scholarly journals Atomic-resolution imaging of rutile TiO2(110)-(1 × 2) reconstructed surface by non-contact atomic force microscopy

2020 ◽  
Vol 11 ◽  
pp. 443-449
Author(s):  
Daiki Katsube ◽  
Shoki Ojima ◽  
Eiichi Inami ◽  
Masayuki Abe
Keyword(s):  
Atomic Force Microscopy ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Force Microscopy ◽  
Atomic Force ◽  
Bright Spots ◽  
Resolution Imaging ◽  
Low Energy Electron ◽  
Reconstructed Surface ◽  
Stm Images

The structure of the rutile TiO2(110)-(1 × 2) reconstructed surface is a phase induced by oxygen reduction. There is ongoing debate about the (1 × 2) reconstruction, because it cannot be clarified whether the (1 × 2) structure is formed over a wide area or only locally using macroscopic analysis methods such as diffraction. We used non-contact atomic force microscopy, scanning tunneling microscopy, and low-energy electron diffraction at room temperature to characterize the surface. Ti2O3 rows appeared as bright spots in both NC-AFM and STM images observed in the same area. High-resolution NC-AFM images revealed that the rutile TiO2(110)-(1 × 2) reconstructed surface is composed of two domains with different types of asymmetric rows.

scholarly journals ATOMIC FORCE MICROSCOPY AS A TOOL FOR TESTING BIOMEDICAL SAMPLES AND ELIMINATION PROBE ARTIFACTS

2019 ◽  
Vol 10 (2) ◽  
Author(s):  
Ljubiša Petrov ◽  
Lidija Matija
Keyword(s):  
Atomic Force Microscopy ◽  
Numerical Data ◽  
Sample Surface ◽  
Pharmaceutical Products ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
The Real ◽  
Force Microscopy ◽  
Atomic Force ◽  
Reconstructed Surface

One of the most perspective available techniques for investigation of the composition, structure and properties of materials, is scanning probe microscopy (SPM), respectively its components scanning tunneling microscopy (STM) and atomic force microscopy (AFM). This technique is used in multidisciplinary research in the field of medicine, pharmacy, dentistry, material science, etc., for study of biological samples, chemical compounds, pharmaceutical products, artificial tissues, implantology materials, and all other materials that have nanotechnological impact on application in these scientific fields. This is because the probes have not perfect size and geometry, which leads to the appearance of artifacts. They are defined as characteristics that appear on the image and are not present on the sample. These effects caused by convolutions between the probe and sample can be corrected to a certain extent by mathematical manipulation of topographic data. The methodology used in this paper is based on algebra of sets, and basic tools of mathematical morphology. Mathematical algorithms for the „blind reconstruction“ of the tip were used, and then in order to detect the parts of the sample surface which is not available in real-time scanning deconvolution was applied. The limit of the real probe tip is calculated from the image, using the morphological limitations inherent in the recording process. The result acuired as an image of the reconstructed surface out of the used images, with the reconstruction of the real tip. The presented results are clear proof of the usability of atomic force microscopy as a technique for imaging of biological materials on nano-level, and the applied algorithms increase the usability of the images in terms of a better conclusion based on precise numerical data taken from the processed images.

scholarly journals High-Resolution Imaging with Atomic Force Microscopy

2004 ◽  
Vol 12 (5) ◽  
pp. 12-15
Author(s):  
Sergei Magonov
Keyword(s):  
Atomic Force Microscopy ◽  
High Resolution ◽  
Atomic Scale ◽  
Scanning Tunneling ◽  
High Resolution Imaging ◽  
Tunneling Microscopy ◽  
Detection Scheme ◽  
Force Microscopy ◽  
Atomic Force ◽  
Resolution Imaging

The invention of scanning tunneling microscopy (STM) in 1982 revolutionized surface analysis by providing atomic-scale surface imaging of conducting and semiconducting materials. Shortly after that, atomic force microscopy (AFM) was introduced as an accessory of STM for high-resolution imaging of surfaces independent of their conductivity. Mechanical force interactions between a sharp tip placed at one end of a micro fabricated cantilever and a sample surface were employed for imaging in this method. In the past decade, AFM has developed into a leading scanning probe technique applied in many fields of fundamental and industrial research. The progress of AFM has been made possible by implementation of an optical level detection scheme, which allows precise measuring of the cantilever deflection caused by the tip-sample forces, by mass microfabrication of probes consisting of cantilevers, and by developments of oscillatory imaging modes, particularly, Tapping ModeTM.

