2010 27th International Conference on Microelectronics Proceedings
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TOTAL DOCUMENTS

128

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6

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Published By IEEE

9781424472000

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Application of non-equilibrium plasmas in top-down and bottom-up nanotechnologies and biomedicine

2010 27th International Conference on Microelectronics Proceedings ◽

10.1109/miel.2010.5490535 ◽

2010 ◽

Author(s):

Z. Lj. Petrovic ◽

M. Radmilovic-Radenovic ◽

P. Maguire ◽

M. Radetic ◽

N. Puac ◽

...

Keyword(s):

Top Down ◽

Bottom Up ◽

Non Equilibrium

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Sputtering of ZnO:Ga thin films with the inclined crystalic texture

2010 27th International Conference on Microelectronics Proceedings ◽

10.1109/miel.2010.5490506 ◽

2010 ◽

Author(s):

V. Tvarozek ◽

I. Novotny ◽

P. Sutta ◽

M. Netrvalova ◽

S. Flickyngerova ◽

...

Keyword(s):

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Effect of the grain size on the structural and optical properties of the sprayed CdxZn1-xS films

2010 27th International Conference on Microelectronics Proceedings ◽

10.1109/miel.2010.5490504 ◽

2010 ◽

Author(s):

M. Oztas ◽

Z. Ozturk ◽

M. Bedir ◽

S. Sur

Keyword(s):

Optical Properties ◽

Structural And Optical Properties

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Influence of different dopants on physical properties of ZnO for photovoltaic applications

2010 27th International Conference on Microelectronics Proceedings ◽

10.1109/miel.2010.5490503 ◽

2010 ◽

Author(s):

M. Netrvalova ◽

I. Novotny ◽

V. Tvarozek ◽

L. Prusakova ◽

P. Sutta

Keyword(s):

Physical Properties ◽

Photovoltaic Applications

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Effects of constant voltage stress in Hf-doped Ta2O5 stacks

2010 27th International Conference on Microelectronics Proceedings ◽

10.1109/miel.2010.5490437 ◽

2010 ◽

Author(s):

I. Manic ◽

E. Atanassova ◽

N. Stojadinovic ◽

D. Spassov

Keyword(s):

Constant Voltage ◽

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Line Width Roughness effects on device performance: The role of the gate width design

2010 27th International Conference on Microelectronics Proceedings ◽

10.1109/miel.2010.5490486 ◽

2010 ◽

Author(s):

V. Constantoudis ◽

E. Gogolides ◽

G. P. Patsis

Keyword(s):

Device Performance ◽

Roughness Effects ◽

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Current-Voltage Characteristic of a p-n junction: Problems and solutions

2010 27th International Conference on Microelectronics Proceedings ◽

10.1109/miel.2010.5490525 ◽

2010 ◽

Author(s):

J. E. Velazquez-Perez ◽

Yu. G. Gurevich

Keyword(s):

Voltage Characteristic ◽

Current Voltage Characteristic ◽

Current Voltage ◽

Problems And Solutions

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Electron spectrum of δ-doped quantum wells by Thomas — Fermi method at finite temperatures

2010 27th International Conference on Microelectronics Proceedings ◽

10.1109/miel.2010.5490520 ◽

2010 ◽

Author(s):

V. Grimalsky ◽

L. M. Gaggero-S. ◽

S. Koshevaya ◽

A. Garcia-B.

Keyword(s):

Quantum Wells ◽

Electron Spectrum ◽

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Design of symmetric planar fishnet metamaterials for optical wavelength range

2010 27th International Conference on Microelectronics Proceedings ◽

10.1109/miel.2010.5490509 ◽

2010 ◽

Author(s):

Zoran Jaksic ◽

Dragan Tanaskovic ◽

Jovan Matovic

Keyword(s):

Wavelength Range ◽

Optical Wavelength

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Contactless measurement of thin metallic films

2010 27th International Conference on Microelectronics Proceedings ◽

10.1109/miel.2010.5490522 ◽

2010 ◽

Author(s):

V. Papez ◽

S. Papezova

Keyword(s):

Contactless Measurement ◽

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