On the Rapid Generation of Complete XRF Spectra for Material Analysis from Fundamental Parameters

2021 ◽  
Vol 105 ◽  
pp. 110-118
Author(s):  
Jie Si Ma ◽  
Fu Sheng Li ◽  
Yan Chun Zhao
Keyword(s):  
Simulated Data ◽  
Target Material ◽  
Mcnp Code ◽  
X Ray ◽  
Fundamental Parameters ◽  
Elemental Compositions ◽  
Statistical Precision ◽  
Proposed Model ◽  
Time Calculation ◽  
Rapid Generation

X-ray Fluorescence (XRF) analysis technology is used widely to detect and measure elemental compositions of target samples. The MCNP code developed by LANL can be utilized to simulate and generate the XRF spectrum of any sample with various elemental compositions. However, one shortcoming of MCNP code is that it takes quite a lot of time (in hours or longer) to generate one XRF spectrum with reasonable statistical precision; the other shortcoming is that MCNP code cannot produce L shell spectrum accurately. In this paper, a new computation model based on the Sherman equation (i.e., Fundamental Parameters, FP) is proposed to overcome the drawbacks of the MCNP code. The most important feature of this model is to achieve a full and accurate generation of spectral information of each element in a target material very rapidly (in seconds or less), including both K and L shell spectral peaks. Furtherly, it is demonstrated that the simulated data by this new mode match the experimental data very well. It proves that the proposed model can be a better alternative of MCNP code in the application of generation the XRF spectra of many materials, in terms of speed and accuracy. The proposed model can perform the simulation of XRF spectra in situ both fast and accurately, which is essential for real-time calculation of chemical composition by use of X-ray spectrometer, especially for those trace elements in target materials.

Contribution of x-ray total reflection to the background intensity in EPMA

1990 ◽  
Vol 48 (2) ◽  
pp. 202-203
Author(s):  
Werner P. Rehbach ◽  
Peter Karduck
Keyword(s):  
Atomic Number ◽  
Target Material ◽  
Total Reflection ◽  
Background Intensity ◽  
X Rays ◽  
Characteristic Radiation ◽  
X Ray

In the EPMA of soft x rays anomalies in the background are found for several elements. In the literature extremely high backgrounds in the region of the OKα line are reported for C, Al, Si, Mo, and Zr. We found the same effect also for Boron (Fig. 1). For small glancing angles θ, the background measured using a LdSte crystal is significantly higher for B compared with BN and C, although the latter are of higher atomic number. It would be expected, that , characteristic radiation missing, the background IB (bremsstrahlung) is proportional Zn by variation of the atomic number of the target material. According to Kramers n has the value of unity, whereas Rao-Sahib and Wittry proposed values between 1.12 and 1.38 , depending on Z, E and Eo. In all cases IB should increase with increasing atomic number Z. The measured values are in discrepancy with the expected ones.

Sorption of Se (IV) from aqueous solutions with subsequent determination by X-ray fluorescence analysis

2020 ◽  
Vol 86 (10) ◽  
pp. 5-9
Author(s):  
D. G. Filatova ◽  
A. A. Arkhipenko ◽  
M. A. Statkus ◽  
V. V. Es’kina ◽  
V. B. Baranovskaya ◽  
...  
Keyword(s):  
Inductively Coupled Plasma ◽  
Fluorescence Analysis ◽  
Standard Samples ◽  
Phase Contact Time ◽  
Sorbent Phase ◽  
X Ray ◽  
Fundamental Parameters ◽  
Inductively Coupled ◽  
Subsequent Determination

