Profile Analysis of Abusive Families Based on Child Safety and Risk Assessment

2019 ◽  
Vol 27 (1) ◽  
pp. 163-189
Author(s):  
Kihyun Kim ◽  
Dong-Moon Yum ◽  
Bee Ryou
1999 ◽  
Vol 40 (6) ◽  
pp. 209-215
Author(s):  
Linda Schweitzer ◽  
I. H. (Mel) Suffet

Information on the toxicity of individual chemicals that have been used as known or representative odor standards in the method of Flavor Profile Analysis (FPA) was compiled for an exposure assessment. A full risk assessment was not possible since unit risk values for most of these chemicals do not exist. This study provides a recommendation as to what chemicals can be safely used as known and representative taste and odor standards for the next modification of the Flavor Profile Analysis Standard Method 2170. Excluding any potential odor standard listed as possible or probable carcinogens, there would be no known risk to FPA panelists being exposed to the selected odor reference chemicals at the concentrations used in FPA. Also, the concentrations which panelists are exposed to during an FPA (20 minutes per chemical) are lower than the legal threshold limit values for 8 hour occupational exposures. However, many of the odor reference chemicals have yet to be evaluated for their carcinogenic or noncarcinogenic endpoints. Recommendations are made as to which chemicals should be avoided.


Assessment ◽  
2021 ◽  
pp. 107319112110153
Author(s):  
Katherine E. McCallum ◽  
Marcus T. Boccaccini ◽  
Jorge G. Varela ◽  
Darrel B. Turner

A growing body of research suggests there are identifiable psychopathy subtypes among offenders scored on Hare’s Psychopathy Checklist–Revised (PCL-R; Hare, 2003). We used latent profile analysis to examine the generalizability of these subtype findings to PCL-R scores ( N = 615) assigned in a sex offender risk assessment field setting and to examine how offender subtypes differ on measures of comorbid psychopathology, risk, and treatment amenability from the Personality Assessment Inventory. Consistent with prior research, we identified four subtypes when using PCL-R scores from all offenders: Prototypic psychopathy ( n = 239, 38.9%), callous-conning ( n = 154, 25.0%), sociopathic ( n = 96, 15.6%), and general offenders ( n = 126, 20.5%). Prototypic and sociopathic subtypes exhibited the highest levels of comorbid psychopathology and risk for potential violence. We identified classes consistent with primary ( n = 66, 36.7%) and secondary ( n = 114, 63.3%) psychopathy among offenders with PCL-R total scores ≥ 25, and found higher levels of comorbid psychopathology and potential for violence among those in the secondary psychopathy class. Findings provide support the generalizability of existing PCL-R subtype findings to field scores and show how those with similar PCL-R total scores may differ on scores from commonly used multiscale inventories.


Author(s):  
S.F. Corcoran

Over the past decade secondary ion mass spectrometry (SIMS) has played an increasingly important role in the characterization of electronic materials and devices. The ability of SIMS to provide part per million detection sensitivity for most elements while maintaining excellent depth resolution has made this technique indispensable in the semiconductor industry. Today SIMS is used extensively in the characterization of dopant profiles, thin film analysis, and trace analysis in bulk materials. The SIMS technique also lends itself to 2-D and 3-D imaging via either the use of stigmatic ion optics or small diameter primary beams.By far the most common application of SIMS is the determination of the depth distribution of dopants (B, As, P) intentionally introduced into semiconductor materials via ion implantation or epitaxial growth. Such measurements are critical since the dopant concentration and depth distribution can seriously affect the performance of a semiconductor device. In a typical depth profile analysis, keV ion sputtering is used to remove successive layers the sample.


1998 ◽  
Vol 62 (10) ◽  
pp. 756-761 ◽  
Author(s):  
CW Douglass
Keyword(s):  

2006 ◽  
Vol 175 (4S) ◽  
pp. 531-532
Author(s):  
Matthew R. Cooperberg ◽  
Stephen J. Freedland ◽  
David J. Pasta ◽  
Eric P. Elkin ◽  
Joseph C. Presti ◽  
...  

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