Breakdown mechanism in AlGaN/GaN high-electron mobility transistor structure on free-standing n-type GaN substrate
2016 ◽
Vol 55
(5S)
◽
pp. 05FK01
◽
Keyword(s):
2019 ◽
Vol 58
(SC)
◽
pp. SCCD26
◽
2009 ◽
Vol 26
(1)
◽
pp. 017301
◽
1997 ◽
Vol 36
(Part 2, No. 6A)
◽
pp. L647-L649
◽