scholarly journals Simultaneous acquisition of current and lateral force signals during AFM for characterising the piezoelectric and triboelectric effects of ZnO nanorods

2021 ◽  
Vol 11 (1) ◽  
Author(s):  
Yijun Yang ◽  
Kwanlae Kim
Keyword(s):  
Linear Regression Analysis ◽  
Zno Nanorods ◽  
Lateral Force ◽  
Mechanical Force ◽  
Force Microscopy ◽  
Atomic Force ◽  
Simultaneous Acquisition ◽  
Afm Probe ◽  
Triboelectric Effect ◽  
Conversion Efficiencies

AbstractAtomic force microscopy (AFM) is central to investigating the piezoelectric potentials of one-dimensional nanomaterials. The AFM probe is used to deflect individual piezoelectric nanorods and to measure the resultant current. However, the torsion data of AFM probes have not been exploited to elucidate the relationship between the applied mechanical force and resultant current. In this study, the effect of the size of ZnO nanorods on the efficiency of conversion of the applied mechanical force into current was investigated by simultaneously acquiring the conductive AFM and lateral force microscopy signals. The conversion efficiency was calculated based on linear regression analysis of the scatter plot of the data. This method is suitable for determining the conversion efficiencies of all types of freestanding piezoelectric nanomaterials grown under different conditions. A pixel-wise comparison of the current and lateral force images elucidated the mechanism of current generation from dense arrays of ZnO nanorods. The current signals generated from the ZnO nanorods by the AFM probe originated from the piezoelectric and triboelectric effects. The current signals contributed by the triboelectric effect were alleviated by using an AFM probe with a smaller spring constant and reducing the normal force.

scholarly journals Simultaneous acquisition of current and lateral force signals during atomic force microscopy for characterising the piezoelectric and triboelectric effects of ZnO nanorods 

2020 ◽  
Author(s):  
Yijun Yang ◽  
Kwanlae Kim
Keyword(s):  
Atomic Force Microscopy ◽  
Linear Regression Analysis ◽  
Zno Nanorods ◽  
Lateral Force ◽  
Mechanical Force ◽  
Force Microscopy ◽  
Atomic Force ◽  
Simultaneous Acquisition ◽  
Afm Probe ◽  
Conversion Efficiencies

Abstract Atomic force microscopy (AFM) is central to investigating the piezoelectric potentials of one-dimensional nanomaterials. The AFM probe is used to deflect individual piezoelectric nanorods and to measure the resultant current. However, the torsion data of AFM probes have not been exploited to elucidate the relationship between the applied mechanical force and resultant current. In this study, the effect of the size of ZnO nanorods on the efficiency of conversion of the applied mechanical force into current was investigated by simultaneously acquiring the conductive AFM and lateral force microscopy signals. The conversion efficiency was calculated based on linear regression analysis of the scatter plot of the data. This method is suitable for determining the conversion efficiencies of all types of freestanding piezoelectric nanomaterials grown under different conditions. A pixel-wise comparison of the current and lateral force images elucidated the mechanism of current generation from dense arrays of ZnO nanorods. The current signals generated from the ZnO nanorods by the AFM probe originated from the piezoelectric and triboelectric effects. The current signals contributed by the triboelectric effect were alleviated by using an AFM probe with a smaller spring constant and reducing the normal force.

scholarly journals Magnetic Driven Two-Finger Micro-Hand with Soft Magnetic End-Effector for Force-Controlled Stable Manipulation in Microscale

Micromachines ◽  
2021 ◽  
Vol 12 (4) ◽  
pp. 410
Author(s):  
Dan Liu ◽  
Xiaoming Liu ◽  
Pengyun Li ◽  
Xiaoqing Tang ◽  
Masaru Kojima ◽  
...  
Keyword(s):  
Magnetic Force ◽  
Force Feedback ◽  
Soft Magnetic ◽  
End Effector ◽  
Force Microscopy ◽  
System A ◽  
Atomic Force ◽  
Afm Probe ◽  
End Effectors ◽  
Fixed End

