analysis ◽  
Annealing Schedule ◽  
X Ray ◽  
Lower Temperature ◽  
Scanning Electron

The brownmillerite structural Ca2Fe2O5is successfully prepared by high energy milling starting from CaCO3and Fe2O3. The composition and transformation of phase and structure with different milling time and annealed at 800 °C for 24 h were characterized by the X-ray powder diffraction (XRD) and scanning electron microscopy (SEM) analysis. The results indicate that the high pure brownmillerite structural Ca2Fe2O5could be efficiently synthesized at lower temperature by the mechanically activated mixtures.

scholarly journals X-Ray Diffraction (XRD), X-Ray Fluorescence (XRF) And Scanning Electron Microscopy (SEM) Analysis Of Potsherds, Sungai Batu Complex, Bujang Valley, Kedah Sungai Batu Complex, Bujang Valley, Kedah

Warta Geologi ◽  
2020 ◽  
Vol 46 (3) ◽  
pp. 204-209
Author(s):  
Mohd Hasfarisham Abd Halim ◽  
◽  
Mokhtar Saidin
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Raw Materials ◽  
Sem Analysis ◽  
Clay Sample ◽  
X Ray Diffraction ◽  
X Ray ◽  
Archaeological Excavations ◽  
Scanning Electron

Archaeological excavations at the Sungai Batu Archeological Complex have unearthed potsherds with monument structures. The discovery of the potsherds enables scientific studies of X-ray diffraction (XRD), X-ray fluorescence (XRF) and Scanning Electron Microscopy (SEM) analysis to be conducted and resolve related issues such as where the raw materials were obtained by the manufacturers. To solve the issue, potsherds were taken from around the ancient river, and scientific analyses was conducted for comparison purposes. Before the clay sample was subjected to the scientific analyses, the samples were cleaned and measured (for weight, thickness and width). Color sampling was also performed. Based on results of the analyses, it clearly shows that the potsherds was produced using raw materials from the ancient river in the Sungai Batu Complex itself and baked at a temperature between 550°C and 650°C.

Characterization of Si Single Crystals by Conductivity Mode Scanning Electron Microscopy

1975 ◽  
Vol 33 ◽  
pp. 260-261
Author(s):  
H. J. Leamy ◽  
A. J. R. de Kock ◽  
L. C. Kimerling ◽  
S. D. Ferris
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Sem Analysis ◽  
Schottky Barriers ◽  
Type B ◽  
Melt Quenching ◽  
X Ray ◽  
P Type ◽  
Scanning Electron

We have recently examined the microscopic electrical inhomogeneities present in dislocation free, floating zone, Si crystals grown under various conditions by conductivity mode scanning electron microscopy. Schottky barriers produced by evaporation of thin Au-Pd (on N type) or Ti (on P type) electrodes were employed in order to eliminate possible changes in defect structure or electrical activity during production of a diffused junction.Doped and undoped crystals, as well as crystals subjected to special treatments, such as melt quenching were examined in this study. Prior to SEM analysis, each crystal was characterized by preferential etching, Cu or Li decoration, and x-ray topography. All of the defects detected by these methods, save C impurity striations detected via their dilatation of the Si lattice in x-ray topographs, were observed in the SEM experiments. For example, “swirl” defects of both type “A” (large) and type “B” (small) were readily revealed via the enhanced recombination rate of electron beam injected carriers in their vicinity (see Figs. 1 and 2).

scholarly journals VARIASI KONSENTRASI ION Ni2+ TERHADAP DISPERSI Si3N4 PADA LAPISAN NANOKOMPOSIT Ni-SILIKON NITRIT

2016 ◽  
Vol 8 (2) ◽  
Author(s):  
Ridwan Ridwan
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Energy Dispersive ◽  
Dispersed Phase ◽  
X Ray ◽  
Nano Silicon ◽  
Surface Morphologies ◽  
Scanning Electron

Pelapisan nanokomposit Ni/Si3N4 pada substrat Cu telah dilakukan dengan proses elektroplating pada berbagai konsentrasi ion Ni2+ pada 0,26; 0,56; 0,86; 1,16; dan 1,46 M. Nano silicon nitrit dicampur pada larutan sebagai dispersed phase. Pengaruh konsentrasi ion Ni2+ dalam larutan plating dikaji terhadap dispersi partikel pada lapisan nanokomposit Nikel-Silikon Nitrit. Untuk mengetahui struktur, sifat-sifat fisik dan kimia dari bahan sintesis, beberapa prosedur karakterisasi telah dilakukan. Dari hasil analisis komposisi lapisan nanokomposit menggunakan energy dispersive X-ray analysis (EDX), diperoleh penurunan konsentrasi ion Ni2+ pada elektrolit menyebabkan peningkatan kandungan Si pada lapisan nanokomposit Ni/S3N4 dari 0,62 at.% menjadi 3,01 at.%. Sedangkan dari Scanning Electron Microscopy (SEM) surface morphologies lapisan nanokomposit Ni/Si3N4 terlihat struktur dari lapisan nano komposit compact (padat) dan ukuran butir semakin kecil dengan penurunan konsentrasi ion Ni2+. Secara umum dispersi dari partikel penguat Si pada lapisan nanokomposit Ni/Si3N4 merata pada permukaan lapisan. semakin kecil konsentrasi ion Ni2+ dalam larutan plating semakin tinggi efisiensinya.Kata kunci: Elektroplating, Nanokristal, Nanokomposit, Ni, Si3N4

Preparation of AZO Nanometer Powders by Combustion Synthesis Using Dual Fuel

2011 ◽  
Vol 396-398 ◽  
pp. 429-432
Author(s):  
Xiao Xia Liu ◽  
Hai Lian Qin ◽  
Gui Hua Peng ◽  
Zhen Hua Liang
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Grain Size ◽  
Combustion Synthesis ◽  
Sem Analysis ◽  
Dual Fuel ◽  
X Ray Diffraction ◽  
X Ray ◽  
Scanning Electron

AZO nanometer powders were prepared by combustion synthesis. The influence on the synthesis of AZO nanometer powders were investigated in conditions of using single fuel or dual fuel by X-ray diffraction (XRD) and scanning electron microscopy (SEM) analysis. The results showed that the AZO powders were well-distributed with smaller grain size when using dual fuel.

Identification of calcium oxalate crystals in dried or fixed tobacco leaf

1984 ◽  
Vol 42 ◽  
pp. 288-289
Author(s):  
Vicki L. Baliga ◽  
Mary Ellen Counts
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Calcium Oxalate ◽  
Growth And Development ◽  
Polarized Light ◽  
Calcium Oxalate Crystals ◽  
X Ray Diffraction ◽  
X Ray ◽  
Transmission Electron ◽  
Scanning Electron

Calcium is an important element in the growth and development of plants and one form of calcium is calcium oxalate. Calcium oxalate has been found in leaf seed, stem material plant tissue culture, fungi and lichen using one or more of the following methods—polarized light microscopy (PLM), scanning electron microscopy (SEM), transmission electron microscopy (TEM) and x-ray diffraction.Two methods are presented here for qualitatively estimating calcium oxalate in dried or fixed tobacco (Nicotiana) leaf from different stalk positions using PLM. SEM, coupled with energy dispersive x-ray spectrometry (EDS), and powder x-ray diffraction were used to verify that the crystals observed in the dried leaf with PLM were calcium oxalate.

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