Direct cDNA Screening of Genomic Reference Libraries - A Rapid Method for the Identification of Transcribed Sequences in Large Genomic Regions

Identification of Transcribed Sequences ◽

10.1007/978-1-4615-2562-2_14 ◽

1994 ◽

pp. 139-155

Author(s):

Wolfgang Schwabe ◽

Brenda J. Lawrence ◽

Adelaide S. Robb ◽

Rene M. Hopfinger ◽

Ute Hochgeschwender ◽

...

Keyword(s):

Rapid Method ◽

Genomic Regions ◽

Transcribed Sequences

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Identification of markers linked to disease-resistance genes by bulked segregant analysis: a rapid method to detect markers in specific genomic regions by using segregating populations.

Proceedings of the National Academy of Sciences ◽

10.1073/pnas.88.21.9828 ◽

1991 ◽

Vol 88 (21) ◽

pp. 9828-9832 ◽

Cited By ~ 2612

Author(s):

R. W. Michelmore ◽

I. Paran ◽

R. V. Kesseli

Keyword(s):

Disease Resistance ◽

Rapid Method ◽

Resistance Genes ◽

Bulked Segregant Analysis ◽

Disease Resistance Genes ◽

Genomic Regions

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Bi-directional Dideoxy Fingerprinting (Bi-ddF): A Rapid Method for Quantitative Detection of Mutations in Genomic Regions of 300-600 bp

Human Molecular Genetics ◽

10.1093/hmg/5.1.107 ◽

1996 ◽

Vol 5 (1) ◽

pp. 107-114 ◽

Cited By ~ 39

Author(s):

Q. Liu ◽

J. Feng ◽

S. S. Sommer

Keyword(s):

Rapid Method ◽

Quantitative Detection ◽

Detection Of Mutations ◽

Genomic Regions

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Texture measurements in Al2O3 using BEKP

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100170773 ◽

1994 ◽

Vol 52 ◽

pp. 608-609

Author(s):

M. D. Vaudin ◽

J. P. Cline

Keyword(s):

Neutron Diffraction ◽

Rapid Method ◽

Crystallographic Orientation ◽

Specimen Surface ◽

X Ray Diffraction ◽

Anisotropic Crystal ◽

X Ray ◽

Verification Method ◽

Crystal Properties ◽

Backscattered Electron

The study of preferred crystallographic orientation (texture) in ceramics is assuming greater importance as their anisotropic crystal properties are being used to advantage in an increasing number of applications. The quantification of texture by a reliable and rapid method is required. Analysis of backscattered electron Kikuchi patterns (BEKPs) can be used to provide the crystallographic orientation of as many grains as time and resources allow. The technique is relatively slow, particularly for noncubic materials, but the data are more accurate than any comparable technique when a sufficient number of grains are analyzed. Thus, BEKP is well-suited as a verification method for data obtained in faster ways, such as x-ray or neutron diffraction. We have compared texture data obtained using BEKP, x-ray diffraction and neutron diffraction. Alumina specimens displaying differing levels of axisymmetric (0001) texture normal to the specimen surface were investigated.BEKP patterns were obtained from about a hundred grains selected at random in each specimen.

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