Damage Constitutive Model and Failure Mechanism of Lead-Free Solder in CBGA Package
2008 ◽
Vol 44-46
◽
pp. 77-84
Keyword(s):
A viscoplastic constitutive model with void damage is developed to analyze the macroscopic mechanical response and damage mechanism of lead-free solder alloy in CBGA packaging under cyclic thermal loading. The constitutive model is implemented into ABAQUS through its user defined material subroutine. Two-dimensional nonlinear finite element analysis of a ceramic ball grid array(CBGA) package is conducted to simulate the viscoplastic deformation and damage failure process of the lead-free solder joint under cyclic thermal loading. The damage model is helpful for optimization and reliability of electronic package.
2015 ◽
Vol 2015.21
(0)
◽
pp. _20306-1_-_20306-2_
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2010 ◽
Vol 77
(18)
◽
pp. 3635-3647
◽
Keyword(s):
2005 ◽
Vol 128
(1)
◽
pp. 71-81
◽
Keyword(s):
2004 ◽
Vol 126
(3)
◽
pp. 367-373
◽
Keyword(s):
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2011 ◽
Vol 77
(780)
◽
pp. 1169-1177
◽
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2004 ◽
Vol 2004.17
(0)
◽
pp. 785-786
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