A Simple Circuit to Investigate Threshold Voltage Variation and Its Application in Monitoring Negative Bias Temperature Instability Degradation
2013 ◽
Vol 52
(4S)
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pp. 04CC06
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2016 ◽
Vol 4
(1)
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pp. 01-05
2001 ◽
2015 ◽
Vol 33
(2)
◽
pp. 022201
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2010 ◽
Vol 49
(4)
◽
pp. 04DC24
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2002 ◽
Vol 41
(Part 1, No. 4B)
◽
pp. 2423-2425
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2014 ◽
Vol 54
(9-10)
◽
pp. 2310-2314
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