An approach to sorptive separation of Se (IV) from solutions on a novel S,N-containing sorbent with subsequent determination of the analyte in the sorbent phase by micro-x-ray fluorescence method is presented. The sorbent copolymethylenesulfide-N-alkyl-methylenamine (CMA) was synthesized using «snake in the cage» procedure and proven to be stable in acid solutions. Conditions for quantitative extraction of Se (IV) were determined: sorption in 5 M HCl or 0.05 M HNO3 solutions when heated to 60°C, phase contact time being 1 h. The residual selenium content in the solution was determined by inductively coupled plasma mass spectrometry (ICP-MS) using 82Se isotope. The absence of selenium losses is proved and the mechanism of sorption interaction under specified conditions is proposed. The method of micro-x-ray fluorescence analysis (micro-RFA) with mapping revealed a uniform distribution of selenium on the sorbent surface. The possibility of determining selenium in the sorbent phase by micro-RFA is shown. When comparing the obtained results with the results of calculations by the method of fundamental parameters, it is shown the necessity of using standard samples of sorbates to obtain correct results of RFA determination of selenium in the sorbent phase.

scholarly journals Complete Ring Artifacts Reduction Procedure for Lab-Based X-ray Nano CT Systems

Sensors ◽  
2021 ◽  
Vol 21 (1) ◽  
pp. 238
Author(s):  
Jakub Šalplachta ◽  
Tomáš Zikmund ◽  
Marek Zemek ◽  
Adam Břínek ◽  
Yoshihiro Takeda ◽  
...  
Keyword(s):  
High Efficiency ◽  
Image Inpainting ◽  
Simulated Data ◽  
Complementary Metal Oxide Semiconductor ◽  
Oxide Semiconductor ◽  
Detection Accuracy ◽  
Reduction Procedure ◽  
X Ray ◽  
Artifacts Reduction ◽  
Ct Data

In this article, we introduce a new ring artifacts reduction procedure that combines several ideas from existing methods into one complex and robust approach with a goal to overcome their individual weaknesses and limitations. The procedure differentiates two types of ring artifacts according to their cause and character in computed tomography (CT) data. Each type is then addressed separately in the sinogram domain. The novel iterative schemes based on relative total variations (RTV) were integrated to detect the artifacts. The correction process uses the image inpainting, and the intensity deviations smoothing method. The procedure was implemented in scope of lab-based X-ray nano CT with detection systems based on charge-coupled device (CCD) and scientific complementary metal–oxide–semiconductor (sCMOS) technologies. The procedure was then further tested and optimized on the simulated data and the real CT data of selected samples with different compositions. The performance of the procedure was quantitatively evaluated in terms of the artifacts’ detection accuracy, the comparison with existing methods, and the ability to preserve spatial resolution. The results show a high efficiency of ring removal and the preservation of the original sample’s structure.

Messages of Oscillatory Correlograms: A Spike Train Model

2008 ◽  
Vol 20 (5) ◽  
pp. 1211-1238 ◽  
Author(s):  
Gaby Schneider
Keyword(s):  
Spike Train ◽  
Null Model ◽  
Simulated Data ◽  
Joint Analysis ◽  
Data Set ◽  
Proposed Model ◽  
Peak Asymmetry ◽  
Millisecond Range ◽  
Temporal Interactions ◽  
Underlying Processes

Oscillatory correlograms are widely used to study neuronal activity that shows a joint periodic rhythm. In most cases, the statistical analysis of cross-correlation histograms (CCH) features is based on the null model of independent processes, and the resulting conclusions about the underlying processes remain qualitative. Therefore, we propose a spike train model for synchronous oscillatory firing activity that directly links characteristics of the CCH to parameters of the underlying processes. The model focuses particularly on asymmetric central peaks, which differ in slope and width on the two sides. Asymmetric peaks can be associated with phase offsets in the (sub-) millisecond range. These spatiotemporal firing patterns can be highly consistent across units yet invisible in the underlying processes. The proposed model includes a single temporal parameter that accounts for this peak asymmetry. The model provides approaches for the analysis of oscillatory correlograms, taking into account dependencies and nonstationarities in the underlying processes. In particular, the auto- and the cross-correlogram can be investigated in a joint analysis because they depend on the same spike train parameters. Particular temporal interactions such as the degree to which different units synchronize in a common oscillatory rhythm can also be investigated. The analysis is demonstrated by application to a simulated data set.

