scholarly journals Pure hydrogen low-temperature plasma exposure of HOPG and graphene: Graphane formation?

2012 ◽  
Vol 3 ◽  
pp. 852-859 ◽  
Author(s):  
Baran Eren ◽  
Dorothée Hug ◽  
Laurent Marot ◽  
Rémy Pawlak ◽  
Marcin Kisiel ◽  
...  
Keyword(s):  
Low Temperature ◽  
Scanning Probe Microscopy ◽  
Atomic Scale ◽  
Scanning Probe ◽  
Scanning Tunneling ◽  
Multilayer Graphene ◽  
Pure Hydrogen ◽  
Low Temperature Plasma ◽  
Temperature Plasma ◽  
Probe Microscopy

Single- and multilayer graphene and highly ordered pyrolytic graphite (HOPG) were exposed to a pure hydrogen low-temperature plasma (LTP). Characterizations include various experimental techniques such as photoelectron spectroscopy, Raman spectroscopy and scanning probe microscopy. Our photoemission measurement shows that hydrogen LTP exposed HOPG has a diamond-like valence-band structure, which suggests double-sided hydrogenation. With the scanning tunneling microscopy technique, various atomic-scale charge-density patterns were observed, which may be associated with different C–H conformers. Hydrogen-LTP-exposed graphene on SiO2 has a Raman spectrum in which the D peak to G peak ratio is over 4, associated with hydrogenation on both sides. A very low defect density was observed in the scanning probe microscopy measurements, which enables a reverse transformation to graphene. Hydrogen-LTP-exposed HOPG possesses a high thermal stability, and therefore, this transformation requires annealing at over 1000 °C.

scholarly journals Low-Temperature Scanning Probe Microscopy

2017 ◽  
pp. 769-808
Author(s):  
Mehmet Z. Baykara ◽  
Markus Morgenstern ◽  
Alexander Schwarz ◽  
Udo D. Schwarz
Keyword(s):  
Low Temperature ◽  
Scanning Probe Microscopy ◽  
Scanning Probe ◽  
Probe Microscopy ◽  
Temperature Scanning

Recognition, Specificity, Scanning Probe Microscopy and Biomaterials

2001 ◽  
Vol 7 (S2) ◽  
pp. 130-131
Author(s):  
Buddy D. Ratner ◽  
Reto Luginbühll ◽  
Rene Overney ◽  
Michael Garrison ◽  
Thomas Boland
Keyword(s):  
Scanning Probe Microscopy ◽  
Secondary Ion Mass Spectrometry ◽  
Film Structure ◽  
Scanning Probe ◽  
Scanning Tunneling ◽  
Specific Information ◽  
Tunneling Microscopy ◽  
Probe Microscopy ◽  
Biomaterial Surfaces ◽  
Nucleotide Bases

Although scanning probe microscopy (SPM) can generate images of surface topography, this class of techniques is exceptionally valuable in its ability to provide quantitative and chemically specific information about biomaterial surfaces with high spatial definition. Since engineered biomaterials are designed to deliver chemically defined information, often arrayed in specific geometries, tools that can characterize such materials are needed.A few years ago, we demonstrated how the atomic force microscope (AFM) could precisely distinguish between each of the four nucleotide bases that comprise DNA, measure the nucleotide-nucleotide force of interaction and spatially localize that information on a surface (1). in particular, we found that the nucleotide bases could self-assemble on gold. The assembly process was imaged using scanning tunneling microscopy (STM) and this led to an understanding of the structure of the assembled film. The assembled film structure was further characterized using electron spectroscopy for chemical analysis (ESCA) and secondary ion mass spectrometry (SIMS).

Optimum KOH Wet Etching of Cantilever Tip for Better Image Captured by Nanoeducator

2011 ◽  
Vol 84-85 ◽  
pp. 392-395
Author(s):  
Agus Geter Edy Sutjipto ◽  
Waleed Fekry Faris ◽  
Erry Y.T. Adesta ◽  
Hafizah Hanim
Keyword(s):  
Scanning Probe Microscopy ◽  
Atomic Scale ◽  
Scanning Probe ◽  
Scanning Tunneling ◽  
Etching Time ◽  
Atomic Force ◽  
Measuring Techniques ◽  
Quality Image ◽  
Scanning Force ◽  
Microscopy Techniques

The development of the various scanning probe microscopy techniques has revolutionized the study of surface structure up to atomic scale. Among these techniques, Nanoeducator as scanning force microscope or SFM has been developed to allow the accomplishment of various measuring techniques both for scanning tunneling microscope (STM) and non-contact atomic force microscope (AFM). However, there is no exact guidance how to fabricate cantilever to gather the good image. In order to achieve the better cantilever for students, this paper emphasizes on tip’s processing by altering etching length parameter as tip plays an important role to achieve better quality image during scanning operation. This paper also provides a guide for undergraduate student to know better about this machine as well as the principle behind it for them to acquire better quality image for their works. It was found that the number of turning of tungsten and etching time could produce good tip of cantilever. It is recommended for lecturers, students and technician to consider about turning and time of etching to produce a better tip of cantilever in Nanoeducator.

[11]Anthrahelicene on InSb(001) c(8×2): A Low-Temperature Scanning Probe Microscopy Study

ChemPhysChem ◽  
2010 ◽  
Vol 11 (16) ◽  
pp. 3522-3528 ◽  
Author(s):  
Jakub S. Prauzner-Bechcicki ◽  
Szymon Godlewski ◽  
Janusz Budzioch ◽  
Grzegorz Goryl ◽  
Lukasz Walczak ◽  
...  
Keyword(s):  
Low Temperature ◽  
Scanning Probe Microscopy ◽  
Microscopy Study ◽  
Scanning Probe ◽  
Probe Microscopy ◽  
Temperature Scanning

Atomic Scale Imaging: A Hands-On Scanning Probe Microscopy Laboratory for Undergraduates

2003 ◽  
Vol 80 (2) ◽  
pp. 194 ◽  
Author(s):  
Chuan-Jian Zhong ◽  
Li Han ◽  
Mathew M. Maye ◽  
Jin Luo ◽  
Nancy N. Kariuki ◽  
...  
Keyword(s):  
Scanning Probe Microscopy ◽  
Atomic Scale ◽  
Scanning Probe ◽  
Probe Microscopy ◽  
Hands On
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