scholarly journals Exploring Intramolecular Methyl–Methyl Coupling on a Metal Surface for Edge-Extended Graphene Nanoribbons

2021 ◽  
Vol 03 (02) ◽  
pp. 128-133
Author(s):  
Zijie Qiu ◽  
Qiang Sun ◽  
Shiyong Wang ◽  
Gabriela Borin Barin ◽  
Bastian Dumslaff ◽  
...  
Keyword(s):  
Raman Spectroscopy ◽  
Atomic Force Microscopy ◽  
High Resolution ◽  
Graphene Nanoribbons ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Force Microscopy ◽  
Methyl Methyl ◽  
Atomic Force ◽  
Edge Extension

Intramolecular methyl–methyl coupling on Au (111) is explored as a new on-surface protocol for edge extension in graphene nanoribbons (GNRs). Characterized by high-resolution scanning tunneling microscopy, noncontact atomic force microscopy, and Raman spectroscopy, the methyl–methyl coupling is proven to indeed proceed at the armchair edges of the GNRs, forming six-membered rings with sp3- or sp2-hybridized carbons.

Adsorption and Desorption of AlCl3on Si(111)7×7 Observed by Scanning Tunneling Microscopy and Atomic Force Microscopy

1993 ◽  
Vol 32 (Part 1, No. 12B) ◽  
pp. 6200-9202 ◽  
Author(s):  
Katsuhiro Uesugi ◽  
Takaharu Takiguchi ◽  
Michiyoshi Izawa ◽  
Masamichi Yoshimura ◽  
Takafumi Yao
Keyword(s):  
Atomic Force Microscopy ◽  
Scanning Tunneling Microscopy ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Adsorption And Desorption ◽  
Force Microscopy ◽  
Atomic Force

Scanning Tunneling Microscopy and Atomic Force Microscopy Investigation of Organic Tetracyanoquinodimethane Thin Films

1997 ◽  
Vol 12 (8) ◽  
pp. 1942-1945 ◽  
Author(s):  
H. J. Gao ◽  
H. X. Zhang ◽  
Z. Q. Xue ◽  
S. J. Pang
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Scanning Tunneling Microscopy ◽  
Pyrolytic Graphite ◽  
Film Surface ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Force Microscopy ◽  
Atomic Force ◽  
Microscopy Investigation

Scanning tunneling microscopy (STM) and atomic force microscopy (AFM) investigation of tetracyanoquinodimethane (TCNQ) and the related C60-TCNQ thin films is presented. Periodic molecular chains of the TCNQ on highly oriented pyrolytic graphite (HOPG) substrates were imaged, which demonstrated that the crystalline (001) plane was parallel to the substrate. For the C60-TCNQ thin films, we found that there were grains on the film surface. STM images within the grain revealed that the well-ordered rows and terraces, and the parallel rows in different grains were generally not in the same orientation. Moreover, the grain boundary was also observed. In addition, AFM was employed to modify the organic TCNQ film surface for the application of this type of materials to information recording and storage at the nanometer scale. The nanometer holes were successfully created on the TCNQ thin film by the AFM.

Surface-confined formation of conjugated porphyrin-based nanostructures on Ag(111)

Nanoscale ◽  
2021 ◽  
Author(s):  
Nan Cao ◽  
Alexander Riss ◽  
Eduardo Corral-Rascon ◽  
Alina Meindl ◽  
Willi Auwärter ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Scanning Tunneling Microscopy ◽  
Scanning Tunneling ◽  
Coupling Scheme ◽  
Tunneling Microscopy ◽  
Force Microscopy ◽  
Atomic Force ◽  
Type Coupling

Porphyrin-based oligomers were synthesized from the condensation of adsorbed 4-benzaldehyde-substituted porphyrins through the formation of C=C linkages, following a McMurry-type coupling scheme. Scanning tunneling microscopy, non-contact atomic force microscopy, and...

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