In recent years, micromanipulators have provided the ability to interact with micro-objects in industrial and biomedical fields. However, traditional manipulators still encounter challenges in gaining the force feedback at the micro-scale. In this paper, we present a micronewton force-controlled two-finger microhand with a soft magnetic end-effector for stable grasping. In this system, a homemade electromagnet was used as the driving device to execute micro-objects manipulation. There were two soft end-effectors with diameters of 300 μm. One was a fixed end-effector that was only made of hydrogel, and the other one was a magnetic end-effector that contained a uniform mixture of polydimethylsiloxane (PDMS) and paramagnetic particles. The magnetic force on the soft magnetic end-effector was calibrated using an atomic force microscopy (AFM) probe. The performance tests demonstrated that the magnetically driven soft microhand had a grasping range of 0–260 μm, which allowed a clamping force with a resolution of 0.48 μN. The stable grasping capability of the magnetically driven soft microhand was validated by grasping different sized microbeads, transport under different velocities, and assembly of microbeads. The proposed system enables force-controlled manipulation, and we believe it has great potential in biological and industrial micromanipulation.

Traceable Lateral Force Calibration (TLFC) for Atomic Force Microscopy

2020 ◽  
Vol 68 (4) ◽  
Author(s):  
Arnab Bhattacharjee ◽  
Nikolay T. Garabedian ◽  
Christopher L. Evans ◽  
David L. Burris
Keyword(s):  
Atomic Force Microscopy ◽  
Lateral Force ◽  
Force Microscopy ◽  
Atomic Force ◽  
Force Calibration

Heterogeneous Oxidation and Precipitation of Aqueous Mn(II) at the Goethite Surface: A SPM Study

1998 ◽  
Vol 4 (S2) ◽  
pp. 600-601
Author(s):  
John Rakovan ◽  
F. Hochella Michael
Keyword(s):  
Lateral Force ◽  
Atomic Scale ◽  
Scanning Tunneling ◽  
Mineral Surfaces ◽  
Tunneling Microscopy ◽  
Heterogeneous Oxidation ◽  
Force Microscopy ◽  
Solution Interface ◽  
Atomic Force

Since its invention inl982 scanning probe microscopy (SPM) has become an important analytical tool in every branch of physical science. The two most widely used types of SPM are atomic force Microscopy (AFM) and scanning tunneling microscopy (STM). Both AFM and STM allow measurement of the microtopography of a surface down to the atomic scale. Many spin-off applications such as lateral force and magnetic force allow measurement of a variety of the physical properties of a surface while imaging its microtopography. SPM can be done in both air and liquid and hence can be used to observe the interactions that take place at a solid-solution interface.SPM has been used in mineralogy and geochemistry since 1989. Here as in other applications the great strength of SPM is in the characterization of the heterogeneous nature of mineral surfaces and the ability to observe many geochemical processes in real time.

Dynamic Modeling and Simulation of Rough Cylindrical Micro/Nanoparticle Manipulation with Atomic Force Microscopy

2014 ◽  
Vol 20 (6) ◽  
pp. 1692-1707 ◽  
Author(s):  
Moharam H. Korayem ◽  
Hedieh Badkoobeh Hezaveh ◽  
Moein Taheri
Keyword(s):  
Critical Force ◽  
Cylindrical Particle ◽  
Force Microscopy ◽  
Real Area Of Contact ◽  
Atomic Force ◽  
Rough Substrate ◽  
Simulation Results ◽  
Afm Probe ◽  
Cylindrical Particles ◽  
Simulation Condition

AbstractIn this paper, the process of pushing rough cylindrical micro/nanoparticles on a surface with an atomic force microscope (AFM) probe is investigated. For this purpose, the mechanics of contact involving adhesion are studied first. Then, a method is presented for estimating the real area of contact between a rough cylindrical particle (whose surface roughness is described by the Rumpf and Rabinovich models) and a smooth surface. A dynamic model is then obtained for the pushing of rough cylindrical particles on a surface with an AFM probe. Afterwards, the process is simulated for different particle sizes and various roughness dimensions. Finally, by reducing the length of the cylindrical particle, the simulation condition is brought closer to the manipulation condition of a smooth spherical particle on a rough substrate, and the simulation results of the two cases are compared. Based on the simulation results, the critical force and time of manipulation diminish for rough particles relative to smooth ones. Reduction in the aspect ratio at a constant cross-section radius and the radius of asperities (height of asperities based on the Rabinovich model) results in an increase in critical force and time of manipulation.

