Preparation and Characterization of Glass Flake/Nano-TiO2 Compound Particle on Low Temperature

2012 ◽  
Vol 490-495 ◽  
pp. 3362-3365
Author(s):  
Yi Guo ◽  
Jun Yan ◽  
Shi Guo Du ◽  
Bin Wang ◽  
Jia Liu
Keyword(s):  
Low Temperature ◽  
Composite Particle ◽  
Film Formation ◽  
Tio2 Particle ◽  
Growth Speed ◽  
Tio2 Particles ◽  
Glass Flake ◽  
Compound Particle ◽  
Main Material

Glass flake has excellent capacity of anti-infiltration, for perfecting the bonding of resin and glass flake, Using butyl titanate as the main material, the glass flake/TiO2 composite particle doped by Sn4+ at low temperature was prepared. SEM observation indicated that TiO2 particles covered the glass flake powder surface and form nanometer/micron structure. XRD showed TiO2 particle was amorphous, the particle size was very small or just formed halfcrystal. Acidity effected the growth speed of crystal and structure of growth elementary. SnCl4 could form heterogeneous crystal to lead the TiO2 film formation.

Preparation and Characterization of TiO2 Film on Glass Flake

2013 ◽  
Vol 537 ◽  
pp. 220-223
Author(s):  
Yi Guo ◽  
Shi Guo Du ◽  
Jun Yan ◽  
Bin Wang
Keyword(s):  
Aqueous Solution ◽  
Electron Microscope ◽  
Energy Spectrum ◽  
Surface Phase ◽  
X Ray ◽  
Physical Deposition ◽  
Glass Flake ◽  
Scanning Electron ◽  
Main Material

A TiO2 film was prepared on glass flake with Ti(OBu)4 as a main material by peptization and reflux method at 80°C in acidic abundant aqueous solution. The surface topography and surface phase structure were characterized by scanning electron microscope, energy spectrum, X-ray diffractometer, X-ray photoelectron spectroscope, and the bonding strength between film and glass flake was researched by ultrasonic vibration. The results indicated that the TiO2 film, the main phase was anatase and a little rutile, coated on the glass flake uniformly. Along with growth of TiO2 on surface of glass flake, the formation maybe base on two different mechanics, at the earlier stage, TiO2 coupled surface of glass flake with Si-O-Ti chemical bond, but with physical deposition at final.

Characterization of Low Temperature SiNx Films for 3D/2.5D-IC TSV

2015 ◽  
Vol 135 (7) ◽  
pp. 733-738 ◽  
Author(s):  
Yasushi Kobayashi ◽  
Yoshihiro Nakata ◽  
Tomoji Nakamura ◽  
Mayumi B. Takeyama ◽  
Masaru Sato ◽  
...  
Keyword(s):  
Low Temperature

Low temperature acoustic characterization of PMN single crystal

2017 ◽  
Vol 122 (8) ◽  
pp. 084103 ◽  
Author(s):  
E. Smirnova ◽  
A. Sotnikov ◽  
S. Ktitorov ◽  
H. Schmidt
Keyword(s):  
Low Temperature ◽  
Single Crystal ◽  
Acoustic Characterization
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