Abstract
A set of partially uncoupled NiFe/Cu/IrMn exchange biased thin films with variable thickness of non-magnetic Cu spacer is characterized by ferromagnetic resonance (FMR) and Brillouin light scattering (BLS) techniques applied complementary to reveal time-scale dependent effects of uncoupling between ferromagnetic and antiferromagnetic layers on high-frequency magnetization dynamics. The results correlate with interfacial grain texture variations and static magnetization behavior. Two types of crystalline phases with correlated microwave response are revealed at the ferro-antiferromagnet interface in NiFe/Cu/IrMn thin films. The first phase forms as well-textured NiFe/IrMn grains with NiFe (111)/IrMn (111) interface. The second phase consists of amorphous NiFe/IrMn grains. Intercalation of NiFe/IrMn by Cu clusters results in relaxation of tensile strains at the NiFe/IrMn interface leading to larger size of grains in both the NiFe and IrMn layers. The contributions of well-textured and amorphous grains to the high-frequency magnetization reversal behavior are distinguished by FMR and BLS techniques. Generation of a spin-wave mode is revealed in the well-textured phase, whereas microwave response of the amorphous phase is found to originate from magnetization rotation dominated by a rotatable magnetic anisotropy term. Under fixed FMR frequency, the increase of Cu thickness results in higher magnetization rotation frequencies in the amorphous grains.
Microwave response of an Andreev bound state
