The Properties of the InxGa1-xSb Epilayer Grown on GaAs Substrate by Metalorganic Chemical Vapor Deposition Using the Interfacial Misfit Dislocation Technique

2016 ◽  
Author(s):  
S. Huynh ◽  
Q. Luc ◽  
M. Ha ◽  
H. Do ◽  
H. Yu ◽  
...  
Sign in / Sign up

Export Citation Format

Share Document