Dielectric Properties of Mn, Co, and Ni-Doped LaSrFeO3 Films with Different Annealing Atmosphere

Mn, Co, and Ni-doped La0.5Sr0.5FeO3 thin films were prepared by the sol-gel technique with different annesling atmosphere. The structure and dielectric properties of the films were researched by XRD, SEM and Agilent. The study found that LSF-Mn (Co, Ni) films under the argon annealing atmosphere were have optimal dielectric properties. And Mn, Co, Ni elements are integrated into La0.5Sr0.5FeO3 lattices with the single perovskite phase. And uniform grain was distribution on the film surface.

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Structure and Dielectric Properties of Mg, Cr-Doped LaSrFeO3 Films

Applied Mechanics and Materials ◽

10.4028/www.scientific.net/amm.538.11 ◽

2014 ◽

Vol 538 ◽

pp. 11-14

Author(s):

Yang Lu Hou ◽

Xing Hua Fu ◽

Wen Hong Tao ◽

Xin Jin

Keyword(s):

Thin Film ◽

Thin Films ◽

Grain Size ◽

Dielectric Properties ◽

Perovskite Phase ◽

Sol Gel ◽

Doping Amount ◽

Single Perovskite Phase ◽

Pure Perovskite Phase ◽

Mg Doped

Mg-doped LaFeO3 thin film and Mg, Cr-doped La0.5Sr0.5FeO3 thin films were prepared by the sol-gel method. The change rules of structure and dielectric properties of the films were studied by XRD, SEM, and Agilent. The dielectric properties of La0.5Sr0.5FeO3 and LaFeO3 films were improved by the substitute with Mg and Cr. The doping amount of Mg and Cr for the optimal dielectric properties of La0.5Sr0.5FeO3 films is 45mol%, 25mol%, respectively, and for LaFeO3, the doping amount of Mg is 8mol%. The observed pure perovskite phase of the doped films suggested the dissolution of Mn, Co, and Ni in La0.5Sr0.5FeO3 crystal lattice. Mg and Cr were integrate in the lattice of LaFeO3 and La0.5Sr0.5FeO3, and mineral is single perovskite phase. The surface of the film is smooth, without cracks, surface grain size distribution and had uniform grain size.

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Structure and Dielectric Properties of Mn, Co, and Ni-Doped LaSrFeO3 Films

Key Engineering Materials ◽

10.4028/www.scientific.net/kem.575-576.499 ◽

2013 ◽

Vol 575-576 ◽

pp. 499-503

Author(s):

Bin Fu ◽

Yang Lu Hou ◽

Wei Bing Wu ◽

Xing Hua Fu

Keyword(s):

Thin Films ◽

Grain Size ◽

Dielectric Properties ◽

Smooth Surface ◽

Perovskite Phase ◽

Sol Gel ◽

Electrical Measurements ◽

Doping Amount ◽

Pure Perovskite Phase ◽

Gel Technique

Mn, Co, and Ni-doped La0.5Sr0.5FeO3thin films were prepared by the sol-gel technique. The structure and dielectric properties of the films were studied by XRD, SEM, and electrical measurements. The morphology observation demonstrated these films had uniform grain size and smooth surface. The dielectric properties of La0.5Sr0.5FeO3films were improved by the replacement of Fe with Mn, Co, and Ni. The doping amount of Mn, Co, and Ni for the optimal dielectric properties of La0.5Sr0.5FeO3films is 5%, 2%, and 3%, respectively. The observed pure perovskite phase of the doped films suggested the dissolution of Mn, Co, and Ni in La0.5Sr0.5FeO3crystal lattice.

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STRUCTURE AND DIELECTRIC PROPERTIES OF La-DOPED LEAD STRONTIUM TITANATE THIN FILMS DERIVED FROM SOL–GEL METHOD

Surface Review and Letters ◽

10.1142/s0218625x08010877 ◽

2008 ◽

Vol 15 (01n02) ◽

pp. 13-18

Author(s):

X. T. LI ◽

C. WU ◽

W. J. WENG ◽

G. R. HAN ◽

P. Y. DU

Keyword(s):

Thin Films ◽

Dielectric Properties ◽

Perovskite Phase ◽

Sol Gel ◽

Dielectric Constants ◽

X Ray Diffraction ◽

Glass Substrates ◽

Ito Glass ◽

Gel Technique ◽

La Doped

A series of ( Pb 0.4 Sr 0.6)1-x La 2x/3 TiO 3 (PSLT) thin films were deposited on ITO/glass substrates by sol–gel technique. Their phase status, surface morphology, and dielectric properties were studied by X-ray diffraction, scanning electron microscope, and impedance analyzer, respectively. Results show that the PSLT thin films were consisted of tetragonal perovskite phase PSLT thin films for x < 0.4, and cubic perovskite phase PSLT thin films for x > 0.4. Dielectric properties such as dielectric constants, dielectric tunabilitis, and inharmonic coefficient were characterized as a function of the film composition.

