scholarly journals Direct 2-Propanol Fuel Cell—Current-voltage Characteristics and Reaction Product at Room Temperature Operation

2002 ◽  
Vol 70 (12) ◽  
pp. 961-963 ◽  
Author(s):  
Minoru UMEDA ◽  
Hiromasa SUGII ◽  
Mohamed MOHAMEDI ◽  
Isamu UCHIDA
2013 ◽  
Vol 717 ◽  
pp. 113-116
Author(s):  
Sani Klinsanit ◽  
Itsara Srithanachai ◽  
Surada Ueamanapong ◽  
Sunya Khunkhao ◽  
Budsara Nararug ◽  
...  

The effect of soft X-ray irradiation to the Schottky diode properties was analyzed in this paper. The built-in voltage, leakage current, and work function of Schottky diode were investigated. The current-voltage characteristics of the Schottky diode are measured at room temperature. After irradiation at 70 keV for 55 seconds the forward current and leakage current are increase slightly. On the other hand, the built-in voltage is decrease from the initial value about 0.12 V. Consequently, this method can cause the Schottky diode has low power consumption. The results show that soft X-ray can improve the characteristics of Schottky diode.


2004 ◽  
Vol 85 (1) ◽  
pp. 115-117 ◽  
Author(s):  
Wenping Hu ◽  
Hiroshi Nakashima ◽  
Kazuaki Furukawa ◽  
Yoshiaki Kashimura ◽  
Katsuhiro Ajito ◽  
...  

1991 ◽  
Vol 34 (6) ◽  
pp. 553-558
Author(s):  
F. Caldararu ◽  
M. Caldararu ◽  
S. Nan ◽  
D. Nicolaescu ◽  
S. Vasile

2021 ◽  
Vol 5 (1) ◽  
pp. 127-134
Author(s):  
Yanir Kadosh ◽  
Eli Korin ◽  
Armand Bettelheim

The room-temperature operation of a methane-based photo-fuel cell is demonstrated for the first time. This is achieved using a TiO2 nanotube arrays photoanode which shows effective oxidation of methane.


2002 ◽  
Vol 744 ◽  
Author(s):  
Galina Khlyap ◽  
Victor Brytan

ABSTRACTElectric field – induced effects are studied in thin films of amorphous Si grown by magnetron sputtering performed in continuous and pulse modes. Current-voltage characteristics are measured under the room temperature in different spectral ranges. It is shown that the investigated dependencies are of exponential character in all range of applied bias. Good photosensitivity was revealed by the samples prepared in continuous mode in the near-IR and visible interval. The samples grown by the pulse magnetron technology were shown room-temperature photosensitivity in near-IR range after 2000C hydrogenation.


2013 ◽  
Vol 2013 ◽  
pp. 1-6 ◽  
Author(s):  
Biljana Simić ◽  
Dejan Nikolić ◽  
Koviljka Stanković ◽  
Ljubinko Timotijević ◽  
Srboljub Stanković

This study investigates the effects of neutron radiation onI-Vcharacteristics (current dependance on voltage) of commercial optoelectronic devices (silicon photodiodes, phototransistors, and solar panels). Current-voltage characteristics of the samples were measured at room temperature before and after irradiation. The diodes were irradiated using Am-Be neutron source with neutron emission of2.7×106 n/s. The results showed a decrease in photocurrent for all samples which could be due to the existence of neutron-induced displacement defects introduced into the semiconductor lattice. The process of annealing has also been observed. A comparative analysis of measurement results has been performed in order to determine the reliability of optoelectronic devices in radiation environments.


2009 ◽  
Vol 79-82 ◽  
pp. 1317-1320 ◽  
Author(s):  
S Faraz ◽  
Haida Noor ◽  
M. Asghar ◽  
Magnus Willander ◽  
Qamar-ul Wahab

Modeling of Pd/ZnO Schottky diode has been performed together with a set of simulations to investigate its behavior in current-voltage characteristics. The diode was first fabricated and then the simulations were performed to match the IV curves to investigate the possible defects and their states in the bandgap. The doping concentration measured by capacitance-voltage is 3.4 x 1017 cm-3. The Schottky diode is simulated at room temperature and the effective barrier height is determined from current voltage characteristics both by measurements and simulations and it was found to be 0.68eV. The ideality factor obtained from simulated results is 1.06-2.04 which indicates that the transport mechanism is thermionic. It was found that the recombination current in the depletion region is responsible for deviation of experimental values from the ideal thermionic model deployed by the simulator.


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