scholarly journals Clog-Free Trilobite Filtration: Tunable Flow Setup and Velocity Measurements

Micromachines ◽  
2020 ◽  
Vol 11 (10) ◽  
pp. 904
Author(s):  
Endre Joachim Mossige ◽  
Atle Jensen
Keyword(s):  
Flow Fields ◽  
Live Cells ◽  
Device Performance ◽  
Flow Profile ◽  
Rigid Spheres ◽  
Persistent Problem ◽  
Flow Configuration ◽  
Optical Setup ◽  
Micro Particle Image Velocimetry ◽  
Filter Structures

The ability to separate and filter out microscopic objects lies at the core of many biomedical applications. However, a persistent problem is clogging, as biomaterials stick to the internal chip surface and limit device efficiency and liability. Here, we review an alternative technique that could solve these clogging issues. By leveraging tunable flow fields and particle inertia around special trilobite-shaped filtration units, we perform filtration of plastic beads by size and we demonstrate sorting of live cells. The separation and filtration are performed completely without signs of clogging. However, a clog-free operation relies on a controlled flow configuration to steer the particles and cells away from the filter structures. In this paper, we describe the tunable flow system for such an operation and we describe an optical setup enabling hydrodynamical interactions between particles and cells with the flow fields and direct interactions with the filter structures to be characterized. The optical setup is capable of measuring particle and flow velocities (by Particle Tracking Velocimetry (PTV), Micro Particle Image Velocimetry (μPIV), and streakline visualization) in meters per second necessary to avoid clogging. However, accurate measurements rely on strict calibration and validation procedures to be followed, and we devote a substantial portion of our paper to laying out such procedures. A comparison between μPIV data and a known flow profile is particularly valuable for assessing measurement accuracy, and this important validation has not been previously published by us. The detail level in our description of the flow configuration and optical system is sufficient to replicate the experiments. In the last part of the paper, we review an assessment of the device performance when handling rigid spheres and live cells. We deconvolute the influences of cell shape from effects of size and find that the shape has only a weak influence on device performance.

Experimental Investigation of Thermocapillary Convection Near an Evaporating Meniscus

2006 ◽  
Author(s):  
H. K. Dhavaleswarapu ◽  
P. Chamarthy ◽  
S. V. Garimella ◽  
J. Y. Murthy ◽  
S. T. Wereley
Keyword(s):  
Capillary Tube ◽  
Flow Fields ◽  
Small Scale ◽  
Micro Particle Image Velocimetry ◽  
Image Velocimetry ◽  
Fluorescent Particles ◽  
Convection Patterns ◽  
Wavelength Light ◽  
Illumination Source ◽  
Experimental Fluid

Experimental visualizations of the 3D convection patterns generated near an evaporating meniscus in a capillary tube are presented. Epi-fluorescent micro-particle image velocimetry (μPIV) using a two-cavity frequency doubled ND-YAG laser as the illumination source is employed to map the small-scale spatial flow fields near the meniscus. Methanol seeded with 0.5 μm polystyrene fluorescent particles is used as the experimental fluid. These fluorescent particles absorb light from the laser beam (λabs~542 nm, green) and emit a longer wavelength light ((λem~612 nm, red). Images obtained at a specified time delay (~20 ms) were interrogated to obtain vector flow fields.

scholarly journals High-throughput multicolor 3D localization in live cells by depth-encoding imaging flow cytometry

2019 ◽  
Author(s):  
Lucien E. Weiss ◽  
Yael Shalev Ezra ◽  
Sarah E. Goldberg ◽  
Boris Ferdman ◽  
Yoav Shechtman
Keyword(s):  
Flow Cytometry ◽  
High Throughput ◽  
Imaging System ◽  
Live Cells ◽  
Flow Profile ◽  
Imaging Flow Cytometry ◽  
3D Localization ◽  
Large Populations ◽  
Point Spread Function Engineering