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Structure and Dielectric Properties of Zn Doped PST Thin Films Prepared by Sol-Gel Method

Key Engineering Materials ◽

10.4028/www.scientific.net/kem.336-338.283 ◽

2007 ◽

Vol 336-338 ◽

pp. 283-286 ◽

Cited By ~ 3

Author(s):

Zan Zheng ◽

Xiao Ting Li ◽

Gao Rong Han ◽

Wen Jian Weng ◽

Pi Yi Du

Keyword(s):

Thin Films ◽

Dielectric Properties ◽

Phase Structure ◽

Perovskite Phase ◽

Sol Gel ◽

Dip Coating ◽

In Doping ◽

Ito Glass ◽

Coating Method ◽

Dip Coating Method

(PbySr1-y)ZnxTi1-xO3-x thin films were prepared on ITO/glass substrate by sol–gel process using dip-coating method. The phase structure, morphology, and dielectric properties of thin films were investigated by XRD, SEM and impedance analyzer, respectively. The perovskite phase structure was exhibited in the Zn-doped PST thin films. The formation ability of the thin films of the perovskite phase and its grain size decreased with the increase in doping Zn. The dielectric constant of the thin film was influenced by oxygen vacancies which could be controlled by Zn doping.

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Evolution of Phase Structure and Micro-Morphologies of the La0.7M0.3MnO3 (M=Ca, Sr) Sintered at Different Temperature

Advanced Materials Research ◽

10.4028/www.scientific.net/amr.1095.402 ◽

2015 ◽

Vol 1095 ◽

pp. 402-406

Author(s):

Shao Qun Jiang ◽

Gang Wang ◽

Zong Shu Li ◽

Ze Hua Wang ◽

Ze Hua Zhou ◽

...

Keyword(s):

Phase Structure ◽

Sintering Temperature ◽

Perovskite Phase ◽

Sol Gel ◽

Obvious Effect ◽

Single Perovskite Phase ◽

Solid State Sintering ◽

Gel Technique ◽

Cubic Structure ◽

Sintering Method

The La0.7M0.3MnO3 (M=Ca, Sr) were synthesized by combining sol-gel technique and solid state sintering method. The evolutions of phase structure and micro-morphologies of the La0.7M0.3MnO3 with final sintering temperature (950-1250°C) were investigated. The results show that the La0.7Ca0.3MnO3 compounds exhibit single perovskite phase with cubic structure and the La0.7Sr0.3MnO3 compounds exhibit single perovskite phase with rhombohedra structure. The final sintering temperature has no obvious effect on the phase structure of La0.7Ca0.3MnO3. However, the density and grain size of La0.7M0.3MnO3 (M=Ca, Sr) increase with the increase of the final sintering temperature. Moreover, the micro-morphologies of La0.7Ca0.3MnO3 are more sensitive to final sintering temperature compared with that of La0.7Sr0.3MnO3. When sintering temperature is no less than 1150°C, the La0.7Ca0.3MnO3 has hardly any pore. After sintering at no less than 1250°C, the La0.7Sr0.3MnO3 becomes dense.

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Structure and Characteristics of ZrO2 Dielectric Thin Films by Sol-Gel Technique

Key Engineering Materials ◽

10.4028/www.scientific.net/kem.602-603.767 ◽

2014 ◽

Vol 602-603 ◽

pp. 767-770 ◽

Cited By ~ 1

Author(s):

Ching Fang Tseng ◽

Chiu Yun Chen ◽

Pei Wen Huang

Keyword(s):

Thin Films ◽

Dielectric Properties ◽

Annealing Temperature ◽

Substrate Surface ◽

Sol Gel ◽

Dielectric Thin Films ◽

Dielectric Characteristics ◽

Impedance Analyzer ◽

Annealing Temperatures ◽

Gel Technique

Dielectric properties and microstructures of ZrO2thin films prepared by the sol-gel method at different annealing temperatures have been investigated. All films exhibited ZrO2(111) highly orientation perpendicular to the substrate surface and the grain size increased with increasing annealing temperature. Dielectric properties of the Ag/ZrO2/Ag/Si structure were measured by using HP 4192 Impedance Analyzer and Agilent 4155 Semiconductor Parameter Analyzer. The dependence of the microstructure and dielectric characteristics on annealing temperature was also investigated.

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