1.54μm luminescence of β-FeSi2 grown on Au-coated Si substrates

ABSTRACTA clear PL spectrum was observed from β-FeSi2 grains on gold (Au)-coated (100)Si substrates, and indicated the formation of crystal with the same high quality level as the β-FeSi2 on a copper (Cu)-coated Si substrate. Moreover, the temperature dependence of photoluminescence peak intensities showed lower density of the nonradiative recombination center in β-FeSi2 grains on Au-coated Si substrates than that of β-FeSi2 film on Cu-coated Si. Au was not detected in β-FeSi2 grains by STEM-EDX observation, while Cu was observed in the grains and grain boundaries of β-FeSi2 and rolled as non-radiative recombination center.

Exciton Luminescence of Single-Crystal GaN

ABSTRACTDetailed photoluminescence (PL) studies of high-quality MBE-grown single-crystal cubic and hexagonal GaN are presented. We identify free and bound exciton recombination. By means of a line-shape analysis, we quantitatively analyze our spectra, which were taken as a function of temperature (T = 4 - 300 K) and excitation density (Pex = 0.3 - 200W/cm2). We show the dominant recombination channel at 300 K to be free-excitonic in nature with an internal small-signal quantum efficiency of 6 · 10−3 for both cubic and hexagonal material. Based on a three-level model, activation energies for exciton dissociation are evaluated. Radiative (τrad ≈ 2 ns) and nonradiative lifetimes (τe ≈ 1μs, τh ≈ 20 ps) are determined, where in the latter case, electron and hole trapping are considered separately. Furthermore, we show that the dominant nonradiative recombination center, being a hole trap, saturates at Pex ≥ 20 W/cm2.

Photoluminescence Imaging of III-V Substrates and Epitaxial Heterostructures

The characterization of III-V compound semiconductor substrates and epitaxial layers with photoluminescence imaging is reviewed. The luminescence patterns of semi-insulating GaAs are dominantly determined by the concentration and distribution of nonradiative recombination centers, as shown by comparison with spectroscopic temperature and lifetime topography of photoexcited carriers. Wafers fabricated with various growth and annealing procedures are evaluated. Presently available informations on nonradiative centers in GaAs are summarized and discussed. The correlation of luminescence, absorption and resistivity topograms of InP substrates shows various interrelated influences of the Fe acceptor distribution. High resolution luminescence images of growth induced, strain induced and substrate induced defects in epitaxial heterostructures are obtained. The generation of relaxation dislocations in pseudomorphic layers is influenced by growth parameters, layer structures, layer doping and also by substrate properties. Nonradiative recombination center patterns replicate the arrangement of threading dislocations in the substrate.