scholarly journals Numerical Optimization of a Fully Cross-Coupled Rectifier Circuit for Wireless Passive Ultra Low Power Sensor Nodes

Sensors ◽  
2019 ◽  
Vol 19 (20) ◽  
pp. 4527
Author(s):  
Dominik Mair ◽  
Manuel Ferdik ◽  
Christof Happ ◽  
Michael Renzler ◽  
Thomas Ussmueller

In the context of the Internet of Things, billions of devices—especially sensors—will be linked together in the next few years. A core component of wireless passive sensor nodes is the rectifier, which has to provide the circuit with sufficient operating voltage. In these devices, the rectifier has to be as energy efficient as possible in order to guarantee an optimal operation. Therefore, a numerical optimization scheme is proposed in this paper, which is able to find a unique optimal solution for an integrated Complementary Metal-Oxide-Semiconductor (CMOS) rectifier circuit with Self-Vth-Cancellation (SVC). An exploration of the parameter space is carried out in order to generate a meaningful target function for enhancing the rectified power for a fixed communication distance. In this paper, a mean conversion efficiency is introduced, which is a more valid target function for optimization than the Voltage Conversion Efficiency (VCE) and the commonly used Power Conversion Efficiency (PCE) and is defined as the arithmetic mean between PCE and VCE. Various trade-offs between output voltage, PCE, VCE and MCE are shown, which provide valuable information for low power rectifier designs. With the proposed method, a rectifier in a low power 55 nm process from Globalfoundries (GF55LPe) is optimized and simulated at −30 dBm input power. A mean PCE of 63.33% and a mean VCE of 63.40% is achieved.

Electronics ◽  
2020 ◽  
Vol 9 (6) ◽  
pp. 928 ◽  
Author(s):  
Taehoon Kim ◽  
Sivasundar Manisankar ◽  
Yeonbae Chung

Subthreshold SRAMs profit various energy-constrained applications. The traditional 6T SRAMs exhibit poor cell stability with voltage scaling. To this end, several 8T to 16T cell designs have been reported to improve the stability. However, they either suffer one of disturbances or consume large bit-area overhead. Furthermore, some cell options have a limited write-ability. This paper presents a novel 8T static RAM for reliable subthreshold operation. The cell employs a fully differential scheme and features cross-point access. An adaptive cell bias for each operating mode eliminates the read disturbance and enlarges the write-ability as well as the half-select stability in a cost-effective small bit-area. The bit-cell also can support efficient bit-interleaving. To verify the SRAM technique, a 32-kbit macro incorporating the proposed cell was implemented with an industrial 180 nm low-power CMOS process. At 0.4 V and room temperature, the proposed cell achieves 3.6× better write-ability and 2.6× higher dummy-read stability compared with the commercialized 8T cell. The 32-kbit SRAM successfully operates down to 0.21 V (~0.27 V lower than transistor threshold voltage). At its lowest operating voltage, the sleep-mode leakage power of entire SRAM is 7.75 nW. Many design results indicate that the proposed SRAM design, which is applicable to an aggressively-scaled process, might be quite useful in realizing cost-effective robust ultra-low voltage SRAMs.


Author(s):  
Yoonmyung Lee ◽  
Gregory Chen ◽  
Scott Hanson ◽  
Dennis Sylvester ◽  
David Blaauw

2013 ◽  
Vol 48 (10) ◽  
pp. 2511-2521 ◽  
Author(s):  
Yoonmyung Lee ◽  
Bharan Giridhar ◽  
Zhiyoong Foo ◽  
Dennis Sylvester ◽  
David B. Blaauw

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