scholarly journals Photoluminescence and X-Ray Diffraction Properties of Europium and Silver Co-Doped Tantalum-Oxide Thin Films Deposited by Co-Sputtering

2017 ◽  
Vol 05 (02) ◽  
pp. 35-40
Author(s):  
Keisuke Shimada ◽  
Kenta Miura ◽  
Ryosuke Fujii ◽  
Masahiro Kanakubo ◽  
Wataru Kada ◽  
...  
Keyword(s):  
Thin Films ◽  
Tantalum Oxide ◽  
X Ray Diffraction ◽  
Oxide Thin Films ◽  
X Ray ◽  
Co Doped

Photoluminescence Properties of Yb and Ag Co-Doped Ta2O5 Thin Films

2018 ◽  
Vol 790 ◽  
pp. 43-47
Author(s):  
Masahiro Kanakubo ◽  
Kenta Miura ◽  
Keisuke Shimada ◽  
Ryosuke Fujii ◽  
Katsuya Noguchi ◽  
...  
Keyword(s):  
Thin Films ◽  
Real Time ◽  
Human Body ◽  
Tantalum Oxide ◽  
Photoluminescence Properties ◽  
X Ray Diffraction ◽  
Crystalline Phases ◽  
X Ray ◽  
Ag Doping ◽  
Co Doped

We prepared ytterbium and silver co-doped tantalum-oxide (Ta2O5:Yb,Ag) thin films using a simple co-sputtering method and evaluated photoluminescence (PL) properties of the films after annealing. We found that a PL peak at a wavelength of 980 nm due to Yb3+ can be strongly enhanced by Ag doping. From X-ray diffraction measurements, we found that Ag2Ta8O21 and orthorhombic Ta2O5 crystalline phases are very important in order to enhance the 980-nm peak observed from our Ta2O5:Yb,Ag thin films. Because of the human-body transmittability of the 980-nm wavelength, such films are applicable to a novel real-time X-ray dosimeter system.

scholarly journals Characterization of superconducting oxide thin films by X-ray diffraction.

1990 ◽  
Vol 37 (1) ◽  
pp. 141-144
Author(s):  
Tsunekazu Iwata ◽  
Akihiko Yamaji ◽  
Youichi Enomoto
Keyword(s):  
Thin Films ◽  
X Ray Diffraction ◽  
Oxide Thin Films ◽  
X Ray

scholarly journals Fabrication of Erbium and Ytterbium Co-Doped Tantalum-Oxide Thin Films Using Radio-Frequency Co-Sputtering

2015 ◽  
Vol 06 (05) ◽  
pp. 343-347 ◽  
Author(s):  
Kenta Miura ◽  
Yuki Arai ◽  
Kazusa Kano ◽  
Osamu Hanaizumi
Keyword(s):  
Thin Films ◽  
Radio Frequency ◽  
Tantalum Oxide ◽  
Oxide Thin Films ◽  
Co Doped

scholarly journals High-resolution X-ray diffraction analysis of strain relaxation in epitaxial oxide thin films

2008 ◽  
Vol 64 (a1) ◽  
pp. C106-C106
Author(s):  
R. Guinebretiere ◽  
F. Conchon ◽  
A. Boulle ◽  
C. Girardot ◽  
S. Pignard ◽  
...  
Keyword(s):  
Thin Films ◽  
High Resolution ◽  
Diffraction Analysis ◽  
Strain Relaxation ◽  
X Ray Diffraction ◽  
Oxide Thin Films ◽  
X Ray ◽  
Epitaxial Oxide
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