Ge0.83Sn0.17 P-Channel Metal-Oxide-Semiconductor Field- Effect Transistors: Impact of Sulfur Passivation on Gate Stack Quality
2016 ◽
Vol 119
(2)
◽
pp. 024502
◽
Dian Lei
◽
Wei Wang
◽
Zheng Zhang
◽
Jisheng Pan
◽
Xiao Gong
◽
...
2015 ◽
Vol 36
(7)
◽
pp. 672-674
◽
Tae-Woo Kim
◽
Hyuk-Min Kwon
◽
Seung Heon Shin
◽
Chan-Soo Shin
◽
Won-Kyu Park
◽
...
2013 ◽
Vol 103
(12)
◽
pp. 122106
◽
Keisuke Yamamoto
◽
Takahiro Sada
◽
Dong Wang
◽
Hiroshi Nakashima
2007 ◽
Vol 46
(4B)
◽
pp. 1921-1928
◽
Takeo Matsuki
◽
Seiji Inumiya
◽
Nobuyuki Mise
◽
Takahisa Eimori
◽
Yasuo Nara
2015 ◽
Vol 36
(3)
◽
pp. 223-225
◽
Tae-Woo Kim
◽
Dong-Hyi Koh
◽
Chan-Soo Shin
◽
Won-Kyu Park
◽
Tommaso Orzali
◽
...
2007 ◽
Vol 90
(23)
◽
pp. 233505
Shih-Chang Chen
◽
Chao-Hsin Chien
◽
Jen-Chung Lou
2008 ◽
Vol 92
(16)
◽
pp. 163508
◽
Debabrata Maji
◽
Felice Crupi
◽
Gino Giusi
◽
Calogero Pace
◽
Eddy Simoen
◽
...
2015 ◽
Vol 107
(25)
◽
pp. 252104
◽
Takuji Hosoi
◽
Yuya Minoura
◽
Ryohei Asahara
◽
Hiroshi Oka
◽
Takayoshi Shimura
◽
...
2010 ◽
Vol 97
(2)
◽
pp. 023501
◽
Chang Seo Park
◽
Muhamad M. Hussain
◽
Gennadi Bersuker
◽
Paul D. Kirsch
◽
Raj Jammy
2012 ◽
Vol 51
◽
pp. 076504
Takashi Ishigaki
◽
Ryuta Tsuchiya
◽
Yusuke Morita
◽
Nobuyuki Sugii
◽
Shinichiro Kimura
◽
...