ABSTRACTImaging flow cytometry replaces the canonical point-source detector of flow cytometry with a camera, unveiling subsample details in 2D images while maintaining high-throughput. Here we show that the technique is inherently compatible with 3D localization microscopy by point-spread-function engineering, namely the encoding of emitter depth in the emission pattern captured by a camera. By exploiting the laminar-flow profile in microfluidics, 3D positions can be extracted from cells or other objects of interest by calibrating the depth-dependent response of the imaging system using fluorescent microspheres mixed with the sample buffer. We demonstrate this approach for measuring fluorescently-labeled DNA in vitro and the chromosomal compaction state in large populations of live cells, collecting thousands of samples each minute. Furthermore, our approach is fully compatible with existing commercial apparatus, and can extend the imaging volume of the device, enabling faster flowrates thereby increasing throughput.

scholarly journals Acoustical nanometre-scale vibrations of live cells detected by a near-field optical setup

2007 ◽  
Vol 15 (9) ◽  
pp. 5589 ◽  
Author(s):  
Rosaria Piga ◽  
Ruggero Micheletto ◽  
Yoichi Kawakami
Keyword(s):  
Near Field ◽  
Live Cells ◽  
Optical Setup

Effect of Air to Air Fixed Plate Enthalpy Energy Recovery Heat Exchanger Flow Profile on Air Conditioning System Energy Recovery

2016 ◽  
Vol 819 ◽  
pp. 245-249
Author(s):  
Mohammad Shakir Nasif ◽  
Rafat Al-Waked
Keyword(s):  
Heat Exchanger ◽  
Air Conditioning ◽  
Energy Recovery ◽  
Moisture Transfer ◽  
Flow Profile ◽  
Air Conditioner ◽  
Counter Flow ◽  
Flow Configuration ◽  
Fixed Plate ◽  
Cooling Coil

Fixed plate enthalpy heat exchanger which utilizes permeable material as heat and moisture transfer surface has been used as an energy recovery system to recover sensible and latent heat in HVAC systems. The heat exchanger effectiveness is affected by the air flow profile. It is well known that counter flow configuration provides highest effectiveness, however, in real applications, it is not possible to implement a counter flow configuration, as both inlet and outlet ducts of the two flow streams are located on the same side of the heat exchanger. Therefore, several quasi-counter-flow heat exchanger designs including Z-shaped, L-shaped, Z-shaped opposite flow configurations are proposed in this research and their effect on energy consumed by an air conditioning cooling coil has been investigated, where each of the proposed heat exchanger is incorporated in an air conditioning cooling coil model. The modeled cooling coil energy consumption and energy recovered by the heat exchangers are evaluated under Kuala Lumpur weather conditions. It has been found that an air conditioner coupled with L-shaped heat exchanger recorded up to 20% increase in energy recovery in comparison with Z-shaped oposite and Z-shaped heat exchanger.

Particle characterization of CVD tungsten metallization for 64 MBIT DRAM

1991 ◽  
Vol 49 ◽  
pp. 896-897
Author(s):  
Marylyn Bennett-Lilley ◽  
Thomas T.H. Fu ◽  
David D. Yin ◽  
R. Allen Bowling
Keyword(s):  
Chemical Vapor ◽  
Device Performance ◽  
Particle Characterization ◽  
Particle Generation ◽  
Tungsten Hexafluoride ◽  
Homogeneous Particle ◽  
Multiple Levels ◽  
Circuit Density ◽  
Sources Of Contamination

Chemical Vapor Deposition (CVD) tungsten metallization is used to increase VLSI device performance due to its low resistivity, and improved reliability over other metallization schemes. Because of its conformal nature as a blanket film, CVD-W has been adapted to multiple levels of metal which increases circuit density. It has been used to fabricate 16 MBIT DRAM technology in a manufacturing environment, and is the metallization for 64 MBIT DRAM technology currently under development. In this work, we investigate some sources of contamination. One possible source of contamination is impurities in the feed tungsten hexafluoride (WF6) gas. Another is particle generation from the various reactor components. Another generation source is homogeneous particle generation of particles from the WF6 gas itself. The purpose of this work is to investigate and analyze CVD-W process-generated particles, and establish a particle characterization methodology.

