Characterization of Intermetallic Layer with Nanoresolution Using X-Ray Standing Wave Technique

X-ray standing wave technique has been used to measure the kinetics of CoSi intermetallic phase growth in a-Si/Co/a-Si sandwich structure. The a-Si/Co/a-Si arrangement were placed into a waveguide structure formed by two Ta films. X-ray fluorescence and extended X-ray absorption fine structure analysis has been used in a combination with X-ray standing wave technique for depth profiling with sub-nanometer resolution of specimens annealed at 493K for different annealing time. The position and the thickness of the growing CoSi intermetallic phase have been monitored.

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X-ray standing wave technique with spatial resolution: In-plane characterization of surfaces and interfaces by full-field x-ray fluorescence imaging

Physical Review Materials ◽

10.1103/physrevmaterials.3.023802 ◽

2019 ◽

Vol 3 (2) ◽

Cited By ~ 2

Author(s):

Wenyang Zhao ◽

Kenji Sakurai

Keyword(s):

Fluorescence Imaging ◽

Standing Wave ◽

Spatial Resolution ◽

Full Field ◽

X Ray ◽

Surfaces And Interfaces ◽

Wave Technique

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EXELFS Studies of Carbon Fibers

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100133953 ◽

1990 ◽

Vol 48 (2) ◽

pp. 72-73

Author(s):

V. Serin ◽

K. Hssein ◽

G. Zanchi ◽

J. Sévely

Keyword(s):

Carbon Fibers ◽

Energy Analysis ◽

Electron Excitation ◽

Complex Structures ◽

High Modulus ◽

Promising Technique ◽

X Ray ◽

Fine Structures ◽

X Ray Absorption

The present developments of electron energy analysis in the microscopes by E.E.L.S. allow an accurate recording of the spectra and of their different complex structures associated with the inner shell electron excitation by the incident electrons (1). Among these structures, the Extended Energy Loss Fine Structures (EXELFS) are of particular interest. They are equivalent to the well known EXAFS oscillations in X-ray absorption spectroscopy. Due to the EELS characteristic, the Fourier analysis of EXELFS oscillations appears as a promising technique for the characterization of composite materials, the major constituents of which are low Z elements. Using EXELFS, we have developed a microstructural study of carbon fibers. This analysis concerns the carbon K edge, which appears in the spectra at 285 eV. The purpose of the paper is to compare the local short range order, determined by this way in the case of Courtauld HTS and P100 ex-polyacrylonitrile carbon fibers, which are high tensile strength (HTS) and high modulus (HM) fibers respectively.

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Redox Energetics and Kinetics of Water Oxidation in Neutral versus Alkaline Electrolyte: an In-Operando Time-Resolved X-Ray Absorption Study

10.29363/nanoge.ngfm.2019.245 ◽

2019 ◽

Author(s):

Chiara Pasquini ◽

Holger Dau

Keyword(s):

Water Oxidation ◽

Alkaline Electrolyte ◽

Absorption Study ◽

Time Resolved ◽

X Ray ◽

In Operando ◽

X Ray Absorption ◽

Kinetics Of

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Database of ab initio L-edge X-ray absorption near edge structure

Scientific Data ◽

10.1038/s41597-021-00936-5 ◽

2021 ◽

Vol 8 (1) ◽

Author(s):

Yiming Chen ◽

Chi Chen ◽

Chen Zheng ◽

Shyam Dwaraknath ◽

Matthew K. Horton ◽

...

Keyword(s):

High Throughput ◽

Scattering Theory ◽

Research Community ◽

Metal Compounds ◽

Edge Structure ◽

X Ray ◽

Initial Release ◽

Computational Workflow ◽

X Ray Absorption

AbstractThe L-edge X-ray Absorption Near Edge Structure (XANES) is widely used in the characterization of transition metal compounds. Here, we report the development of a database of computed L-edge XANES using the multiple scattering theory-based FEFF9 code. The initial release of the database contains more than 140,000 L-edge spectra for more than 22,000 structures generated using a high-throughput computational workflow. The data is disseminated through the Materials Project and addresses a critical need for L-edge XANES spectra among the research community.

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Characterization of Silver Binding in Cryptomelane by X-ray Absorption Spectroscopy

MRS Proceedings ◽

10.1557/proc-524-353 ◽

1998 ◽

Vol 524 ◽

Cited By ~ 4

Author(s):

R. Ravikumar ◽

D. W. Fuerstenau ◽

G. A. Waychunas

Keyword(s):

Manganese Oxide ◽

Silver Ions ◽

Oxide Phase ◽

Synthetic Sample ◽

Temperature Spectrum ◽

X Ray ◽

Room Temperature Sample ◽

X Ray Absorption ◽

Temperature Sample

ABSTRACTUsing silver K-edge extended X-ray absorption fine structure (EXAFS) spectroscopy, two different samples of silver-containing manganese oxide were analyzed in the fluorescence mode. For the first sample, silver ions from solution were sorbed onto one synthetic manganese oxide phase, namely cryptomelane (KxMn8O16, where l<x<2). The second sample was a silvermanganese oxide from Colorado. From the EXAFS analysis, silver was found to occupy two different sites in the synthetic sample. The natural samples from Colorado also exhibited a very similar coordination distances as the synthetic samples. In the low temperature spectrum of the synthetic sample at 10 K, the Ag-O peak was found to be missing and the amplitude of the Ag- Ag peak was approximately three times larger than the corresponding room temperature sample.

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