Properties of Low-Dimentional Polysilicon in SOI Structures for Low Temperature Sensors
2013 ◽
Vol 854
◽
pp. 49-55
◽
Keyword(s):
The low temperature studies of SOI-structures have been carried out in a temperature range of 4.2÷300K at magnetic fields up to 14T. The samples with initial boron concentration of about 2.41018сm-3 have been investigated. The results of the studies of SOI-structure conductance at low temperatures in the range of hopping conductance and a possibility to use this material in sensors are analyzed.
1897 ◽
Vol 60
(359-367)
◽
pp. 425-432
◽
1999 ◽
Vol 13
(29n31)
◽
pp. 3786-3791
◽
2002 ◽
Vol 16
(20n22)
◽
pp. 3216-3219
◽
1968 ◽
Vol 303
(1475)
◽
pp. 525-529
◽
2001 ◽
Vol 15
(09n10)
◽
pp. 319-322
◽
1975 ◽
Vol 30
(12)
◽
pp. 1783-1784
◽
Keyword(s):
Keyword(s):
2001 ◽
Vol 11
(3)
◽
pp. 187-194
◽
Keyword(s):