Effect of Three Types of Ion Beam Irradiation on Gerbera (Gerbera hybrida) In Vitro Shoots with Mutagenesis Efficiency

Gerbera in vitro shoots were irradiated using three types of ion beams with different line energy transfers (LETs) to investigate the effective LET and absorbed doses for mutagenesis. Furthermore, genomic mutation analyses were conducted on the obtained mutants. Survival rate analysis showed a lower lethal dose 50% (LD50) with ion beams with higher LETs. Trait/morphological mutations exhibited changes in the color and shape of petals and male sterility. Irradiation conditions with the highest growth change and trait/morphological mutation rates in each ion were C irradiation at 10 Gy, Ar irradiation at 5 Gy, and Fe irradiation at 5 Gy, with a range of absorbed dose of around LD50 to about 10 Gy lower. The highest trait/morphological mutation rate was 14.1% with Ar irradiation at 5 Gy, which was one of the criteria for ion beam irradiation of gerbera in vitro shoots. Furthermore, the genomic mutation in the flower color, petal shape, and male sterile mutants were confirmed by genotype analysis using Genotyping by Random Amplicon Sequencing-Direct technology. This is the first study to report the efficient production of gerbera mutants that could be analyzed. Our findings may lead to more efficient gerbera mutant production and analysis technology.

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In Vitro Determination of the Relative Biological Effectiveness of Carbon Ion Beam Irradiation in Cells Derived From Human Normal Lung Tissues

International Journal of Radiation Oncology*Biology*Physics ◽

10.1016/j.ijrobp.2014.05.2275 ◽

2014 ◽

Vol 90 (1) ◽

pp. S787 ◽

Cited By ~ 1

Author(s):

N. Okano ◽

T. Oike ◽

J. Saitoh ◽

K. Shirai ◽

T. Kiyono ◽

...

Keyword(s):

Relative Biological Effectiveness ◽

Ion Beam ◽

Normal Lung ◽

Beam Irradiation ◽

Ion Beam Irradiation ◽

Carbon Ion ◽

Biological Effectiveness ◽

Carbon Ion Beam

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Radiation-induced implantation of polymeric films in metallic substrates

Journal of Materials Research ◽

10.1557/jmr.1986.0577 ◽

1986 ◽

Vol 1 (4) ◽

pp. 577-582

Author(s):

M.W. Ferralli ◽

M. Luntz

Keyword(s):

Film Formation ◽

Ion Beam ◽

Ion Beams ◽

Polymeric Films ◽

Beam Irradiation ◽

Ion Beam Irradiation ◽

Hydrocarbon Gases ◽

Metallic Substrates ◽

Radiation Induced ◽

Stage Process

Implanted, polymeric films have been produced by accelerator-ion-beam irradiation of metallic substrates immersed in hydrocarbon gases. Typical substrates include silver, aluminum, and steel; hydrocarbon gases include 1,3 butadiene and ethylene at 6.6 Pa pressure; ion beams employed include singly ionized H, He, and Ar at 30 keV. Experimental procedures and corrosion-resistance properties of the films are reviewed (each discussed elsewhere). A theory of the film-formation process is presented. It is concluded that the films form as the result of a two-stage process: glow-discharge adhesion and polymerization followed by radiation-induced implantation resulting from collisional recoil and substrate sputtering.

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Superior Effect of the Combination of Carbon-Ion Beam Irradiation and 5-Fluorouracil on Colorectal Cancer Stem Cells in vitro and in vivo

OncoTargets and Therapy ◽

10.2147/ott.s276035 ◽

2020 ◽

Vol Volume 13 ◽

pp. 12625-12635

Author(s):

Woong Sub Koom ◽

Sei Sai ◽

Masao Suzuki ◽

Akira Fujimori ◽

Shigeru Yamada ◽

...

Keyword(s):

Colorectal Cancer ◽

Stem Cells ◽

Ion Beam ◽

Beam Irradiation ◽

Ion Beam Irradiation ◽

Superior Effect ◽

Carbon Ion Beam ◽

Colorectal Cancer Stem Cells

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Spontaneous Pattern Formation from Focused and Unfocused Ion Beam Irradiation

MRS Proceedings ◽

10.1557/proc-696-n2.8 ◽

2001 ◽

Vol 696 ◽

Cited By ~ 8

Author(s):

Alexandre Cuenat ◽

Michael J. Aziz

Keyword(s):

Small Amplitude ◽

Focused Ion Beam ◽

Ion Beam ◽

Ion Beams ◽

The Self ◽

Self Organization ◽

Lateral Boundary ◽

Beam Irradiation ◽

Ion Beam Irradiation ◽

Lateral Boundary Conditions

AbstractWe study the formation and self-organization of “ripples” and “dots” spontaneously appearing during uniform irradiation of Si, Ge, and GaSb with energetic ion beams. Features have been produced both with sub-keV unfocused Ar+ ions and with a 30 keV Ga+ Focused Ion Beam. We follow the evolution of features from small amplitude to “nanospikes” with increasing ion dose. It appears that the edge of the sputtered region influences the patterns formed, an effect that may make it possible to guide the self-organization by the imposition of lateral boundary conditions on the sputter instability.