A Standards-Based Method to Determine Elemental Compositions using Energy Dispersive X-Ray Spectrometry for Compound Semiconductors

2012 ◽  
Vol 18 (S2) ◽  
pp. 1046-1047 ◽  
Author(s):  
M. Rathi ◽  
P. Ahrenkiel ◽  
J. Carapella ◽  
M. Wanlass
Keyword(s):  
Compound Semiconductors ◽  
Energy Dispersive ◽  
X Ray ◽  
Elemental Compositions

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

ANALYSIS OF SOLDERS ON TIN AND LEAD BASES BY X-RAY FLOORESCENT SPECTROSCOPY

2021 ◽  
pp. 124-131
Author(s):  
A.V. Alekseev ◽  
◽  
G.V. Orlov ◽  
P.S. Petrov ◽  
A.V. Slavin ◽  
...  
Keyword(s):  
Emission Spectroscopy ◽  
High Resolution Mass Spectrometry ◽  
Analytical Signal ◽  
Atomic Emission ◽  
Standard Samples ◽  
X Ray ◽  
Fundamental Parameters ◽  
The Matrix ◽  
Resolution Mass

The determination of the elements Cu, Ni, Sb, Bi, Pb, Zn and Fe in the tin-based solder VPr35, as well as the elements Sn, Ni, Sb, Bi and In in the lead-based VPr40 solder by the method of х-ray fluorescence spectroscopy has been carried out. The calibration dependences are corrected taking into account the superposition of signals from interfering elements on the analytical signal and changes in intensity caused by inter-element influences in the matrix. The analysis was carried out by the method of fundamental parameters without using standard samples. The correctness of the results obtained was confirmed by their comparative analysis by atomic emission spectroscopy and high-resolution mass spectrometry with a glow discharge.

Analysis of steels by energy dispersive x-ray fluorescence with fundamental parameters

1982 ◽  
Vol 54 (11) ◽  
pp. 1782-1786 ◽  
Author(s):  
Kirk K. Nielson ◽  
Ronald W. Sanders ◽  
John C. Evans
Keyword(s):  
Energy Dispersive ◽  
X Ray ◽  
Fundamental Parameters

scholarly journals Microfocus X-ray Tubes

2021 ◽  
Vol 24 (5) ◽  
pp. 6-21
Author(s):  
V. B. Bessonov
Keyword(s):  
High Resolution ◽  
Nondestructive Testing ◽  
Target Material ◽  
Lanthanum Hexaboride ◽  
High Tech ◽  
Original Design ◽  
X Ray ◽  
Cathode Assembly ◽  
Radiation Sources ◽  
Key Features

Introduction. X-ray inspection plays a unique role among all nondestructive testing methods for products and materials due to sufficiently high resolution and high penetrability. The present study is designed to consider the key features of microfocus X-ray sources, their areas of application, and main technical characteristics.Aim. The paper aims to systematize information and review modern X-ray radiation sources for the implementation of microfocus radiography.Materials and methods. The main designs of microfocus X-ray tubes (soldered and demountable) were considered relying on the experience of the St Petersburg State Electrotechnical University in developing and operating such equipment, as well as the experience and open-access publications of foreign researchers and developers. Data collected by leading research teams over the last ten years were analyzed.Results. The paper presents design features for each main type of microfocus X-ray tubes – soldered and demountable. All key structural elements are considered: an anode assembly, a cathode assembly, and a focusing system. The influence of anode target material on the X-ray tube radiation spectrum is shown. An original design of a liquid-anode microfocus X-ray tube is described to demonstrate its key features and advantages. In addition, the paper gives an overview of cathodes used in microfocus X-ray tubes (tungsten cathode and lanthanum hexaboride cathode), as well as providing a detailed description of calculations performed for focusing systems. Finally, the designs of modern X-ray tubes are presented.Conclusion. Modern X-ray tubes are high-tech products that allow for high-resolution research of various objects. The main advantage of testing performed with the use of X-ray tubes consists in high resolution (micron and submicron). The X-ray images of test objects used to determine their spatial resolution are given, which clearly illustrate the vast possibilities of this technology. In addition, ways to improve microfocus X-ray tubes are briefly discussed. The considered materials can be useful in selecting a nondestructive testing tool, as well as in developing and creating X-ray systems on the basis of microfocus X-ray tubes.

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