On Bent and Highly Nonlinear Balanced/Resilient Functions and Their Algebraic Immunities

2006 ◽  
pp. 1-28 ◽  
Author(s):  
Claude Carlet
Keyword(s):  
Highly Nonlinear ◽  
Resilient Functions

Laser Oscillation in Aggregates of Ultrasmall Si Nanoparticles

2002 ◽  
Vol 728 ◽  
Author(s):  
Munir H. Nayfeh
Keyword(s):  
Stimulated Emission ◽  
Gaussian Beams ◽  
Single Particles ◽  
Nonlinear Characteristics ◽  
Femtosecond Radiation ◽  
Highly Nonlinear ◽  
Line Narrowing ◽  
Si Nanoparticles ◽  
Speckle Patterns ◽  
Spectral Line Narrowing

AbstractWe dispersed electrochemically etched Si into ultrabright ultrasmall nanoparticles, with brightness higher than fluorescein or rhodamine. The emission from single particles is readily detectable. Aggregates or films of the particles exhibit emission with highly nonlinear characteristics. We observe directed blue beams at ∼ 410 nm between faces of aggregates excited by femtosecond radiation at 780 nm; and at ∼ 610 nm from aggregates of red luminescent Si nanoparticles excited by radiation at 550-570 nm from a mercury lamp. Intense directed Gaussian beams, a pumping threshold, spectral line narrowing, and speckle patterns manifest the emission. The results are analyzed in terms of population inversion and stimulated emission in quantum confinement-induced Si-Si dimer phase, found only on ultrasmall Si nanoparticles. This microlasing constitutes an important step towards the realization of a laser on a chip.

Parallel Computing for Tire Simulations

2011 ◽  
Vol 39 (3) ◽  
pp. 193-209 ◽  
Author(s):  
H. Surendranath ◽  
M. Dunbar
Keyword(s):  
High Performance ◽  
Effective Means ◽  
Cost Effective ◽  
Turnaround Time ◽  
Careful Consideration ◽  
Rolling Contact ◽  
Element Analysis ◽  
Parallel Solvers ◽  
Design Changes ◽  
Highly Nonlinear

Abstract Over the last few decades, finite element analysis has become an integral part of the overall tire design process. Engineers need to perform a number of different simulations to evaluate new designs and study the effect of proposed design changes. However, tires pose formidable simulation challenges due to the presence of highly nonlinear rubber compounds, embedded reinforcements, complex tread geometries, rolling contact, and large deformations. Accurate simulation requires careful consideration of these factors, resulting in the extensive turnaround time, often times prolonging the design cycle. Therefore, it is extremely critical to explore means to reduce the turnaround time while producing reliable results. Compute clusters have recently become a cost effective means to perform high performance computing (HPC). Distributed memory parallel solvers designed to take advantage of compute clusters have become increasingly popular. In this paper, we examine the use of HPC for various tire simulations and demonstrate how it can significantly reduce simulation turnaround time. Abaqus/Standard is used for routine tire simulations like footprint and steady state rolling. Abaqus/Explicit is used for transient rolling and hydroplaning simulations. The run times and scaling data corresponding to models of various sizes and complexity are presented.

On the Optimal Precoder Design for Energy-Efficient and Secure MIMO Systems

2017 ◽  
Vol 3 (1) ◽  
pp. 1
Author(s):  
Tung T. Vu ◽  
Ha Hoang Kha
Keyword(s):  
Energy Efficiency ◽  
Mimo Systems ◽  
Search Algorithm ◽  
Multiple Input Multiple Output ◽  
Research Work ◽  
Computational Cost ◽  
Optimal Solution ◽  
Secrecy Rate ◽  
Highly Nonlinear ◽  
Precoder Design

In this research work, we investigate precoder designs to maximize the energy efficiency (EE) of secure multiple-input multiple-output (MIMO) systems in the presence of an eavesdropper. In general, the secure energy efficiency maximization (SEEM) problem is highly nonlinear and nonconvex and hard to be solved directly. To overcome this difficulty, we employ a branch-and-reduce-and-bound (BRB) approach to obtain the globally optimal solution. Since it is observed that the BRB algorithm suffers from highly computational cost, its globally optimal solution is importantly served as a benchmark for the performance evaluation of the suboptimal algorithms. Additionally, we also develop a low-complexity approach using the well-known zero-forcing (ZF) technique to cancel the wiretapped signal, making the design problem more amenable. Using the ZF based method, we transform the SEEM problem to a concave-convex fractional one which can be solved by applying the combination of the Dinkelbach and bisection search algorithm. Simulation results show that the ZF-based method can converge fast and obtain a sub-optimal EE performance which is closed to the optimal EE performance of the BRB method. The ZF based scheme also shows its advantages in terms of the energy efficiency in comparison with the conventional secrecy rate maximization precoder design.

Analog Circuit Failure Analysis Using Time-Resolved Emission

2005 ◽  
Author(s):  
B.J. Cain ◽  
G.L. Woods ◽  
A. Syed ◽  
R. Herlein ◽  
Toshihiro Nomura
Keyword(s):  
Analog Circuits ◽  
Integrated Circuit ◽  
Analog Circuit ◽  
Photon Emission ◽  
Nonlinear Process ◽  
Time Resolved ◽  
Non Invasive ◽  
Highly Nonlinear ◽  
Excellent Spatial Resolution ◽  
5 Ghz

Abstract Time-Resolved Emission (TRE) is a popular technique for non-invasive acquisition of time-domain waveforms from active nodes through the backside of an integrated circuit. [1] State-of-the art TRE systems offer high bandwidths (> 5 GHz), excellent spatial resolution (0.25um), and complete visibility of all nodes on the chip. TRE waveforms are typically used for detecting incorrect signal levels, race conditions, and/or timing faults with resolution of a few ps. However, extracting the exact voltage behavior from a TRE waveform is usually difficult because dynamic photon emission is a highly nonlinear process. This has limited the perceived utility of TRE in diagnosing analog circuits. In this paper, we demonstrate extraction of voltage waveforms in passing and failing conditions from a small-swing, differential logic circuit. The voltage waveforms obtained were crucial in corroborating a theory for some failures inside an 0.18um ASIC.

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