Simple Method for Determination of the Interface Trap Density at the Midgap in MOS Structures

phys stat sol (a) ◽

10.1002/pssa.2210730230 ◽

1982 ◽

Vol 73 (2) ◽

pp. 545-549 ◽

Author(s):

A. Jakubowski ◽

K. Iniewski

Keyword(s):

Trap Density ◽

Interface Trap Density ◽

Interface Trap ◽

Simple Method ◽

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Simple method for the determination of the interface trap density at 77 K in fully depleted accumulation mode SOI MOSFETs

Solid-State Electronics ◽

10.1016/0038-1101(93)90004-a ◽

1993 ◽

Vol 36 (6) ◽

pp. 827-832 ◽

Author(s):

J.A. Martino ◽

E. Simoen ◽

U. Magnusson ◽

A.L.P. Rotondaro ◽

C. Claeys

Keyword(s):

Trap Density ◽

Interface Trap Density ◽

Interface Trap ◽

Simple Method ◽

Fully Depleted ◽

Accumulation Mode

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Simultaneous Determination of Volume Trap Concentration and Interface Trap Density from C-Y Characteristics

10.1515/9783112472729-012 ◽

1971 ◽

pp. 407-410

Author(s):

K. Nienerowski ◽

E. - H. Weber

Keyword(s):

Simultaneous Determination ◽

Trap Density ◽

Interface Trap Density ◽

Interface Trap ◽

Trap Concentration

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Extraction of interface trap density in high-k/Ge gate stacks and determination of the charge neutrality level

2009 Device Research Conference ◽

10.1109/drc.2009.5354888 ◽

2009 ◽

Author(s):

D. Bozyigit ◽

C. Rossel

Keyword(s):

Trap Density ◽

Interface Trap Density ◽

Interface Trap ◽

Gate Stacks ◽

Charge Neutrality ◽

Charge Neutrality Level ◽

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Effect of oxide resistance on the characterization of interface trap density in MOS structures

Solid-State Electronics ◽

10.1016/0038-1101(91)90043-x ◽

1991 ◽

Vol 34 (12) ◽

pp. 1449-1454

Author(s):

Jing-Jenn Lin ◽

Jenn-Gwo Hwu

Keyword(s):

Trap Density ◽

Interface Trap Density ◽

Interface Trap ◽

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Determination of minority carrier lifetime and interface trap density in Ge MIS capacitors

2007 International Workshop on Physics of Semiconductor Devices ◽

10.1109/iwpsd.2007.4472481 ◽

2007 ◽

Author(s):

C. Mahata ◽

M. K. Bera ◽

P. K. Bose ◽

C. K. Maiti

Keyword(s):

Carrier Lifetime ◽

Minority Carrier ◽

Minority Carrier Lifetime ◽

Trap Density ◽

Interface Trap Density ◽

Interface Trap ◽

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Determination of Si-SiO/sub 2/ interface trap density by 1/f noise measurements

IEEE Transactions on Electron Devices ◽

10.1109/16.7368 ◽

1988 ◽

Vol 35 (10) ◽

pp. 1651-1655 ◽

Author(s):

Z. Celik-Butler ◽

T.Y. Hsiang

Keyword(s):

Trap Density ◽

Interface Trap Density ◽

Interface Trap ◽

Noise Measurements

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On the extraction of interface trap density in the Pt/La2O3/Ge gate stack and the determination of the charge neutrality level in Ge

Journal of Applied Physics ◽

10.1063/1.3155830 ◽

2009 ◽

Vol 105 (12) ◽

pp. 124521 ◽

Author(s):

D. Bozyigit ◽

C. Rossel

Keyword(s):

Trap Density ◽

Interface Trap Density ◽

Interface Trap ◽

Charge Neutrality ◽

Charge Neutrality Level

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Determination of insulator/semiconductor interface trap density by correlation deep level transient spectroscopy method

Journal of Applied Physics ◽

10.1063/1.352219 ◽

1992 ◽

Vol 72 (9) ◽

pp. 4125-4129 ◽

Author(s):

Xin Li ◽

T. L. Tansley

Keyword(s):

Deep Level Transient Spectroscopy ◽

Trap Density ◽

Spectroscopy Method ◽

Interface Trap Density ◽

Interface Trap ◽

Semiconductor Interface ◽

Transient Spectroscopy

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Determination of the interface trap density of rubrene single-crystal field-effect transistors and comparison to the bulk trap density

Journal of Applied Physics ◽

10.1063/1.2170421 ◽

2006 ◽

Vol 99 (3) ◽

pp. 034507 ◽

Author(s):

C. Goldmann ◽

C. Krellner ◽

K. P. Pernstich ◽

S. Haas ◽

D. J. Gundlach ◽

...

Keyword(s):

Single Crystal ◽

Crystal Field ◽

Field Effect ◽

Field Effect Transistors ◽

Trap Density ◽

Interface Trap Density ◽

Interface Trap ◽

Crystal Field Effect

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Experimental Determination of Interface Trap Density and Fixed Positive Oxide charge in Commercial 4H-SiC Power MOSFETs

IEEE Access ◽

10.1109/access.2021.3124706 ◽

2021 ◽

pp. 1-1

Author(s):

Susanna Yu ◽

Marvin H. White ◽

Anant K. Agarwal

Keyword(s):

Experimental Determination ◽

Trap Density ◽

Interface Trap Density ◽

Interface Trap ◽

Oxide Charge ◽

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