Research on Fault Diagnosis Method Using Improved Multi-Class Classification Algorithm and Relevance Vector Machine

Author(s):  
Kun Wu ◽  
Jianshe Kang ◽  
Kuo Chi

In view of the problems in traditional fault diagnosis method, such as small samples and nonlinear relations, a fault diagnosis method based on improved multi-class classification algorithm and relevance vector machine (RVM) is proposed in the paper. Through improving the majority-vote strategy of traditional One-Against-One (OAO) algorithm and combining the features of OAO and One-Against-Rest (OAR) algorithms, the k-class classification problem is transformed into k(k-1)/2 three-class classification problems based on the proposed majority-vote strategy of double-layer and thereby an improved multi-class classification algorithm of One-Against-One-Against-Rest (OAOAR) is presented. And on each three-class classification issue, OAO and RVM as the binary classifier are adopted to achieve the multi-class classification of RVM. Numerical simulations of UCI datasets and fault diagnostic experiments results of power transformers both demonstrate that the proposed method performs significantly better than other traditional methods in terms of increasing the diagnostic accuracy, optimizing the voting results, strengthening the diagnostic confidence and identifying the hidden classes, and has more practical value in engineering.

Author(s):  
HONG CHEN ◽  
LUOQING LI ◽  
YUANYAN TANG

In many classification problems, objects should be rejected when the confidence in their classification is too low. In this paper, we consider a new classification algorithm with a reject option. Based on the majority vote strategy and plug-in rules, we provide error analysis for this algorithm in ideal and realistic settings, respectively. In addition, some discussions of semi-supervised classification are given to demonstrate our theoretical analysis.


Author(s):  
Kanae Takahashi ◽  
Kouji Yamamoto ◽  
Aya Kuchiba ◽  
Tatsuki Koyama

AbstractA binary classification problem is common in medical field, and we often use sensitivity, specificity, accuracy, negative and positive predictive values as measures of performance of a binary predictor. In computer science, a classifier is usually evaluated with precision (positive predictive value) and recall (sensitivity). As a single summary measure of a classifier’s performance, F1 score, defined as the harmonic mean of precision and recall, is widely used in the context of information retrieval and information extraction evaluation since it possesses favorable characteristics, especially when the prevalence is low. Some statistical methods for inference have been developed for the F1 score in binary classification problems; however, they have not been extended to the problem of multi-class classification. There are three types of F1 scores, and statistical properties of these F1 scores have hardly ever been discussed. We propose methods based on the large sample multivariate central limit theorem for estimating F1 scores with confidence intervals.


2012 ◽  
Vol 224 ◽  
pp. 493-496 ◽  
Author(s):  
Huai Long Wang ◽  
Qiang Pan ◽  
Hong Liu

In order to improve the speed and the rate of fault diagnosis in mixed circuit, this paper introduces a new fault diagnosis method. Through extracting fault features of current characteristics effectively and applying to Improved SVM, the ability of pattern recognition will be better than the traditional BP Neural Network and Single SVM, especially in small samples or non-linear cases. Meanwhile, this paper presents the lifting wavelet transform in order to obtain the feature information accurately. The accuracy of fault diagnosis can greatly enhance by discussing the Improved SVM combined with lifting wavelet transform in a specific monostable trigger. That points out a new direction for the fault diagnosis of mixed circuit.


Complexity ◽  
2020 ◽  
Vol 2020 ◽  
pp. 1-12
Author(s):  
Guobin Chen ◽  
Xianzhong Xie ◽  
Shijin Li

Screening and classification of characteristic genes is a complex classification problem, and the characteristic sequences of gene expression show high-dimensional characteristics. How to select an effective gene screening algorithm is the main problem to be solved by analyzing gene chips. The combination of KNN, SVM, and SVM-RFE is selected to screen complex classification problems, and a new method to solve complex classification problems is provided. In the process of gene chip pretreatment, LogFC and P value equivalents in the gene expression matrix are screened, and different gene features are screened, and then SVM-RFE algorithm is used to sort and screen genes. Firstly, the characteristics of gene chips are analyzed and the number between probes and genes is counted. Clustering analysis among each sample and PCA classification analysis of different samples are carried out. Secondly, the basic algorithms of SVM and KNN are tested, and the important indexes such as error rate and accuracy rate of the algorithms are tested to obtain the optimal parameters. Finally, the performance indexes of accuracy, precision, recall, and F1 of several complex classification algorithms are compared through the complex classification of SVM, KNN, KNN-PCA, SVM-PCA, SVM-RFE-SVM, and SVM-RFE-KNN at P=0. 01,0.05,0.001. SVM-RFE-SVM has the best classification effect and can be used as a gene chip classification algorithm to analyze the characteristics of genes.


2017 ◽  
Vol 267 ◽  
pp. 651-663 ◽  
Author(s):  
Shiming He ◽  
Long Xiao ◽  
Yalin Wang ◽  
Xinggao Liu ◽  
Chunhua Yang ◽  
...  

Mathematics ◽  
2021 ◽  
Vol 9 (18) ◽  
pp. 2215
Author(s):  
Jung-Kai Tsai ◽  
Chih-Hsing Hung

Because COVID-19 occurred in 2019, the behavioxr of humans has been changed and it will influence the business model of enterprise. Enterprise cannot predict its development according to past knowledge and experiment; so, it needs a new machine learning framework to predict enterprise performance. The goal of this research is to modify AdaBoost to reasonably predict the enterprise performance. In order to justify the usefulness of the proposed model, enterprise data will be collected and the proposed model can be used to predict the enterprise performance after COVID-19. The test data correct rate of the proposed model will be compared with some of the traditional machine learning models. Compared with the traditional AdaBoost, back propagation neural network (BPNN), regression classifier, support vector machine (SVM) and support vector regression (SVR), the proposed method possesses the better classification ability (average correct rate of the proposed method is 88.04%) in handling two classification problems. Compared with traditional AdaBoost, one-against-all SVM, one-against-one SVM, one-against-all SVR and one-against-one SVR, the classification ability of the proposed method is also relatively better for coping with the multi-class classification problem. Finally, some conclusions and future research will be discussed at the end.


Sensors ◽  
2021 ◽  
Vol 21 (24) ◽  
pp. 8168
Author(s):  
Lihao Ye ◽  
Xue Ma ◽  
Chenglin Wen

Aiming at the problem of fault diagnosis when there are only a few labeled samples in the large amount of data collected during the operation of rotating machinery, this paper proposes a fault diagnosis method based on knowledge transfer in deep learning. First, we describe the data collected during the operation as a two-dimensional image with both time and frequency-domain characteristics. Second, we transform the trained source domain model into a shallow model suitable for small samples in the target domain, and we train the shallow model with small samples with labels. Third, we input a large number of unlabeled samples into the shallow model, and the output result of the system is regarded as the label of the input sample. Fourth, we combine the original data and the data annotated by the shallow model to train the new deep CNN fault diagnosis model so as to realize the migration of knowledge from the expert system to the deep CNN. The newly built deep CNN model is used for the online fault diagnosis of rotating machinery. The FFCNN-SVM shallow model tagger method proposed in this paper compares the fault diagnosis results with other transfer learning methods at this stage, and its correct rate has been greatly improved. This method provides new ideas for future fault diagnosis under small samples.


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