Single Electron Transistor on Atomically Flat α-Al2O3 Substrate Made by AFM Nano-Oxidation Process

Mapping Intimacies ◽

10.7567/ssdm.1997.b-14-4 ◽

1997 ◽

Author(s):

Kazuhiko Matsumoto ◽

Yoshitaka Gotoh ◽

Jun-ichi Shirakashi ◽

Tatsuro Maeda ◽

James S. Harris

Keyword(s):

Oxidation Process ◽

Single Electron ◽

Single Electron Transistor ◽

Al2o3 Substrate ◽

Α Al2o3 ◽

Atomically Flat

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Room Temperature Coulomb Oscillation for Single Electron Transistor on Atomically Flat Ti/α-Al2O3 Substrate Made by Pulse-Mode AFM Nano-Oxidation Process

10.7567/ssdm.1998.c-5-2 ◽

1998 ◽

Author(s):

Kazuhiko Matsumoto ◽

Yoshitaka Gotoh ◽

Tatsuro Maeda ◽

John A. Dagata ◽

James S. Harris

Keyword(s):

Room Temperature ◽

Oxidation Process ◽

Single Electron ◽

Single Electron Transistor ◽

Al2o3 Substrate ◽

Coulomb Oscillation ◽

Α Al2o3 ◽

Atomically Flat

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Room-Temperature Operation of a Single-Electron Transistor Made by Oxidation Process Using the Recessed Channel Structure

Japanese Journal of Applied Physics ◽

10.1143/jjap.49.115202 ◽

2010 ◽

Vol 49 (11) ◽

pp. 115202 ◽

Author(s):

Joung-Eob Lee ◽

Garam Kim ◽

Kim Kyung Wan ◽

Won Bo Shim ◽

Jung-Han Lee ◽

...

Keyword(s):

Room Temperature ◽

Oxidation Process ◽

Channel Structure ◽

Single Electron ◽

Single Electron Transistor ◽

Recessed Channel ◽

Room Temperature Operation

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Room-temperature single-electron memory made by pulse-mode atomic force microscopy nano oxidation process on atomically flat α-alumina substrate

Applied Physics Letters ◽

10.1063/1.125714 ◽

2000 ◽

Vol 76 (2) ◽

pp. 239-241 ◽

Author(s):

Kazuhiko Matsumoto ◽

Yoshitaka Gotoh ◽

Tatsuro Maeda ◽

John A. Dagata ◽

James S. Harris

Keyword(s):

Atomic Force Microscopy ◽

Room Temperature ◽

Oxidation Process ◽

Alumina Substrate ◽

Single Electron ◽

Force Microscopy ◽

Atomic Force ◽

Atomically Flat ◽

Mode Atomic Force Microscopy

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Fabrication of single electron memory on atomically flat α-Al/sub 2/O/sub 3/ substrate made by AFM nano-oxidation process

International Electron Devices Meeting. IEDM Technical Digest ◽

10.1109/iedm.1997.650286 ◽

2002 ◽

Author(s):

K. Matsumoto ◽

Y. Gotoh ◽

J. Shirakashi ◽

T. Maeda ◽

J.S. Harris

Keyword(s):

Oxidation Process ◽

Single Electron ◽

Atomically Flat

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Room temperature operated single electron transistor made by a scanning tunnelling microscopy/atomic force microscopy nano-oxidation process

International Journal of Electronics ◽

10.1080/002072199133292 ◽

1999 ◽

Vol 86 (5) ◽

pp. 641-662 ◽

Author(s):

KAZUHIKO MATSUMOTO

Keyword(s):

Atomic Force Microscopy ◽

Room Temperature ◽

Oxidation Process ◽

Scanning Tunnelling Microscopy ◽

Single Electron ◽

Single Electron Transistor ◽

Force Microscopy ◽

Atomic Force ◽

Scanning Tunnelling ◽

Tunnelling Microscopy

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Nanoscale Semiconductor Processes Using STM and AFM Lithographies. AFM Nano-oxidation of Atomically-flat Ti Film and Its Application to Single Electron Transistor.

Hyomen Kagaku ◽

10.1380/jsssj.19.742 ◽

1998 ◽

Vol 19 (11) ◽

pp. 742-746 ◽

Author(s):

Kazuhiko MATSUMOTO

Keyword(s):

Single Electron ◽

Single Electron Transistor ◽

Atomically Flat

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Side Gate Single Electron Transistor with Multi-Islands Structure Operated at Room Temperature Made by STM/AFM Nano-Oxidation Process

10.7567/ssdm.1996.sympo.iii-2 ◽

1996 ◽

Author(s):

Kazuhiko MATSUMOTO ◽

Masami ISHII ◽

Jun-ichi SHIRAKASHI ◽

Bartev J. VARTANIAN ◽

James S. HARRIS

Keyword(s):

Room Temperature ◽

Oxidation Process ◽

Single Electron ◽

Single Electron Transistor

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Experimental and Simulated Results of Room Temperature Single Electron Transistor Formed by AFM Nano-Oxidation Process

10.7567/ssdm.1999.d-5-2 ◽

1999 ◽

Author(s):

Y. Gotoh ◽

K. Matsumoto ◽

V. Bubanja ◽

F. Vazquez ◽

T. Maeda ◽

...

Keyword(s):

Room Temperature ◽

Oxidation Process ◽

Single Electron ◽

Single Electron Transistor

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Room Temperature Operation of Single Electron Transistor Made by STM Nano-Oxidation Process

10.7567/ssdm.1995.s-ii-5 ◽

1995 ◽

Author(s):

Kazuhiko MATSUMOTO ◽

Masami ISHII ◽

Kazuhito SEGAWA ◽

Yasushi OKA ◽

Bartev J. VARTANIAN ◽

...

Keyword(s):

Room Temperature ◽

Oxidation Process ◽

Single Electron ◽

Single Electron Transistor ◽

Room Temperature Operation

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Experimental and theoretical results of room-temperature single-electron transistor formed by the atomic force microscope nano-oxidation process

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.582347 ◽

2000 ◽

Vol 18 (4) ◽

pp. 1321-1325 ◽

Author(s):

Y. Gotoh ◽

K. Matsumoto ◽

T. Maeda ◽

E. B. Cooper ◽

S. R. Manalis ◽

...

Keyword(s):

Atomic Force Microscope ◽

Room Temperature ◽

Oxidation Process ◽

Single Electron ◽

Single Electron Transistor ◽

Atomic Force ◽

Theoretical Results

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