Examination of the Electrolytic Polishing Metal Probe for the Cell Trap by an Electric Field

2014 ◽  
Vol 595 ◽  
pp. 56-60
Author(s):  
Yuji Sekido ◽  
Kozo Taguchi
Keyword(s):  
Electric Field ◽  
Scanning Tunneling Microscope ◽  
Low Cost ◽  
Near Field ◽  
Scanning Tunneling ◽  
Tunneling Microscope ◽  
Electrolytic Polishing ◽  
A Cell ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning

Generally, the metal probe for NSOM (Near field scanning optical microscopy) or STM (Scanning Tunneling Microscope) was made with gold or tungsten. However, they were not suitable for the cell trap in our research for the reasons of cost, hardness, etc. In our research, these problems were solved by choosing brass as a material of a probe. Since the probe production by electrolytic polishing can change the shape of the top, tip angle, and taper length etc, we can propose a probe suitable for a cell trap. Therefore, in this examination, we propose the brass probe by electrolytic polishing with low cost and sufficient hardness for cell trap.

scholarly journals Wavelength dependence of the magnetic resolution of the magneto-optical near-field scanning tunneling microscope

1998 ◽  
Vol 73 (18) ◽  
pp. 2669-2671 ◽  
Author(s):  
R. Schad ◽  
S. M. Jordan ◽  
M. J. P. Stoelinga ◽  
M. W. J. Prins ◽  
R. H. M. Groeneveld ◽  
...  
Keyword(s):  
Scanning Tunneling Microscope ◽  
Near Field ◽  
Wavelength Dependence ◽  
Scanning Tunneling ◽  
Tunneling Microscope ◽  
Near Field Scanning

Electric Field-induced switching among multiple conductance pathways in single-molecule junctions

2021 ◽  
Author(s):  
Tengyang Gao ◽  
Zhichao Pan ◽  
Zhuanyun Cai ◽  
Jueting Zheng ◽  
Chun Tang ◽  
...  
Keyword(s):  
Electric Field ◽  
Electric Fields ◽  
Single Molecule ◽  
Scanning Tunneling Microscope ◽  
Binding Sites ◽  
Scanning Tunneling ◽  
Tunneling Microscope ◽  
Field Increase ◽  
Electric Field Increase ◽  
Single Molecule Junctions

Here, we report the switching among multiple conductance pathways achieved by sliding the scanning tunneling microscope tip among different binding sites under different electric fields. With the electric field increase,...

Near-Field Enhanced Photochemistry of Single Molecules in a Scanning Tunneling Microscope Junction

Nano Letters ◽  
2017 ◽  
Vol 18 (1) ◽  
pp. 152-157 ◽  
Author(s):  
Hannes Böckmann ◽  
Sylwester Gawinkowski ◽  
Jacek Waluk ◽  
Markus B. Raschke ◽  
Martin Wolf ◽  
...  
Keyword(s):  
Scanning Tunneling Microscope ◽  
Near Field ◽  
Single Molecules ◽  
Scanning Tunneling ◽  
Tunneling Microscope

scholarly journals Nanoscale tailoring of supramolecular crystals via an oriented external electric field

Nanoscale ◽  
2020 ◽  
Vol 12 (28) ◽  
pp. 15072-15080
Author(s):  
Xingming Zeng ◽  
Sadaf Bashir Khan ◽  
Ayyaz Mahmood ◽  
Shern-Long Lee
Keyword(s):  
Phase Transition ◽  
Electric Field ◽  
External Electric Field ◽  
Chemical Reaction ◽  
Scanning Tunneling Microscope ◽  
Scanning Tunneling ◽  
Tunneling Microscope ◽  
Supramolecular Crystals

The oriented external electric field of a scanning tunneling microscope (STM) has recently been adapted for controlling the chemical reaction and supramolecular phase transition at surfaces with molecular precision.

scholarly journals Near-Field Manipulation in a Scanning Tunneling Microscope Junction with Plasmonic Fabry-Pérot Tips

Nano Letters ◽  
2019 ◽  
Vol 19 (6) ◽  
pp. 3597-3602 ◽  
Author(s):  
Hannes Böckmann ◽  
Shuyi Liu ◽  
Melanie Müller ◽  
Adnan Hammud ◽  
Martin Wolf ◽  
...  
Keyword(s):  
Scanning Tunneling Microscope ◽  
Near Field ◽  
Scanning Tunneling ◽  
Tunneling Microscope ◽  
Fabry Perot ◽  
Field Manipulation

Progress in near-field scanning optical microscopy (NSOM)

1988 ◽  
Vol 46 ◽  
pp. 436-437
Author(s):  
E. Betzig ◽  
M. Isaacson ◽  
H. Barshatzky ◽  
K. Lin ◽  
A. Lewis
Keyword(s):  
Optical Microscopy ◽  
Near Field ◽  
Visible Region ◽  
Optical Microscope ◽  
Scanning Tunneling ◽  
Far Field ◽  
Tunneling Microscopy ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning ◽  
Scanning Electron

The concept of near field scanning optical microscopy was first described more than thirty years ago1 almost two decades before the validity of the technique was verified experimentally for electromagnetic radiation of 3cm wavelength.2 The extension of the method to the visible region of the spectrum took another decade since it required the development of micropositioning and aperture fabrication on a scale five orders of magnitude smaller than that used for the microwave experiments. Since initial reports on near field optical imaging8-6, there has been a growing effort by ourselves6 and other groups7 to extend the technology and develop the near field scanning optical microscope (NSOM) into a useful tool to complement conventional (i.e., far field) scanning optical microscopy (SOM), scanning electron microscopy (SEM) and scanning tunneling microscopy. In the context of this symposium on “Microscopy Without Lenses”, NSOM can be thought of as an addition to the exploding field of scanned tip microscopy although we did not originally conceive it as such.

Scanning probe microscopy: A new technology takes off

1990 ◽  
Vol 48 (3) ◽  
pp. 959-959
Author(s):  
Virgil Elings
Keyword(s):  
Scanning Probe Microscopy ◽  
Scanning Tunneling Microscope ◽  
New Technology ◽  
Near Field ◽  
Three Dimensional ◽  
Scanning Tunneling ◽  
Thin Sample ◽  
Tunneling Microscope ◽  
Atomic Force ◽  
Electron Microscopes

With the expanding use of the scanning tunneling microscope, the technology is developing into other scanning near field microscopes, microscopes whose resolution is determined by the size of the probe, not by some wavelength. The first available “son of STM” will be the atomic force microscope (AFM), a very low force profilometer which has atomic resolution and can profile non-conducting surfaces. The hope is that this microscope may find more applications in biology than the scanning tunneling microscope (STM), which requires a conducting or very thin sample.In the past five years, the STM has progressed from curiosity to everyday lab tool, imaging surfaces with scans from a few nanometers up to 100 microns. When compared to an SEM, the STM has the advantages of higher resolution, lower cost, operation in air or liquid, real three-dimensional output, and small size. The disadvantages are smaller scan size, slower scan speeds, fewer spectroscopic functions and, of course, not as many of the nice features of the more mature electron microscopes. The AFM has similar features to the STM except that the detector and profiling tips are more complicated and more difficult to operate—disadvantages that will decrease with time.

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