Gate Leakage Current in GaN HEMT’s: A Degradation Modeling Approach
2013 ◽
Vol 2
(6)
◽
pp. 397-402
◽
A. Mimouni
◽
T. Fernández
◽
J. Rodriguez-Tellez
◽
A. Tazon
◽
H. Baudrand
◽
...
2008 ◽
Vol 128
(6)
◽
pp. 885-889
Kazuki Nomoto
◽
Masataka Satoh
◽
Tohru Nakamura
Kushagra Bhatheja
◽
Xiankun Jin
◽
Matthew Strong
◽
Degang Chen
Frederic Richardeau
◽
Francois Boige
◽
Stephane Lefebvre
2003 ◽
Vol 47
(11)
◽
pp. 1973-1981
◽
Jonghwan Lee
◽
Gijs Bosman
2010 ◽
Vol 93
(6)
◽
pp. 19-24
◽
Kazuki Nomoto
◽
Masataka Satoh
◽
Tohru Nakamura
Tara Ghafouri
◽
Alireza Salehi
◽
Hedie Mahmoodnia
2018 ◽
Vol 328
◽
pp. 30-34
◽
Qi Wang
◽
Yaomi Itoh
◽
Tohru Tsuruoka
◽
Masakazu Aono
◽
Deyan He
◽
...
2004 ◽
Vol 43
(No. 12B)
◽
pp. L1598-L1600
◽
Takuji Hosoi
◽
Yoshinari Kamakura
◽
Kenji Taniguchi
2005 ◽
Vol 86
(25)
◽
pp. 253511
◽
P. Kordoš
◽
J. Bernát
◽
M. Marso
◽
H. Lüth
◽
F. Rampazzo
◽
...
2017 ◽
Vol 109
◽
pp. 13-22
◽
Monika Bhattacharya
◽
Jyotika Jogi
◽
R.S. Gupta
◽
Mridula Gupta