Comparison of High-Voltage 4H-SiC Insulated-Gate Bipolar Transistor (IGBT) and MOS-Gated Bipolar Transistor (MGT)

2005 ◽  
Vol 483-485 ◽  
pp. 917-920 ◽  
Author(s):  
Lin Zhu ◽  
S. Balachandran ◽  
T. Paul Chow

In this paper, the performance of high-voltage (10kV) 4H-SiC n- and p-channel IGBTs and n-channel MOS-Gated Bipolar Transistor (MGT) are investigated and compared using 2- dimensional numerical simulations. We have found that the MGT in SiC is not suitable for applications at high blocking voltages and the p-channel IGBT is a better choice because of a much higher conductivity modulation in the drift region.

2012 ◽  
Vol 717-720 ◽  
pp. 1139-1142 ◽  
Author(s):  
Kalyani G. Menon ◽  
Luther King Ngwendson ◽  
Akira Nakajima ◽  
Ekkanath Madathil Sankara Narayanan ◽  
Graham P. Bruce

The performance of a 12kV planar Clustered Insulated Gate Bipolar Transistor (CIGBT) is compared to an equivalent IGBT in 4H-SiC through extensive 2D numerical simulations. The CIGBT shows 40% reduction in Eoff-Vce(sat) trade off losses with a short circuit endurance time of more than 10µs.


2020 ◽  
Vol 35 (11) ◽  
pp. 11LT01
Author(s):  
Yishang Zhao ◽  
Zehong Li ◽  
Xin Peng ◽  
Yang Yang ◽  
Xiao Zeng ◽  
...  

2013 ◽  
Vol 22 (2) ◽  
pp. 027303 ◽  
Author(s):  
Xiao-Rong Luo ◽  
Qi Wang ◽  
Guo-Liang Yao ◽  
Yuan-Gang Wang ◽  
Tian-Fei Lei ◽  
...  

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