Real-time monitoring of Si1–xGex heteroepitaxial growth using laser light scattering and spectroscopic ellipsometry
1993 ◽
Vol 127
(1-4)
◽
pp. 966-971
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Keyword(s):
Keyword(s):
1992 ◽
Keyword(s):
Keyword(s):
Keyword(s):
1992 ◽
Vol 203
(1)
◽
pp. 53-57
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Keyword(s):
1984 ◽
Vol 134
(1)
◽
pp. 1-10
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