Monte Carlo Simulation of Edge Ion Dynamics in the Presence of Collisions and a Radial Electric Field

1994 ◽  
Vol 34 (2-3) ◽  
pp. 180-185 ◽  
Author(s):  
T. K. Kurki-Suonio ◽  
M. J. Alava ◽  
S. K. Sipilä ◽  
J. A. Heikkinen
Author(s):  
Vladimir Abdrakhmanov ◽  
◽  
Dmitry Abdrakhmanov ◽  
Dmitry Zav’yalov ◽  
Vladimir Konchenkov ◽  
...  

The development of a software package using the OpenACC parallel computing technology for Monte Carlo simulation of the kinetic coefficients of homogeneous semiconductor materials is presented. The package is a set of interconnected classes, the parameters of the material and external fields are redefined in the child classes available to the user, which makes it possible to model a wide range of materials. The package allows us to use models of elastic (acoustic phonons, charged impurities) and inelastic (polar and nonpolar optical phonons) electron scattering in the single-band approximation. The use of OpenACC technology makes it possible to use both shared memory systems and hybrid systems equipped with graphics processors as a computing platform. The possibility of saving data about each particle at each time step of the simulation is provided. It allowed, in particular, to trace the dependence of the average collision frequency of the energy of charge carriers and strength of the DC electric field applied to the sample, in the beta-modification of gallium oxide, to assess the applicability of the conductivity models offered by other research groups. It is shown that the greatest contribution to the conductivity of the beta modification of gallium oxide at room temperatures is made by the scattering of electrons on polar optical phonons, and the average collision frequency, as well as the percentage of collisions of an electron with various types of inhomogeneities of the crystal lattice, weakly depend on the strength of the constant electric field. At a temperature of about 100 K, with an increase in the constant electric field applied to the sample, firstly, the proportion of scattering with the emission of polar optical phonons increases significantly and the proportion of scattering on charged impurities decreases, and secondly, the total frequency of collisions increases. This is due, on the one hand, to the heating of the electron gas by an electric field and the activation of scattering channels with the emission of a phonon at a given temperature, on the other hand, to an insufficiently rapid increase in the concentration of current carriers due to the ionization of impurities. Thanks to the Monte Carlo simulation, it was possible to directly evaluate the validity of the use of the Farvaque correction for an approximate description of the processes of inelastic electron scattering on polar optical phonons by introducing some effective relaxation time.


1982 ◽  
Vol 37 (8) ◽  
pp. 899-905 ◽  
Author(s):  
W. Lötz ◽  
J. Nührenberg

Simple axisymmetric and ripple tokamak model fields are used to compute neoclassical trans-port coefficients by Monte Carlo simulation over a wide range of mean free paths in the approximation of small gyroradius. Further assumptions are a monoenergetic particle distribution which is only subject to pitch angle scattering and a vanishing electric field. Pfirsch-Schlüter, plateau, banana and ripple transport coefficients are obtained. In the ripple regime the description is unified by introducing the concept of an effective ripple. Cases in which ripple transport is diminished due to collisionless detrapping are observed


2010 ◽  
Vol 39 (6) ◽  
pp. 411-417 ◽  
Author(s):  
A. V. Borzdov ◽  
D. V. Pozdnyakov ◽  
V. M. Borzdov ◽  
A. A. Orlikovsky ◽  
V. V. V’yurkov

2004 ◽  
Vol 10 (6) ◽  
pp. 776-782 ◽  
Author(s):  
Hendrix Demers ◽  
Raynald Gauvin

The microanalysis of nonconductive specimen in a scanning electron microscope is limited by charging effects. Using a charge density model for the electric field buildup in a nonconductive specimen irradiated by electrons, a Monte Carlo simulation method has been applied to alumina (Al2O3). The results show a change in the depth distribution for characteristic and bremsstrahlung X-ray, φ(ρz) curves, and ψ(ρz) curves (with absorption) for both elements' Kα lines. The influence of the electric field on the measured X-ray intensity is shown. The dependency of this influence by the three parameters, electron energy, X-ray energy, and charge density, is clarified.


2012 ◽  
Vol 17 (11) ◽  
pp. 115001 ◽  
Author(s):  
Andrew J. Radosevich ◽  
Jeremy D. Rogers ◽  
İlker R. Çapoğlu ◽  
Nikhil N. Mutyal ◽  
Prabhakar Pradhan ◽  
...  

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