Analysis of Indentation: Implications for Measuring Mechanical Properties With Atomic Force Microscopy

1999 ◽  
Vol 121 (5) ◽  
pp. 462-471 ◽  
Author(s):  
K. D. Costa ◽  
F. C. P. Yin
Keyword(s):  
Indentation Depth ◽  
Constitutive Law ◽  
Elastic Materials ◽  
Force Microscopy ◽  
Linear Elastic ◽  
Afm Indentation ◽  
Atomic Force ◽  
Afm Probe ◽  
Nonlinear Elastic ◽  
Indenter Geometry

Indentation using the atomic force microscope (AFM) has potential to measure detailed micromechanical properties of soft biological samples. However, interpretation of the results is complicated by the tapered shape of the AFM probe tip, and its small size relative to the depth of indentation. Finite element models (FEMs) were used to examine effects of indentation depth, tip geometry, and material nonlinearity and heterogeneity on the finite indentation response. Widely applied infinitesimal strain models agreed with FEM results for linear elastic materials, but yielded substantial errors in the estimated properties for nonlinear elastic materials. By accounting for the indenter geometry to compute an apparent elastic modulus as a function of indentation depth, nonlinearity and heterogeneity of material properties may be identified. Furthermore, combined finite indentation and biaxial stretch may reveal the specific functional form of the constitutive law—a requirement for quantitative estimates of material constants to be extracted from AFM indentation data.

scholarly journals Characterization of spherical domains at the polystyrene thin film–water interface

2016 ◽  
Vol 7 ◽  
pp. 581-590 ◽  
Author(s):  
Khurshid Ahmad ◽  
Xuezeng Zhao ◽  
Yunlu Pan ◽  
Danish Hussain
Keyword(s):  
Spherical Shape ◽  
Line Tension ◽  
Lateral Force ◽  
Water Interface ◽  
Force Microscopy ◽  
Atomic Force ◽  
Before And After ◽  
Spherical Domains ◽  
Silicon Interface

Spherical domains that readily form at the polystyrene (PS)–water interface were studied and characterized using atomic force microscopy (AFM). The study showed that these domains have similar characteristics to micro- and nanobubbles, such as a spherical shape, smaller contact angle, low line tension, and they exhibit phase contrast and the coalescence phenomenon. However, their insensitivity to lateral force, absence of long-range hydrophobic attraction, and the presence of possible contaminants and scratches on these domains suggested that these objects are most likely blisters formed by the stretched PS film. Furthermore, the analysis of the PS film before and after contact with water suggested that the film stretches and deforms after being exposed to water. The permeation of water at the PS–silicon interface, caused by osmosis or defects present on the film, can be a reasonable explanation for the nucleation of these spherical domains.

scholarly journals Optimization of solution-processed oligothiophene:fullerene based organic solar cells by using solvent additives

2013 ◽  
Vol 4 ◽  
pp. 680-689 ◽  
Author(s):  
Gisela L Schulz ◽  
Marta Urdanpilleta ◽  
Roland Fitzner ◽  
Eduard Brier ◽  
Elena Mena-Osteritz ◽  
...  
Keyword(s):  
Solar Cells ◽  
Organic Solar Cells ◽  
Bulk Heterojunction ◽  
Solution Processed ◽  
Heterojunction Solar Cells ◽  
Force Microscopy ◽  
Vacuum Technology ◽  
Atomic Force ◽  
Donor And Acceptor ◽  
Conversion Efficiencies

The optimization of solution-processed organic bulk-heterojunction solar cells with the acceptor-substituted quinquethiophene DCV5T-Bu 4 as donor in conjunction with PC61BM as acceptor is described. Power conversion efficiencies up to 3.0% and external quantum efficiencies up to 40% were obtained through the use of 1-chloronaphthalene as solvent additive in the fabrication of the photovoltaic devices. Furthermore, atomic force microscopy investigations of the photoactive layer gave insight into the distribution of donor and acceptor within the blend. The unique combination of solubility and thermal stability of DCV5T-Bu 4 also allows for fabrication of organic solar cells by vacuum deposition. Thus, we were able to perform a rare comparison of the device characteristics of the solution-processed DCV5T-Bu 4 :PC61BM solar cell with its vacuum-processed DCV5T-Bu 4 :C60 counterpart. Interestingly in this case, the efficiencies of the small-molecule organic solar cells prepared by using solution techniques are approaching those fabricated by using vacuum technology. This result is significant as vacuum-processed devices typically display much better performances in photovoltaic cells.

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