Spectroscopic Ellipsometry for the Identification of Paracrystallites in the Ultra-Thin Thermal CVD Hydrogenated Amorphous Silicon Films
1991 ◽
Vol 30
(Part 2, No. 11B)
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pp. L1914-L1916
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2000 ◽
Vol 39
(Part 1, No. 11)
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pp. 6196-6201
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Keyword(s):
2016 ◽
Vol 55
(4S)
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pp. 04ES05
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Keyword(s):
1999 ◽
Vol 17
(6)
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pp. 3240-3245
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2000 ◽
Vol 266-269
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pp. 304-308
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