Characterization of Large Thin Film Membrane Dynamic Behavior with UAI-NASTRAN Finite Element Solver

A novel hyperelastic thin film NiTi covered neurovascular microstent was developed for treating wide-neck and fusiform neurovascular aneurysms. This device requires 300–500% recoverable elongation for both collapsing and deployment. Nonlinear buckling and static analysis of Finite Element Modeling (FEM: ANSYS software used) was applied for obtaining critical buckling stress and critical strain values depending on thickness, strut width and pore height. A maximum theoretical critical strain for one geometry as high as 316% while a different experimentally tested film was found to strain 600% elastically without any signs of permanent deformation.

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Correlation Improvement Between Theoretical and Experimental Results of PZT Thin-Film Membrane Actuators

Volume 6: ASME Power Transmission and Gearing Conference; 3rd International Conference on Micro- and Nanosystems; 11th International Conference on Advanced Vehicle and Tire Technologies ◽

10.1115/detc2009-86344 ◽

2009 ◽

Cited By ~ 1

Author(s):

Cheng-Chun Lee ◽

G. Z. Cao ◽

I. Y. Shen

Keyword(s):

Thin Film ◽

Finite Element ◽

Residual Stresses ◽

Finite Element Model ◽

Element Model ◽

Experimental Results ◽

Pzt Thin Film ◽

Thin Film Membrane ◽

The Finite Element Model ◽

Membrane Actuators

This paper is to study actuation displacement of a Lead Zirconate Titanate (PbZrxTi1−xO3 or PZT) thin-film membrane actuator via finite element modeling and laser-Doppler measurements. In particular, this paper is to identify possible parameters that could cause discrepancies between the finite element predictions and experimental measurements. A twofold approach is used. First, we conduct additional experiments to measure actuator dimensions, which are subsequently used as input to the finite element model. We also measure natural frequencies of the membrane actuators to compare with the finite element predictions in addition to the actuator displacement. Second, we have conducted a parametric study via the finite element model to identify possible parameters that could cause the discrepancies. Parameters varied include dimensions, material properties, residual stresses and linearity of the PZT thin-film membrane actuator. Simulation results indicate that the residual stresses are the most probable cause of the discrepancy between the theoretical predictions and the experimental results.

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Characterization of Y-Ba-Cu-O films grown on silicon substrates by sequential evaporation

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100106399 ◽

1988 ◽

Vol 46 ◽

pp. 866-867

Author(s):

E. L. Hall ◽

A. Mogro-Campero ◽

L. G. Turner ◽

N. Lewis

Keyword(s):

Thin Film ◽

Thin Film Deposition ◽

Superconducting Films ◽

Electron Beam Evaporation ◽

Film Deposition ◽

Silicon Substrates ◽

Superconducting Properties ◽

Sequential Electron ◽

Thin Superconducting Films

There is great interest in the growth of thin superconducting films of YBa2Cu3Ox on silicon, since this is a necessary first step in the use of this superconductor in a variety of possible electronic applications including interconnects and hybrid semiconductor/superconductor devices. However, initial experiments in this area showed that drastic interdiffusion of Si into the superconductor occurred during annealing if the Y-Ba-Cu-O was deposited direcdy on Si or SiO2, and this interdiffusion destroyed the superconducting properties. This paper describes the results of the use of a zirconia buffer layer as a diffusion barrier in the growth of thin YBa2Cu3Ox films on Si. A more complete description of the growth and characterization of these films will be published elsewhere.Thin film deposition was carried out by sequential electron beam evaporation in vacuum onto clean or oxidized single crystal Si wafers. The first layer evaporated was 0.4 μm of zirconia.

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Microstructural and fractographic characterization of B4C-Al cermets tested under dynamic and static loading

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100154780 ◽

1989 ◽

Vol 47 ◽

pp. 562-563

Author(s):

Gyeung Ho Kim ◽

Mehmet Sarikaya ◽

D. L. Milius ◽

I. A. Aksay

Keyword(s):

Thin Film ◽

Mechanical Properties ◽

Fracture Toughness ◽

Static Loading ◽

Carbon Deposition ◽

Full Density ◽

Unique Combination ◽

Strong Component ◽

Reaction Products

Cermets are designed to optimize the mechanical properties of ceramics (hard and strong component) and metals (ductile and tough component) into one system. However, the processing of such systems is a problem in obtaining fully dense composite without deleterious reaction products. In the lightweight (2.65 g/cc) B4C-Al cermet, many of the processing problems have been circumvented. It is now possible to process fully dense B4C-Al cermet with tailored microstructures and achieve unique combination of mechanical properties (fracture strength of over 600 MPa and fracture toughness of 12 MPa-m1/2). In this paper, microstructure and fractography of B4C-Al cermets, tested under dynamic and static loading conditions, are described.The cermet is prepared by infiltration of Al at 1150°C into partially sintered B4C compact under vacuum to full density. Fracture surface replicas were prepared by using cellulose acetate and thin-film carbon deposition. Samples were observed with a Philips 3000 at 100 kV.

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