Analysis of Microstructure for Resistance Spot Welded TRIP Steels using Atomic Force Microscope

Abstract This research investigates the effect of SiC wt% on mechanical and microstructure behavior of transformation induced plasticity (TRIP) 780 steels by resistance spot welding. The resistance spot welded samples were characterized for their properties such as hardness, tensile shear, scanning electron microscope, X-ray diffraction, ductility ratio and elongation. Results showed that the width of the nugget was closely associated with shear failure of the spot welds. X-ray diffraction analysis illustrated that the weld steels chemical composition improved in the heat-affected zones and retained austenite detected due to the influence of Si and C. Sample 4 microstructure exposed the equiaxed dimple and finer dendrites in the fusion zone. It also exhibited maximum force and fracture energy. Nano hardness was significantly decreased in the fusion zone of sample 4 due to the interface among micro alloying elements and the formation of nonmetallic presences that affected the TRIP steel hardness. Low ductility ratios were observed in steel 4 than the other weld steels due to higher tensile shear strength (TSS) and cross-tension strength (CTS) results. Fracture analysis exhibited ductile fracture with dimples and dendrites in the TRIP steels surface. The spot-welded samples mechanical properties are correlated to chemical elements, mainly Si existing in casted TRIP steels through the cooling phase of the resistance spot welding process.

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Characterization of Partial Interfacial Fracture on Resistance Spot-Welded TRIP Steels for Automotive Applications

Korean Journal of Metals and Materials ◽

10.3365/kjmm.2012.50.2.136 ◽

2012 ◽

Vol 50 (2) ◽

pp. 136-145 ◽

Cited By ~ 7

Keyword(s):

Interfacial Fracture ◽

Automotive Applications ◽

Trip Steels ◽

Resistance Spot ◽

Spot Welded

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Characterization of resistance spot welded transformation induced plasticity (TRIP) steels with different silicon and carbon contents

Journal of Manufacturing Processes ◽

10.1016/j.jmapro.2018.02.005 ◽

2018 ◽

Vol 32 ◽

pp. 307-317 ◽

Cited By ~ 5

Author(s):

V.H. Vargas ◽

I. Mejía ◽

V.H. Baltazar-Hernández ◽

C. Maldonado

Keyword(s):

Transformation Induced Plasticity ◽

Trip Steels ◽

Resistance Spot ◽

Spot Welded

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Characterization of photosystem II with the atomic-force microscope

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100130365 ◽

1992 ◽

Vol 50 (2) ◽

pp. 1146-1147

Author(s):

Kathleen M. Marr ◽

Mary K. Lyon

Keyword(s):

Photosystem Ii ◽

Atomic Force Microscope ◽

Three Dimensional ◽

Biologically Active ◽

Atomic Force ◽

Freeze Etching ◽

Image Averaging ◽

Oxygen Evolving ◽

Averaging Techniques

Photosystem II (PSII) is different from all other reaction centers in that it splits water to evolve oxygen and hydrogen ions. This unique ability to evolve oxygen is partly due to three oxygen evolving polypeptides (OEPs) associated with the PSII complex. Freeze etching on grana derived insideout membranes revealed that the OEPs contribute to the observed tetrameric nature of the PSIl particle; when the OEPs are removed, a distinct dimer emerges. Thus, the surface of the PSII complex changes dramatically upon removal of these polypeptides. The atomic force microscope (AFM) is ideal for examining surface topography. The instrument provides a topographical view of individual PSII complexes, giving relatively high resolution three-dimensional information without image averaging techniques. In addition, the use of a fluid cell allows a biologically active sample to be maintained under fully hydrated and physiologically buffered conditions. The OEPs associated with PSII may be sequentially removed, thereby changing the surface of the complex by one polypeptide at a time.

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Imaging polymers, proteins and dna in aqueous solutions with the atomic force microscope

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100152136 ◽

1989 ◽

Vol 47 ◽

pp. 32-33

Author(s):

S.A.C. Gould ◽

B. Drake ◽

C.B. Prater ◽

A.L. Weisenhorn ◽

S.M. Lindsay ◽

...

Keyword(s):

Amino Acids ◽

Dna Sequencing ◽

Aqueous Solutions ◽

Atomic Force Microscope ◽

Piezoelectric Crystal ◽

Atomic Force ◽

Structure Of Molecules ◽

Optical Lever

The atomic force microscope (AFM) is an instrument that can be used to image many samples of interest in biology and medicine. Images of polymerized amino acids, polyalanine and polyphenylalanine demonstrate the potential of the AFM for revealing the structure of molecules. Images of the protein fibrinogen which agree with TEM images demonstrate that the AFM can provide topographical data on larger molecules. Finally, images of DNA suggest the AFM may soon provide an easier and faster technique for DNA sequencing.The AFM consists of a microfabricated SiO2 triangular shaped cantilever with a diamond tip affixed at the elbow to act as a probe. The sample is mounted on a electronically driven piezoelectric crystal. It is then placed in contact with the tip and scanned. The topography of the surface causes minute deflections in the 100 μm long cantilever which are detected using an optical lever.

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The atomic-force microscope and its future in biology

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100149350 ◽

1993 ◽

Vol 51 ◽

pp. 704-705

Author(s):

Jean-Paul Revel

Keyword(s):

Silicon Nitride ◽

Laser Beam ◽

Atomic Force Microscope ◽

Scanning Tunneling Microscope ◽

Point Of View ◽

Scanning Tunneling ◽

Close Relative ◽

Tunneling Microscope ◽

Atomic Force ◽

Sharp Point

The last few years have been marked by a series of remarkable developments in microscopy. Perhaps the most amazing of these is the growth of microscopies which use devices where the place of the lens has been taken by probes, which record information about the sample and display it in a spatial from the point of view of the context. From the point of view of the biologist one of the most promising of these microscopies without lenses is the scanned force microscope, aka atomic force microscope.This instrument was invented by Binnig, Quate and Gerber and is a close relative of the scanning tunneling microscope. Today's AFMs consist of a cantilever which bears a sharp point at its end. Often this is a silicon nitride pyramid, but there are many variations, the object of which is to make the tip sharper. A laser beam is directed at the back of the cantilever and is reflected into a split, or quadrant photodiode.

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