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Radiation damage of thin films of YBa2Cu3O7 superconductors

HNPS Proceedings ◽

10.12681/hnps.2934 ◽

2020 ◽

Vol 6 ◽

pp. 271

Author(s):

R. Vlastou ◽

E. N. Gazis ◽

C. T. Papadopoulos ◽

E. Liarokapis ◽

D. Palles ◽

...

Keyword(s):

Thin Films ◽

Phase Transition ◽

Raman Spectroscopy ◽

Radiation Damage ◽

Ion Beam ◽

Ion Beams ◽

Beam Irradiation ◽

Ion Beam Irradiation ◽

Critical Dose ◽

Different Doses

The effect of ion-beam irradiation of YBa2Cu3O7 superconductors has been studied by Raman spectroscopy. The ion beams 4He, 16O and 127I have been used eat energies 4, 25 and 200 MeV, respectively, in an attempt to investigate the radi- ation damage with respect to the mass of the bombarding ions, further, different doses of irradiation have been tried for each ion beam in order to investigate at which critical dose the phase transition from crystalline to amorphous and the loss of superconductivity occur.

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Spontaneous Pattern Formation from Focused and Unfocused Ion Beam Irradiation

MRS Proceedings ◽

10.1557/proc-707-aa3.8.1/n2.8.1 ◽

2001 ◽

Vol 707 ◽

Author(s):

Alexandre Cuenat ◽

Michael J. Aziz

Keyword(s):

Small Amplitude ◽

Focused Ion Beam ◽

Ion Beam ◽

Ion Beams ◽

The Self ◽

Self Organization ◽

Lateral Boundary ◽

Beam Irradiation ◽

Ion Beam Irradiation ◽

Lateral Boundary Conditions

ABSTRACTWe study the formation and self-organization of “ripples” and “dots” spontaneously appearing during uniform irradiation of Si, Ge, and GaSb with energetic ion beams. Features have been produced both with sub-keV unfocused Ar+ ions and with a 30 keV Ga+ Focused Ion Beam. We follow the evolution of features from small amplitude to “nanospikes” with increasing ion dose. It appears that the edge of the sputtered region influences the patterns formed, an effect that may make it possible to guide the self-organization by the imposition of lateral boundary conditions on the sputter instability.

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ECRIS Based Ion Beam Irradiation System for Estimating Damage of Satellites Components by Low Energy Xe Ion Beams

2018 22nd International Conference on Ion Implantation Technology (IIT) ◽

10.1109/iit.2018.8807929 ◽

2018 ◽

Author(s):

Tatsuto Takeda ◽

Takuro Otsuka ◽

Shogo Hagino ◽

Koji Onishi ◽

Kouta Hamada ◽

...

Keyword(s):

Ion Beam ◽

Ion Beams ◽

Low Energy ◽

Beam Irradiation ◽

Ion Beam Irradiation ◽

Irradiation System

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Mutagenic effects of heavy-ion beam irradiation on in vitro nodal segments of Artemisia annua L.

Plant Cell Tissue and Organ Culture (PCTOC) ◽

10.1007/s11240-014-0519-z ◽

2014 ◽

Vol 119 (1) ◽

pp. 131-139 ◽

Cited By ~ 5

Author(s):

Phithak Inthima ◽

Masahiro Otani ◽

Tomoya Hirano ◽

Yoriko Hayashi ◽

Tomoko Abe ◽

...

Keyword(s):

Artemisia Annua ◽

Ion Beam ◽

Heavy Ion ◽

Nodal Segments ◽

Beam Irradiation ◽

Ion Beam Irradiation ◽

Artemisia Annua L ◽

Heavy Ion Beam ◽

Mutagenic Effects

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Surface smoothing of glass substrate by irradiation of ionic liquid ion beams

MRS Proceedings ◽

10.1557/opl.2013.769 ◽

2013 ◽

Vol 1575 ◽

Cited By ~ 1

Author(s):

Mitsuaki Takeuchi ◽

Takuya Hamaguchi ◽

Hiromichi Ryuto ◽

Gikan H Takaoka

Keyword(s):

Ionic Liquid ◽

Photoelectron Spectroscopy ◽

Glass Substrate ◽

Ion Beam ◽

Mean Value ◽

Ion Beams ◽

Negative Ion ◽

Beam Irradiation ◽

Surface Smoothing ◽

Ion Beam Irradiation

ABSTRACTSurface smoothing of a barium borosilicate glass substrate by irradiation of ionic liquid ion beams were investigated. 1-ethyl-3-methylimidaolium tetrafluoroborate (EMIM-BF4) and 1-butyl-3-methylimidazolium hexafluorophosphate (BMIM-PF6) were used for the source liquid. Surface roughness represented as the arithmetic mean value decreased from 0.17 nm to 0.13 nm by the BMIM-PF6 negative ion beam. Secondary electron microscope (SEM) observation for the glass surface irradiated with the BMIM-PF6 negative ion beam showed a clear image without an electrical charge-up, though the EMIM-BF4 negative ion beam irradiated glass yielded a charged up image. X-ray photoelectron spectroscopy (XPS) analysis implied that the surface layer including cation-anion pair of BMIM-PF6 was deposited by the BMIM-PF6 negative ion beam irradiation, while an insulated surface with barium fluoride was formed by the EMIM-BF4 negative ion beam irradiation.

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