Reducing the contact resistance in bottom-contact-type organic field-effect transitors using an AgO x interface layer

2017 ◽  
Vol 10 (9) ◽  
pp. 091601 ◽  
Author(s):  
Masahiro Minagawa ◽  
Yeongin Kim ◽  
Martin Claus ◽  
Zhenan Bao
2006 ◽  
Vol 965 ◽  
Author(s):  
Haruo Kawakami ◽  
Takahiko Maeda ◽  
Hisato Kato

ABSTRACTWe report a reduction in the contact resistance between pentacene and Au source/drain electrodes of organic field effect transistors (OFETs) with bottom-contact structure. By immersing the Au electrodes in a sulfuric acid and hydrogen peroxide mixture (SPM), the injection barrier between the Au electrodes and pentacene was lowered by approximately 0.2 eV and the contact resistance significantly decreased. The fabricated bottom-contact OFETs revealed a field-effect mobility of more than 0.66 cm2/Vs at a channel length ranging from 3 to 30 μm, which is comparable to that of top-contact OFETs with a 50 μm channel length. The transfer characteristics of the OFET with the SPM treatment were stable even after 44days storage in air under room illumination without any passivation. Moreover, the drain current reduction due to threshold voltage (Vth) shift under continuous application of gate voltage quickly recovered toward the original value with unloading of gate voltage.


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pp. 3530-3534 ◽  
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Liu Ming ◽  
Wang Hong ◽  
Shang Li-Wei ◽  
Ji Zhuo-Yu ◽  
...  

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2015 ◽  
Vol 7 (42) ◽  
pp. 23589-23596 ◽  
Author(s):  
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Muhammad Farooq Khan ◽  
Jonghwa Eom ◽  
Hwayong Noh

2013 ◽  
Vol 25 (15) ◽  
pp. 155303 ◽  
Author(s):  
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F Giubileo ◽  
L Iemmo ◽  
F Romeo ◽  
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...  

2011 ◽  
Vol 12 (12) ◽  
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Takeo Minari ◽  
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...  

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