Modeling and simulation of dual‐material‐gate AlGaN/GaN high‐electron‐mobility transistor using finite difference method
2019 ◽
Vol 32
(3)
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pp. e2546
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2017 ◽
Vol 12
(12)
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pp. 1314-1320
2011 ◽
Vol 51
(3)
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pp. 587-596
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2013 ◽
Vol 64
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pp. 388-398
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1998 ◽
Vol 31
(2)
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pp. 159-164
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2006 ◽
Vol 45
(No. 35)
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pp. L932-L934
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2004 ◽
Vol 43
(12)
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pp. 8019-8023
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