Simultaneous acquisition of image and navigator slices using CAIPIRINHA for 4D MRI

2014 ◽  
Vol 73 (2) ◽  
pp. 669-676 ◽  
Author(s):  
Zarko Celicanin ◽  
Oliver Bieri ◽  
Frank Preiswerk ◽  
Philippe Cattin ◽  
Klaus Scheffler ◽  
...  
2020 ◽  
Vol 152 ◽  
pp. S939-S940
Author(s):  
J. Yuan ◽  
O.L. Wong ◽  
R.Y.W. Ho ◽  
Y. Zhou ◽  
K.Y. Cheung ◽  
...  
Keyword(s):  

2021 ◽  
Vol 11 (1) ◽  
Author(s):  
Yijun Yang ◽  
Kwanlae Kim

AbstractAtomic force microscopy (AFM) is central to investigating the piezoelectric potentials of one-dimensional nanomaterials. The AFM probe is used to deflect individual piezoelectric nanorods and to measure the resultant current. However, the torsion data of AFM probes have not been exploited to elucidate the relationship between the applied mechanical force and resultant current. In this study, the effect of the size of ZnO nanorods on the efficiency of conversion of the applied mechanical force into current was investigated by simultaneously acquiring the conductive AFM and lateral force microscopy signals. The conversion efficiency was calculated based on linear regression analysis of the scatter plot of the data. This method is suitable for determining the conversion efficiencies of all types of freestanding piezoelectric nanomaterials grown under different conditions. A pixel-wise comparison of the current and lateral force images elucidated the mechanism of current generation from dense arrays of ZnO nanorods. The current signals generated from the ZnO nanorods by the AFM probe originated from the piezoelectric and triboelectric effects. The current signals contributed by the triboelectric effect were alleviated by using an AFM probe with a smaller spring constant and reducing the normal force.


2013 ◽  
Vol 19 (6) ◽  
pp. 900-912 ◽  
Author(s):  
Silvia Born ◽  
Matthias Pfeifle ◽  
Michael Markl ◽  
Matthias Gutberlet ◽  
Gerik Scheuermann
Keyword(s):  

2018 ◽  
Vol 63 (7) ◽  
pp. 075002 ◽  
Author(s):  
Kathrin Breuer ◽  
Cord B Meyer ◽  
Felix A Breuer ◽  
Anne Richter ◽  
Florian Exner ◽  
...  
Keyword(s):  

2006 ◽  
Vol 524-525 ◽  
pp. 619-624 ◽  
Author(s):  
Mark R. Terner ◽  
Peter Hedström ◽  
Jonathan Almer ◽  
J. Ilavsky ◽  
Magnus Odén

Residual stresses and microstructural changes during phase separation in Ti33Al67N coatings were examined using microfocused high energy x-rays from a synchrotron source. The transmission geometry allowed simultaneous acquisition of x-ray diffraction data over 360° and revealed that the decomposition at elevated temperatures occurred anisotropically, initiating preferentially along the film plane. The as-deposited compressive residual stress in the film plane first relaxed with annealing, before dramatically increasing concurrently with the initial stage of phase separation where metastable, nm-scale c-AlN platelets precipitated along the film direction. These findings were further supported from SAXS analyses.


Author(s):  
A. van de Lindt ◽  
B. Nowee ◽  
T. Janssen ◽  
C. Schneider ◽  
P. Remeijer ◽  
...  

Sign in / Sign up

Export Citation Format

Share Document