Hard X‐ray photoelectron spectroscopy study of core level shifts at buried GaP/Si(001) interfaces

2020 ◽  
Vol 52 (12) ◽  
pp. 933-938
Author(s):  
Oleksandr Romanyuk ◽  
Oliver Supplie ◽  
Agnieszka Paszuk ◽  
Jan Philipp Stoeckmann ◽  
Regan George Wilks ◽  
...  
2004 ◽  
Vol 95 (4) ◽  
pp. 1963-1968 ◽  
Author(s):  
J. Eng ◽  
I. A. Hubner ◽  
J. Barriocanal ◽  
R. L. Opila ◽  
D. J. Doren

1999 ◽  
Vol 13 (13) ◽  
pp. 1655-1662
Author(s):  
N. K. MAN ◽  
KAMLESH KUMARI ◽  
S. VENKATESH ◽  
T. D. HIEN ◽  
N. K. SINH ◽  
...  

An X-ray photoelectron spectroscopy study has been performed on well characterized Bi 2 Sr 2 CaCu 2-x Co x O ~8 (x=0, 0.02 and 0.1) samples. There is a shift in the Sr binding energy with Co concentration, which is related to the change in T c . This relationship can be understood by the change of hole concentration in the CuO 2 planes as a result of Cobalt doping. The results of Bi 4f and Co 2p core level spectra are also discussed in detail.


1995 ◽  
Vol 67 (14) ◽  
pp. 2049-2051 ◽  
Author(s):  
C. H. Bjorkman ◽  
J. L. Alay ◽  
H. Nishimura ◽  
M. Fukuda ◽  
T. Yamazaki ◽  
...  

2020 ◽  
Vol 124 (4) ◽  
pp. 2313-2318 ◽  
Author(s):  
Jiatang Chen ◽  
Yun Mui Yiu ◽  
Zhiqiang Wang ◽  
Danielle Covelli ◽  
Ramaswami Sammynaiken ◽  
...  

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