4-dimensional, high-resolution imaging of living cells

1992 ◽  
Vol 50 (1) ◽  
pp. 416-417
Author(s):  
Shinya Inoué
Keyword(s):  
Light Microscope ◽  
Living Cells ◽  
Live Cells ◽  
Video Tape ◽  
Active Living ◽  
High Resolution Imaging ◽  
3 Dimensional ◽  
Dynamic Architecture ◽  
Resolution Imaging ◽  
Disk Memory

This paper reports progress of our effort to rapidly capture, and display in time-lapsed mode, the 3-dimensional dynamic architecture of active living cells and developing embryos at the highest resolution of the light microscope. Our approach entails: (A) real-time video tape recording of through-focal, ultrathin optical sections of live cells at the highest resolution of the light microscope; (B) repeat of A at time-lapsed intervals; (C) once each time-lapsed interval, an image at home focus is recorded onto Optical Disk Memory Recorder (OMDR); (D) periods of interest are selected using the OMDR and video tape records; (E) selected stacks of optical sections are converted into plane projections representing different view angles (±4 degrees for stereo view, additional angles when revolving stereos are desired); (F) analysis using A - D.

In situ TEM measurements of the electrical properties of interface dislocations

1992 ◽  
Vol 50 (2) ◽  
pp. 1338-1339
Author(s):  
F. M. Ross ◽  
R. Hull ◽  
D. Bahnck ◽  
J. C. Bean ◽  
L. J. Peticolas ◽  
...  
Keyword(s):  
Electrical Properties ◽  
Electronic Device ◽  
In Situ Tem ◽  
Device Performance ◽  
Misfit Dislocations ◽  
Electrical Characteristics ◽  
Strained Layer ◽  
Transmission Electron ◽  
Interfacial Dislocations

We describe an investigation of the electrical properties of interfacial dislocations in strained layer heterostructures. We have been measuring both the structural and electrical characteristics of strained layer p-n junction diodes simultaneously in a transmission electron microscope, enabling us to correlate changes in the electrical characteristics of a device with the formation of dislocations.The presence of dislocations within an electronic device is known to degrade the device performance. This degradation is of increasing significance in the design and processing of novel strained layer devices which may require layer thicknesses above the critical thickness (hc), where it is energetically favourable for the layers to relax by the formation of misfit dislocations at the strained interfaces. In order to quantify how device performance is affected when relaxation occurs we have therefore been investigating the electrical properties of dislocations at the p-n junction in Si/GeSi diodes.

Charging microscopy and cathodoluminescence imaging of semi-insulating gallium arsenide

1986 ◽  
Vol 44 ◽  
pp. 816-817
Author(s):  
T.C. Sheu ◽  
S. Myhajlenko ◽  
D. Davito ◽  
J.L. Edwards ◽  
R. Roedel ◽  
...  
Keyword(s):  
Integrated Circuits ◽  
Secondary Electron ◽  
Crystal Defects ◽  
Device Performance ◽  
Gaas Wafer ◽  
Surface Charging ◽  
Gaas Substrates ◽  
Voltage Contrast ◽  
Cathodoluminescence Imaging ◽  
Scanning Electron

Liquid encapsulated Czochralski (LEC) semi-insulating (SI) GaAs has applications in integrated optics and integrated circuits. Yield and device performance is dependent on the homogeniety of the wafers. Therefore, it is important to characterise the uniformity of the GaAs substrates. In this respect, cathodoluminescence (CL) has been used to detect the presence of crystal defects and growth striations. However, when SI GaAs is examined in a scanning electron microscope (SEM), there will be a tendency for the surface to charge up. The surface charging affects the backscattered and secondary electron (SE) yield. Local variations in the surface charge will give rise to contrast (effectively voltage contrast) in the SE image. This may be associated with non-uniformities in the spatial distribution of resistivity. Wakefield et al have made use of “charging microscopy” to reveal resistivity variations across a SI GaAs wafer. In this work we report on CL imaging, the conditions used to obtain “charged” SE images and some aspects of the contrast behaviour.

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