In situ growth regime characterization of AlN using reflection high energy electron diffraction
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1994 ◽
Vol 137
(1-2)
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pp. 187-194
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Reflection high-energy electron diffraction (RHEED) for in situ characterization of thin film growth
2011 ◽
pp. 3-28
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1998 ◽
Vol 16
(3)
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pp. 1507
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